PROCESS FOR REMOVING PARTICLES FROM RETICLE
    21.
    发明申请
    PROCESS FOR REMOVING PARTICLES FROM RETICLE 有权
    从原料中除去颗粒的方法

    公开(公告)号:US20070204882A1

    公开(公告)日:2007-09-06

    申请号:US11747231

    申请日:2007-05-11

    IPC分类号: B08B7/04 B08B3/00

    CPC分类号: G03F1/82 G03F1/66

    摘要: A tool and a process for removing particles from a reticle are described. The tool is disposed in front of a pellicle particle detector, including at least a gas spray member toward a surface of the reticle for removing particles and a supporting member supporting the gas spray member in front of the pellicle particle detector. The supporting member can further fix the tool onto the pellicle particle detector. In the particle removing process, when particles are detected on the reticle, the tool is turned on and the reticle is loaded into the pellicle particle detector through the gas spray member in order to remove the particles from the reticle before the pellicle particle detector detects the particles.

    摘要翻译: 描述了从掩模版中去除颗粒的工具和工艺。 该工具设置在防护薄膜颗粒检测器的前面,包括至少一个气体喷射构件朝向用于除去颗粒的掩模版的表面,以及支撑构件,其支撑防尘薄膜组件前端的气体喷射构件。 支撑构件可以进一步将工具固定到防护薄膜检测器上。 在颗粒去除过程中,当在掩模版上检测到颗粒时,打开工具,并通过气体喷射构件将掩模版装载到防护薄膜颗粒检测器中,以便在防护薄膜组件检测器检测到 粒子。

    Tool for removing particles from reticle
    22.
    发明授权
    Tool for removing particles from reticle 失效
    用于从掩模版中去除颗粒的工具

    公开(公告)号:US07234196B2

    公开(公告)日:2007-06-26

    申请号:US10709335

    申请日:2004-04-29

    IPC分类号: B08B5/02

    CPC分类号: G03F1/82

    摘要: A tool and a process for removing particles from a reticle are described. The tool is disposed in front of a pellicle particle detector, including at least a gas spray member toward a surface of the reticle for removing particles and a supporting member supporting the gas spray member in front of the pellicle particle detector. The supporting member can further fix the tool onto the pellicle particle detector. In the particle removing process, when particles are detected on the reticle, the tool is turned on and the reticle is loaded into the pellicle particle detector through the gas spray member in order to remove the particles from the reticle before the pellicle particle detector detects the particles.

    摘要翻译: 描述了从掩模版中去除颗粒的工具和工艺。 该工具设置在防护薄膜颗粒检测器的前面,包括至少一个气体喷射构件朝向用于除去颗粒的掩模版的表面,以及支撑构件,其支撑防尘薄膜组件前端的气体喷射构件。 支撑构件可以进一步将工具固定到防护薄膜检测器上。 在颗粒去除过程中,当在掩模版上检测到颗粒时,打开工具,并通过气体喷射构件将掩模版装载到防护薄膜颗粒检测器中,以便在防护薄膜组件检测器检测到 粒子。

    MAGNETIC ELECTRICAL APPLIANCE CONNECTING STRUCTURE
    23.
    发明申请
    MAGNETIC ELECTRICAL APPLIANCE CONNECTING STRUCTURE 审中-公开
    磁性电器连接结构

    公开(公告)号:US20160126665A1

    公开(公告)日:2016-05-05

    申请号:US14532813

    申请日:2014-11-04

    申请人: YU-CHENG YANG

    发明人: YU-CHENG YANG

    IPC分类号: H01R13/62 H01R13/24

    摘要: A magnetic electrical appliance connecting structure includes an inserting connection member and an accommodating connection member. The inserting connection member includes an inserting connection housing, two first magnetic elements and a plurality of first conductive elements. Each first conductive element includes a flexible portion, an extension portion and an electrical connection protruding portion. The accommodating connection member includes an accommodating connection housing, two second magnetic elements adapted to be respectively magnetically attracted the two first magnetic elements, and a plurality of second conductive elements. Each second conductive element includes a body and an electrical connection recessed portion. The first conductive elements have an electrically connected state, in which the electrical connection protruding portions are abutted against the respective electrical connection recessed portions to push the extension portions to move toward an inner direction of the inserting connection housing.

