Abstract:
A spectrometer comprising a waveguide module, a diffractive component, and a light sensor is provided. The waveguide module has a first reflective surface, a second reflective surface opposite to the first reflective surface, and a light channel between the first reflective surface and the second reflective surface. The diffractive component has a diffractive surface and a plurality of strip-shaped diffractive structures located on the diffractive surface. The sharpness of the profile of the strip-shaped diffractive structures on a first side of the diffractive surface is greater than that on a second side of the diffractive surface. When viewed along a direction perpendicular to the second reflective surface, the first side of the diffractive surface is positioned between the first reflective surface and the second reflective surface with a distance away from the second reflective surface. A method for assembling the spectrometer and an assembling system are also provided.
Abstract:
A spectrometer module and a fabrication method thereof are provided. The fabrication method includes the steps of: providing at least one substrate; and forming at least one positioning side and at least one optical component of the spectrometer on the at least one substrate by a microelectromechanical systems (MEMS) process. The spectrometer module fabricated by the fabrication method includes a plurality of substrates and at least one optical component. At least one of the substrates has at least one positioning side, and the at least one optical component of the spectrometer is formed on at least one of the substrates. The positioning side and the optical component are fabricated by a MEMS process.
Abstract:
An electronic circuitry of a spectrometer, configured to electrically connect with an optical sensor of the spectrometer, includes a memory unit configured to store a measurement setting, a trigger line configured to transmit at least one trigger signal, and a control unit electrically connected to the trigger line and the memory unit. The control unit is configured to receive the trigger signal from the trigger line so as to instruct the spectrometer to perform a plurality of exposure measurements continuously under the measurement setting, and to save a plurality of spectral data acquired from the exposure measurements into the memory unit. A spectrometer using the electronic circuitry for performing the exposure measurements and a measuring method of the spectrometer are also provided.
Abstract:
A diffraction grating comprise a substrate and a plurality of connected diffraction structures formed on the substrate. Each diffraction structure is in the shape of a column and arranged along a concave cylindrical surface, and an axis of each diffraction structure extends along a generatrix of the concave cylindrical surface. A section contour is obtained by a cross section of the diffraction structures. The cross section is perpendicular to each axis of the diffraction structure. The section contour shows the connecting line of apexes of the diffraction structures as a reference curve having a plurality of first inflection points, wherein the diffraction structures are configured for separating the optical signal into a plurality of spectral components and focusing the spectral components onto a focal surface.
Abstract:
A spectrometer (100) and an optical input portion (32) thereof are disclosed. The optical input portion (32) comprises an assembly structure (322), and the assembly structure (322) is formed at a hole wall (321) of a through hole (3211) of the optical input portion (32). A light (L1) is incident into a dispersing element (2) of the spectrometer (100) along an optical path (13) after passing through the through hole (3211), and is dispersed by the dispersing element (2). The assembly structure (322) is used to be detachably assembled with an optical element (200). When the optical element (200) is assembled with the assembly structure (322), an optical axis of the optical element (200) is linked to the optical path (13). As a result, the light (L1) passing through the optical element (200) is incident to the dispersing element (2) along the optical axis and the optical path (13).
Abstract:
A hybrid diffraction grating, a mold used to produce the hybrid diffraction grating, and their manufacturing methods are described. In one aspect, a hybrid diffraction grating comprises a grating main body and a reflective layer. The grating main body comprises numerous diffraction structures. When viewed along a top-view direction, the numerous diffraction structures are arranged in a pattern defined by a profile. The profile determines various blaze angles of the numerous diffraction structures. The reflective layer, disposed on the diffraction structures, exhibits characteristics of the numerous diffraction structures.
Abstract:
An optical filtering assembly comprises a first interference film and a second interference film. The first interference film comprises multiple first film layers and multiple second film layers. The first film layers and the second film layers are alternately stacked. The second interference film comprises multiple third film layers and multiple fourth film layers. The third film layers and the fourth film layers are alternately stacked. An optical constant of the first film layers is same as an optical constant of the third film layers, and an optical constant of the second film layers is same as an optical constant of the fourth film layers, and an Optical Path Difference (OPD) produced in the first interference film is different from an OPD produced in the second interference film.
Abstract:
A hybrid diffraction grating, a mold used to produce the hybrid diffraction grating, and their manufacturing methods are described. In one aspect, a hybrid diffraction grating comprises a grating main body and a reflective layer. The grating main body comprises numerous diffraction structures. When viewed along a top-view direction, the numerous diffraction structures are arranged in a pattern defined by a profile. The profile determines various blaze angles of the numerous diffraction structures. The reflective layer, disposed on the diffraction structures, exhibits characteristics of the numerous diffraction structures.
Abstract:
A spectrometer includes an input unit for receiving an optical signal, a diffraction grating disposed on the transmission path of the optical signal for dispersing the optical signal into a plurality of spectral rays, an image sensor disposed on the transmission path of at least a portion of the spectral rays, and a waveguide device. A waveguide space is formed between the first and second reflective surfaces of the waveguide device. The optical signal is transmitted from the input unit to the diffraction grating via the waveguide space. The portion of the spectral rays is transmitted to the image sensor via the waveguide space. At least one opening is formed on the waveguide device, and is substantially parallel to the first and/or second reflective surface. A portion of the spectral rays and/or the optical signal diffuses from the opening out of the waveguide space without reaching the image sensor.
Abstract:
An optical calibration method for a spectrum measurement device including a light-input part includes: measuring a plurality of narrow-band rays by the light-input part to obtain a plurality of narrow-band spectrum impulse responses, respectively; establishing a stray light database according to the narrow-band spectrum impulse responses; generating a correction program according to the stray light database; measuring a spectral radiant standard light by the light-input part to obtain measurement spectrum data; and generating a calibration coefficient program based on the measurement spectrum data and spectral radiant standard spectrum data, wherein the calibration coefficient program matches the measurement spectrum data with the spectral radiant standard spectrum data, and the spectral radiant standard spectrum data is obtained by measuring the spectral radiant standard light by a standard spectrum measurement device. A spectrum measurement device, an optical measurement method and an optical calibration method are also provided.