PARTIALLY CRYSTALLIZED FIN HARD MASK FOR FIN FIELD-EFFECT-TRANSISTOR (FINFET) DEVICE
    21.
    发明申请
    PARTIALLY CRYSTALLIZED FIN HARD MASK FOR FIN FIELD-EFFECT-TRANSISTOR (FINFET) DEVICE 审中-公开
    FIN场效应晶体管(FINFET)器件的部分晶体结构硬掩模

    公开(公告)号:US20150270175A1

    公开(公告)日:2015-09-24

    申请号:US14219059

    申请日:2014-03-19

    Abstract: Provided herein are approaches for forming a fin field-effect-transistor (FinFET) device using a partially crystallized fin hard mask. Specifically, a hard mask is patterned over a substrate, and the FinFET device is annealed to form a set of crystallized hard mask elements adjacent a set of non-crystallized hard mask elements. A masking structure is provided over a first section of the patterned hard mask to prevent the set of non-crystallized hard mask elements from being crystallized during the anneal. During a subsequent fin cut process, the non-crystallized mask elements are removed, while crystallized mask elements remain. A set of fins is then formed in the FinFET device according to the location(s) of the crystallized mask elements.

    Abstract translation: 本文提供了使用部分结晶的翅片硬掩模形成鳍状场效应晶体管(FinFET)器件的方法。 具体地说,将硬掩模图案化在衬底上,并且FinFET器件被退火以形成与一组非结晶硬掩模元件相邻的一组结晶的硬掩模元件。 在图案化的硬掩模的第一部分上提供掩模结构,以防止在退火期间该组非结晶硬掩模元件结晶。 在随后的翅片切割过程中,除去未结晶的掩模元件,同时保留结晶的掩模元件。 然后根据结晶化掩模元件的位置在FinFET器件中形成一组翅片。

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