公开(公告)号：US20180178449A1

公开(公告)日：2018-06-28

申请号：US15902990

申请日：2018-02-22

Applicant: General Electric Company

Inventor： Mark Allen Cheverton ,  John Broddus Deaton, JR.

IPC: B29C64/268 ,  B23K26/342 ,  B23K26/03 ,  B29C64/386 ,  B29C64/153 ,  B29C64/393 ,  B33Y30/00 ,  B33Y50/02 ,  B33Y10/00

CPC classification number: B29C64/268 ,  B22F3/1055 ,  B22F2003/1056 ,  B23K26/032 ,  B23K26/034 ,  B23K26/34 ,  B23K26/342 ,  B29C64/153 ,  B29C64/386 ,  B29C64/393 ,  B29L2031/772 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02

Abstract: An additive manufacturing system includes a laser device, a first scanning device, and an optical system. The laser device is configured to generate a laser beam, and the first scanning device is configured to selectively direct the laser beam across a powder bed. The laser beam generates a melt pool in the powder bed. The optical system includes an optical detector configured to detect electromagnetic radiation generated by the melt pool, and a second scanning device configured to direct electromagnetic radiation generated by the melt pool to the optical detector.

公开(公告)号：US09964455B2

公开(公告)日：2018-05-08

申请号：US14504961

申请日：2014-10-02

Applicant: General Electric Company

Inventor： Mark Allen Cheverton ,  Anant Achyut Setlur ,  Victor Petrovich Ostroverkhov ,  Guanghua Wang ,  James Anthony Brewer ,  Venkat Subramaniam Venkataramani

IPC: G01J5/00 ,  G01L1/24 ,  G01K1/14 ,  G01K11/20

CPC classification number: G01L1/24 ,  G01K1/143 ,  G01K11/20

Abstract: A method of monitoring a surface temperature of a hot gas path component includes directing an excitation beam having an excitation wavelength at a layer of a sensor material composition deposited on a hot gas path component to induce a fluorescent radiation. The method includes measuring fluorescent radiation emitted by the sensor material composition. The fluorescent radiation includes at least a first intensity at a first wavelength and a second intensity at a second wavelength. The surface temperature of the hot gas path component is determined based on a ratio of the first intensity at the first wavelength and the second intensity at the second wavelength of the fluorescent radiation emitted by the sensor material composition.

公开(公告)号：US09925715B2

公开(公告)日：2018-03-27

申请号：US14319189

申请日：2014-06-30

Applicant: General Electric Company

Inventor： Mark Allen Cheverton ,  John Broddus Deaton, Jr.

IPC: B29C67/00 ,  B29C64/268 ,  B33Y50/02 ,  B33Y30/00 ,  B33Y10/00 ,  B29C64/393 ,  B23K26/03 ,  B23K26/342 ,  B29C64/153 ,  B29C64/386

CPC classification number: B29C64/268 ,  B23K26/032 ,  B23K26/342 ,  B29C64/153 ,  B29C64/386 ,  B29C64/393 ,  B29L2031/772 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02

Abstract: An additive manufacturing system includes a laser device, a first scanning device, and an optical system. The laser device is configured to generate a laser beam, and the first scanning device is configured to selectively direct the laser beam across a powder bed. The laser beam generates a melt pool in the powder bed. The optical system includes an optical detector configured to detect electromagnetic radiation generated by the melt pool, and a second scanning device configured to direct electromagnetic radiation generated by the melt pool to the optical detector.

公开(公告)号：US20170120376A1

公开(公告)日：2017-05-04

申请号：US14929948

申请日：2015-11-02

Applicant: General Electric Company

Inventor： Mark Allen Cheverton ,  Harry Kirk Mathews, JR.

