摘要:
An electrical inspection method includes: a step of preparing a wafer in which a plurality of Fabry-Perot interference filter portions is formed, each of the plurality of Fabry-Perot interference filter portions in which a distance between a first mirror portion and a second mirror portion facing each other varies by an electrostatic force; and a step of inspecting electrical characteristics of each of the plurality of Fabry-Perot interference filter portions.
摘要:
A water quality detection system including a light source, a spectrometer, and a data processor is disclosed, and relates to the technical field of detection systems. The light source emits excitation light pulse trains of different wavelengths to a to-be-detected water sample contained in a sample cell, where the excitation light pulse trains of different wavelengths may be emitted in a time-division manner, to excite the to-be-detected water sample, thereby generating fluorescence separately corresponding to the excitation light pulse trains of different wavelengths. The spectrometer receives the fluorescence and output a fluorescence spectrum based on the fluorescence. The data processor obtains, based on the fluorescence spectrum output by the spectrometer, a three-dimensional fluorescence spectrum including an excitation wavelength, a fluorescence wavelength, and a fluorescence intensity, identifies the to-be-detected water sample and obtains a parameter of the to-be-detected water sample based on the three-dimensional fluorescence spectrum.
摘要:
An optical measurement probe for capturing a spectral response through an intervening material emitting unwanted background radiation includes: a first lens configured to receive light and collimate the light into a collimated excitation beam defining a first aperture; an objective element for focusing the collimated excitation beam to a point or region in a sample through the intervening material, wherein the objective element also receives light scattered by the sample and the intervening material and collimates the scattered light into a collimated collection beam defining a second aperture; and a blocking element within the collimated collection beam for removing the light scattered by the intervening material from the collimated collection beam received from the sample, wherein the second aperture defined by the collimated collection beam is at least two times greater than the first aperture defined by the collimated excitation beam.
摘要:
A compact wavelength dispersing device and a wavelength selective optical switch based on the wavelength dispersing device is described. The wavelength dispersing device has a folding mirror that folds the optical path at least three times. A focal length of a focusing coupler of the device is reduced and the NA is increased, while the increased optical aberrations are mitigated by using an optional coma-compensating wedge. A double-pass arrangement for a transmission diffraction grating allows further focal length and overall size reduction due to increased angular dispersion.
摘要:
A biometric sensor that measures biometric information and a biometric analysis system including the biometric sensor are provided. The biometric sensor may include: a light source configured to emit light toward a region of interest of an object under examination, the light being diffused at the region of interest; a collimator that includes a though-hole and is configured to collimate the diffused light received from the region of interest; and a spectrometer configure to analyze the diffused light transmitted by the collimator.
摘要:
A compact wavelength dispersing device and a wavelength selective optical switch based on the wavelength dispersing device is described. The wavelength dispersing device has a folding mirror that folds the optical path at least three times. A focal length of a focusing coupler of the device is reduced and the NA is increased, while the increased optical aberrations are mitigated by using an optional coma-compensating wedge. A double-pass arrangement for a transmission diffraction grating allows further focal length and overall size reduction due to increased angular dispersion.
摘要:
A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.
摘要:
A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.
摘要:
A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.
摘要:
This specification describes various embodiments that relate to methods for providing a wideband colorimeter that can include more accurate outputs. In one embodiment, a narrowband instrument, such as a spectrometer or spectrograph, can be used for calibration of a wideband colorimeter, so that more accurate outputs can be provided. In one embodiment, an optical test equipment, which consists of both a wideband colorimeter and a narrowband spectrograph, can be used for providing a more accurately calibrated wideband colorimeter. As an example, a spectra-camera, which is a hybrid system consisting of both a wideband colorimeter and a narrowband spectrograph, can be used for simultaneous testing by both the wideband colorimeter and the narrowband spectrograph. By doing simultaneous testing, accurate calibration of the wideband colorimeter can be achieved. This specification further describes a mathematical model to characterize a wideband three channel colorimeter with a narrowband multiple channel spectrometer.