    摘要翻译: 磁性电器连接结构包括插入连接构件和容纳连接构件。 插入连接构件包括插入连接壳体,两个第一磁性元件和多个第一导电元件。 每个第一导电元件包括​​柔性部分,延伸部分和电连接突出部分。 容纳连接构件包括容纳连接壳体,适于分别磁吸引两个第一磁性元件的两个第二磁性元件和多个第二导电元件。 每个第二导电元件包括​​主体和电连接凹部。 第一导电元件具有电连接状态,其中电连接突出部分抵靠各个电连接凹部以推动延伸部分朝向插入连接壳体的内部方向移动。

    LIGHT-EMITTING DIODE DEVICE AND MANUFACTURING METHOD THEREOF
    25.
    发明申请
    LIGHT-EMITTING DIODE DEVICE AND MANUFACTURING METHOD THEREOF 有权
    发光二极管器件及其制造方法

    公开(公告)号:US20110006701A1

    公开(公告)日:2011-01-13

    申请号:US12887199

    申请日:2010-09-21

    摘要: A light-emitting diode (LED) device and manufacturing methods thereof are provided, wherein the LED device comprises a substrate, a first type conductivity semiconductor layer, an active layer, a second type conductivity semiconductor layer, a transparent conductive oxide stack structure, a first electrode, and a second electrode. The first semiconductor layer on the substrate has a first portion and a second portion. The active layer and the second semiconductor layer are subsequently set on the first portion. The transparent conductive oxide stack structure on the second semiconductor layer has at least two resistant interfaces. The first electrode is above the second portion, and the second electrode is above the transparent conductive oxide stack structure.

    摘要翻译: 提供了一种发光二极管(LED)器件及其制造方法,其中LED器件包括衬底,第一类型导电半导体层,有源层,第二类型导电半导体层,透明导电氧化物堆叠结构, 第一电极和第二电极。 衬底上的第一半导体层具有第一部分和第二部分。 有源层和第二半导体层随后设置在第一部分上。 第二半导体层上的透明导电氧化物堆叠结构具有至少两个电阻接口。 第一电极在第二部分之上,第二电极在透明导电氧化物堆叠结构之上。

    [TOOL AND PROCESS FOR REMOVING PARTICLES FROM RETICLE]
    26.
    发明申请
    [TOOL AND PROCESS FOR REMOVING PARTICLES FROM RETICLE] 失效
    [从物品中除去颗粒的工具和方法]

    公开(公告)号:US20050168739A1

    公开(公告)日:2005-08-04

    申请号:US10709335

    申请日:2004-04-29

    IPC分类号: G01N21/00 G03F1/00

    CPC分类号: G03F1/82

    摘要: A tool and a process for removing particles from a reticle are described. The tool is disposed in front of a pellicle particle detector, including at least a gas spray member toward a surface of the reticle for removing particles and a supporting member supporting the gas spray member in front of the pellicle particle detector. The supporting member can further fix the tool onto the pellicle particle detector. In the particle removing process, when particles are detected on the reticle, the tool is turned on and the reticle is loaded into the pellicle particle detector through the gas spray member in order to remove the particles from the reticle before the pellicle particle detector detects the particles.

    摘要翻译: 描述了从掩模版中去除颗粒的工具和工艺。 该工具设置在防护薄膜颗粒检测器的前面,包括至少一个气体喷射构件朝向用于除去颗粒的掩模版的表面,以及支撑构件,其支撑防尘薄膜组件前端的气体喷射构件。 支撑构件可以进一步将工具固定到防护薄膜检测器上。 在颗粒去除过程中,当在掩模版上检测到颗粒时,打开工具,并通过气体喷射构件将掩模版装载到防护薄膜颗粒检测器中,以便在防护薄膜组件检测器检测到 粒子。