Photoetching parameter adjustment method and apparatus, and mask plate

    公开(公告)号:US10663855B2

    公开(公告)日:2020-05-26

    申请号:US15828804

    申请日:2017-12-01

    Abstract: The present disclosure relates to a photoetching parameter adjustment method, apparatus and mask plate, in the field of photoetching technology. The method comprises: forming a photoresist pattern on a first substrate by a photoetching process, wherein the photoresist pattern comprises a photoetching detection pattern; judging whether photoetching parameters of the photoetching process need to be adjusted or not in accordance with the photoetching detection pattern; and adjusting the photoetching parameters when the photoetching parameters need to be adjusted. The present disclosure solves the problem that the reliability of the photoetching parameters is low and improves the reliability of the photoetching parameters. The present disclosure is used for adjusting photoetching parameters.

    Phase-shift mask
    26.
    发明授权

    公开(公告)号:US09638993B2

    公开(公告)日:2017-05-02

    申请号:US14494627

    申请日:2014-09-24

    Inventor: Wusheng Li

    Abstract: The present invention provides a phase-shift mask comprising a light shading region which is covered by a light shading pattern and a light transmission region which is not covered by the light shading pattern, the light shading pattern comprises a symmetrical part and an asymmetrical part provided outside the symmetrical part, wherein, an optical blocking unit is provided in a part of the light transmission region outside the symmetrical part away from the asymmetrical part, so that intensity of light transmitted through the part of the light transmission region provided with the optical blocking unit is reduced. During an exposure process using the phase-shift mask of the present invention, the obtained exposure intensity is more uniform.

    METHOD AND DEVICE OF ESTIMATING IMAGE STICKING GRADE OF DISPLAY
    27.
    发明申请
    METHOD AND DEVICE OF ESTIMATING IMAGE STICKING GRADE OF DISPLAY 有权
    估计显示图像贴图等级的方法和装置

    公开(公告)号:US20150371576A1

    公开(公告)日:2015-12-24

    申请号:US14499674

    申请日:2014-09-29

    Inventor: Wusheng Li

    CPC classification number: G09G3/006 G09G2320/0257 G09G2320/046

    Abstract: It is provided a method of estimating an image sticking grade of a display, comprising steps of: displaying a first image in a first frame and a second image in a second frame on the display; switching the display, at at least two sampling times, to display the first image, and then obtaining brightness change factors and image sticking area factors for an image sticking displayed on the display at each sampling time to determine at least two image sticking grades corresponding to each sampling time, wherein an image sticking fading period is set as interval time between two adjacent sampling times to perform an image sticking fading process of the display; and determining a change trend of the image sticking grades of the display during the image sticking fading process based on the at least two image sticking grades when the image sticking stops fading. From the change trend, adverse influences of the image sticking on the display performance may be reflected accurately and fully such that related comprehensive modifications may be made by the skilled based on defects caused by the image sticking in the display.

    Abstract translation: 提供了一种估计显示器的图像粘贴等级的方法,包括以下步骤:在显示器上显示第一帧中的第一图像和第二帧中的第二图像; 在至少两个采样时间切换显示器以显示第一图像,然后在每个采样时间获得显示在显示器上的图像粘贴的亮度变化因子和图像粘附面积因子,以确定至少两个对应于 每个采样时间,其中将图像残留衰落周期设置为两个相邻采样时间之间的间隔时间,以执行显示器的图像粘附衰落处理; 以及当所述图像粘贴停止衰落时,基于所述至少两个图像粘贴等级,确定在所述图像粘贴褪色处理期间所述显示器的图像粘附等级的变化趋势。 根据变化趋势,图像残留对显示性能的不良影响可以被准确和全面地反映出来,从而可以基于图像残留在显示器中的缺陷而由技术人员进行相关的综合修改。

    Light-emitting substrate and method for manufacturing the same, and display apparatus

    公开(公告)号:US12191430B2

    公开(公告)日:2025-01-07

    申请号:US18043203

    申请日:2022-03-31

    Abstract: A light-emitting substrate includes a transparent substrate; a first metal light-shielding layer, a wiring layer and light-emitting devices. The first metal light-shielding layer is disposed on the transparent substrate. The wiring layer is disposed on a side of the first metal light-shielding layer away from the transparent substrate, and the wiring layer includes circuit traces and pads. Orthographic projections of the circuit traces and the pads on the transparent substrate are all located within an orthographic projection of the first metal light-shielding layer on the transparent substrate. The light-emitting devices are disposed on a side of the wiring layer away from the transparent substrate, and electrically connected to some of the pads; and orthographic projections of the light-emitting devices on the transparent substrate are located within the orthographic projection of the first metal light-shielding layer on the transparent substrate.

    ARRAY SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20230049038A1

    公开(公告)日:2023-02-16

    申请号:US17975894

    申请日:2022-10-28

    Abstract: An array substrate and a manufacturing method thereof, a display device and a manufacturing method thereof are provided, which belong to the technical field of display. The array substrate includes: an interposer substrate, a fan-out region and a thin-film transistor disposed on one side of the interposer substrate, and a bonding connection line disposed on the other side of the interposer substrate. The bonding connection line includes a first lead and a second lead that are insulated from each other. The interposer substrate is provided with a first interposer via hole and a second interposer via hole. The first lead is electrically connected to the thin-film transistor by a conductive structure in the first interposer via hole and the fan-out region, and the second lead is electrically connected to the thin-film transistor by a conductive structure in the second interposer via hole and the fan-out region.

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