IPC: B23K26/03 ,  B23K26/144 ,  B23K26/342

CPC classification number: B23K26/032 ,  B22F3/1055 ,  B22F2003/1056 ,  B22F2003/1057 ,  B22F2999/00 ,  B23K26/144 ,  B23K26/342 ,  B29C64/153 ,  B29C64/386 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  Y02P10/295 ,  B22F2203/11 ,  B22F2203/03

Abstract: An additive manufacturing system includes a surface holding a particulate and a focused energy source configured to generate at least one beam that moves along the surface to heat the particulate to a melting point creating a melt path. A camera is configured to generate an image of the surface as the at least one beam moves along the surface. The camera has a field of view and is positioned in relation to the surface such that the field of view encompasses a portion of the melt path defining a plurality of rasters. The camera generates a time exposure image of at least the portion of the melt path defining the plurality of rasters.

公开(公告)号：US20170001374A1

公开(公告)日：2017-01-05

申请号：US14789350

申请日：2015-07-01

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Michael Evans Graham ,  John Broddus Deaton, JR. ,  Mark Allen Cheverton ,  Thomas Charles Adcock ,  Andrew David Deal ,  Marshall Gordon Jones ,  Prabhjot Singh

IPC: B29C67/00 ,  G05B19/4099

CPC classification number: B29C67/0088 ,  B22F3/1055 ,  B22F5/10 ,  B22F7/062 ,  B22F7/08 ,  B22F2003/1058 ,  B23K26/206 ,  B23K26/342 ,  B23K2101/04 ,  B23K2101/12 ,  B29C64/153 ,  B29C64/386 ,  B29C64/40 ,  B33Y50/02 ,  G05B19/4099 ,  G05B2219/35134 ,  G05B2219/49007 ,  Y02P10/295

Abstract: A method that includes additively manufacturing with an additive manufacturing (AM) system a sub-component that has a locator element. Using a control system of the AM system for positioning a first location of the locator element. Selectively placing a portion of another sub-component adjacent to the locator element, based on the positioning. Then attaching the second sub-component to the first sub-component in a region, wherein the region is based on the positioning knowledge from the control system so as to make a component. A component that comprises a first sub-component that has an AM locator element; and a second sub-component attached to the first sub-component, wherein the locator element is attached to the second sub-component within the same additive manufacturing build chamber as the first sub-component.

Abstract translation: 一种包括用附加制造（AM）系统对具有定位器元件的子部件进行附加制造的方法。 使用AM系统的控制系统来定位定位器元件的第一个位置。 基于定位，选择性地将另一个子部件的一部分与定位器元件相邻。 然后将第二子组件附接到区域中的第一子组件，其中该区域基于来自控制系统的定位知识，以便构成组件。 一种组件，包括具有AM定位器元素的第一子组件; 以及附接到所述第一子部件的第二子部件，其中所述定位元件在与所述第一子部件相同的添加剂制造构建室内附接到所述第二子部件。

公开(公告)号：US09395301B2

公开(公告)日：2016-07-19

申请号：US14504917

申请日：2014-10-02

Applicant: General Electric Company

Inventor： Mark Allen Cheverton ,  Anant Achyut Setlur ,  Victor Petrovich Ostroverkhov ,  Guanghua Wang ,  Joseph John Shiang

IPC: G01N21/64 ,  G01J5/10 ,  G01J5/08

CPC classification number: G01J5/0896 ,  G01J1/58 ,  G01J5/10

Abstract: A method of monitoring a surface temperature of an environmental barrier coating (EBC) of a hot gas component includes directing an excitation beam having a first wavelength at a layer of a temperature indicator formed on the hot gas component. The method also includes measuring a fluorescent radiation emitted by the temperature indicator. The fluorescent radiation has a second wavelength and an intensity. In addition, the method includes determining a surface temperature of the EBC based on the intensity of the second wavelength of the fluorescent radiation.

Abstract translation: 监测热气体组分的环境阻挡涂层（EBC）的表面温度的方法包括将形成在热气体组分上的温度指示器层的第一波长的激发束引导。 该方法还包括测量由温度指示器发射的荧光辐射。 荧光辐射具有第二波长和强度。 此外，该方法包括基于荧光辐射的第二波长的强度确定EBC的表面温度。