Spectrometer module and fabrication method thereof

    公开(公告)号:US10801889B2

    公开(公告)日:2020-10-13

    申请号:US16411137

    申请日:2019-05-13

    Abstract: A spectrometer module and a fabrication method thereof are provided. The fabrication method includes the steps of: providing at least one substrate; and forming at least one positioning side and at least one optical component of the spectrometer on the at least one substrate by a microelectromechanical systems (MEMS) process. The spectrometer module fabricated by the fabrication method includes a plurality of substrates and at least one optical component. At least one of the substrates has at least one positioning side, and the at least one optical component of the spectrometer is formed on at least one of the substrates. The positioning side and the optical component are fabricated by a MEMS process.

    Spectrometer and optical input portion thereof

    公开(公告)号:US10436639B2

    公开(公告)日:2019-10-08

    申请号:US15546003

    申请日:2015-01-23

    Abstract: A spectrometer (100) and an optical input portion (32) thereof are disclosed. The optical input portion (32) comprises an assembly structure (322), and the assembly structure (322) is formed at a hole wall (321) of a through hole (3211) of the optical input portion (32). A light (L1) is incident into a dispersing element (2) of the spectrometer (100) along an optical path (13) after passing through the through hole (3211), and is dispersed by the dispersing element (2). The assembly structure (322) is used to be detachably assembled with an optical element (200). When the optical element (200) is assembled with the assembly structure (322), an optical axis of the optical element (200) is linked to the optical path (13). As a result, the light (L1) passing through the optical element (200) is incident to the dispersing element (2) along the optical axis and the optical path (13).

    Waveguide sheet, fabrication method thereof and spectrometer using the same

    公开(公告)号:US10145739B2

    公开(公告)日:2018-12-04

    申请号:US15300781

    申请日:2014-04-03

    Abstract: An fabrication method of a waveguide sheet for a spectrometer includes the steps of: providing a pattern to be performed by a microelectromechanical (MEM) process; and forming at least one waveguide sheet based on the provided pattern by the MEM process. The pattern includes a shape of a first waveguide sheet. The waveguide sheet includes at least one positioning side and at least one stray light elimination side formed by the MEM process. The positioning side is for a spectral component of the spectrometer to abut against so that the spectral component is positioned at the positioning side, and the stray light elimination side is to be used as a side of a stray light outlet. The structure of the waveguide sheet and the configuration of the spectrometer are also provided.

    Optical head for receiving light and optical system using the same

    公开(公告)号:US10114154B2

    公开(公告)日:2018-10-30

    申请号:US15592201

    申请日:2017-05-11

    Abstract: An optical head for receiving an incident light is provided. The optical head comprises a reflective diffuser and a reflector disposed to face the reflective diffuser. The reflective diffuser is disposed in an optical path of the incident light and shields the reflector from the incident light. The reflective diffuser converts the incident light to scattered light having a Lambertian pattern. The reflector has an optical output section that transmits the scattered light and a reflective section that reflects the scattered light to the reflective diffuser and/or the other portions of the reflective sections. An optical system using the optical head is also provided.

    Spectrometer and manufacturing method thereof

    公开(公告)号:US10393586B2

    公开(公告)日:2019-08-27

    申请号:US15360962

    申请日:2016-11-23

    Abstract: A spectrometer includes an input unit for receiving an optical signal, a diffraction grating disposed on the transmission path of the optical signal for dispersing the optical signal into a plurality of spectral rays, an image sensor disposed on the transmission path of at least a portion of the spectral rays, and a waveguide device. A waveguide space is formed between the first and second reflective surfaces of the waveguide device. The optical signal is transmitted from the input unit to the diffraction grating via the waveguide space. The portion of the spectral rays is transmitted to the image sensor via the waveguide space. At least one opening is formed on the waveguide device, and is substantially parallel to the first and/or second reflective surface. A portion of the spectral rays and/or the optical signal diffuses from the opening out of the waveguide space without reaching the image sensor.

    SPECTRUM MEASUREMENT SYSTEM, SPECTRUM MEASUREMENT DEVICE, OPTICAL MEASUREMENT METHOD AND OPTICAL CALIBRATION METHOD

    公开(公告)号:US20180202863A1

    公开(公告)日:2018-07-19

    申请号:US15614627

    申请日:2017-06-06

    CPC classification number: G01J3/28 G01J2003/2866

    Abstract: An optical calibration method for a spectrum measurement device including a light-input part includes: measuring a plurality of narrow-band rays by the light-input part to obtain a plurality of narrow-band spectrum impulse responses, respectively; establishing a stray light database according to the narrow-band spectrum impulse responses; generating a correction program according to the stray light database; measuring a spectral radiant standard light by the light-input part to obtain measurement spectrum data; and generating a calibration coefficient program based on the measurement spectrum data and spectral radiant standard spectrum data, wherein the calibration coefficient program matches the measurement spectrum data with the spectral radiant standard spectrum data, and the spectral radiant standard spectrum data is obtained by measuring the spectral radiant standard light by a standard spectrum measurement device. A spectrum measurement device, an optical measurement method and an optical calibration method are also provided.

    Optical Sensing Module, Optical Mechanism Of Spectrometer, And Spectrometer
    9.
    发明申请
    Optical Sensing Module, Optical Mechanism Of Spectrometer, And Spectrometer 有权
    光学传感模块,光谱仪和光谱仪的光学机构

    公开(公告)号:US20150369662A1

    公开(公告)日:2015-12-24

    申请号:US14764924

    申请日:2013-01-30

    CPC classification number: G01J3/0218 G01J3/0208 G01J3/0262 G01J3/18 G01J3/2803

    Abstract: The present application discloses an optical sensing module, an optical mechanism of a spectrometer, and a spectrometer. An optical sensing module according to one embodiment comprises an optical sensing component and an optical fiber. The optical sensing component includes at least a row of optical sensing units. The optical fiber is made of a transparent material and has a cylindrical curved surface. A side of the cylindrical curved surface faces the optical sensing units to converge at least a portion of an incident light received by the optical sensing units. With techniques of the present application, the amount of light collected at the optical sensing component can be increased for it to be suitable for applications such as miniaturized apparatuses and systems, thus improving the overall efficiency of optical reception and utilization therein.

    Abstract translation: 本申请公开了一种光学传感模块,光谱仪的光学机构和光谱仪。 根据一个实施例的光学传感模块包括光学感测部件和光纤。 光学传感部件包括至少一行光学感测单元。 光纤由透明材料制成,具有圆柱形曲面。 圆柱形曲面的一侧面向光学感测单元以会聚由光学感测单元接收的入射光的至少一部分。 利用本申请的技术,可以增加在光学传感部件处收集的光量,使其适合于诸如小型化设备和系统的应用,从而提高其中光学接收和利用的总体效率。

    Angled interference filters generating offset ripple effects

    公开(公告)号:US12019255B2

    公开(公告)日:2024-06-25

    申请号:US17202297

    申请日:2021-03-15

    CPC classification number: G02B5/285 G01J3/26 G02B1/115

    Abstract: An optical filtering assembly comprises a first interference film and a second interference film. The first interference film comprises multiple first film layers and multiple second film layers. The first film layers and the second film layers are alternately stacked. The second interference film comprises multiple third film layers and multiple fourth film layers. The third film layers and the fourth film layers are alternately stacked. An optical constant of the first film layers is same as an optical constant of the third film layers, and an optical constant of the second film layers is same as an optical constant of the fourth film layers, and an Optical Path Difference (OPD) produced in the first interference film is different from an OPD produced in the second interference film.

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