Method for manufacturing a nonvolatile semiconductor storage device where memory cells are arranged three dimensionally
    25.
    发明授权
    Method for manufacturing a nonvolatile semiconductor storage device where memory cells are arranged three dimensionally 有权
    用于制造三维排列存储单元的非易失性半导体存储装置的方法

    公开(公告)号:US08048798B2

    公开(公告)日:2011-11-01

    申请号:US12389977

    申请日:2009-02-20

    IPC分类号: H01L21/4763

    摘要: A method for manufacturing a nonvolatile semiconductor storage device, including: forming a first conductive layer so that it is sandwiched in an up-down direction by first insulating layers; forming a first hole so that it penetrates the first insulating layers and the first conductive layer; forming a first side wall insulating layer on a side wall facing the first hole; forming a sacrificing layer so that the sacrificing layer infills the first hole; forming a second conductive layer on an upper layer of the sacrificing layer so that the second conductive layer is sandwiched by the second insulating layer in an up-down direction; forming a second hole on a position which matches with the first hole so that the second hole penetrates the second insulating layer and the second conductive layer; forming a second side wall insulating layer on a side wall facing the second hole; removing the sacrificing layer after the formation of the second side wall insulating layer; and forming a semiconductor layer so that the semiconductor layer infills the first hole and the second hole after the removal of the sacrificing layer.

    摘要翻译: 一种制造非易失性半导体存储装置的方法,包括:形成第一导电层,使其通过第一绝缘层沿上下方向夹持; 形成第一孔,使其穿透第一绝缘层和第一导电层; 在面向所述第一孔的侧壁上形成第一侧壁绝缘层; 形成牺牲层,使牺牲层填充第一孔; 在牺牲层的上层上形成第二导电层,使得第二导电层在上下方向上被第二绝缘层夹持; 在与所述第一孔匹配的位置上形成第二孔,使得所述第二孔穿过所述第二绝缘层和所述第二导电层; 在面向所述第二孔的侧壁上形成第二侧壁绝缘层; 在形成第二侧壁绝缘层之后去除牺牲层; 以及形成半导体层,使得半导体层在去除牺牲层之后填充第一孔和第二孔。

    Non-volatile semiconductor storage device and method of manufacturing the same
    27.
    发明授权
    Non-volatile semiconductor storage device and method of manufacturing the same 有权
    非易失性半导体存储装置及其制造方法

    公开(公告)号:US07910432B2

    公开(公告)日:2011-03-22

    申请号:US12393509

    申请日:2009-02-26

    IPC分类号: H01L21/336

    CPC分类号: H01L27/11578 H01L27/11582

    摘要: Each of the memory strings includes: a first columnar semiconductor layer extending in a vertical direction to a substrate; a plurality of first conductive layers formed to sandwich an insulation layer with a charge trap layer and expand in a two-dimensional manner; a second columnar semiconductor layer formed in contact with the top surface of the first columnar semiconductor layer and extending in a vertical direction to the substrate; and a plurality of second conductive layers formed to sandwich an insulation layer with the second columnar semiconductor layer and formed in a stripe pattern extending in a first direction orthogonal to the vertical direction. Respective ends of the plurality of first conductive layers in the first direction are formed in a stepwise manner in relation to each other, entirety of the plurality of the second conductive layers are formed in an area immediately above the top layer of the first conductive layers, and the plurality of first conductive layers and the plurality of second conductive layers are covered with a protection insulation layer that is formed continuously with the plurality of first conductive layers and the second conductive layers.

    摘要翻译: 每个存储器串包括:在垂直方向上延伸到衬底的第一柱状半导体层; 多个第一导电层,其形成为夹着具有电荷陷阱层的绝缘层并以二维方式扩展; 第二柱状半导体层,其与所述第一柱状半导体层的顶表面接触并且在垂直方向上延伸到所述衬底; 以及多个第二导电层,其形成为与第二柱状半导体层夹着绝缘层,并且形成为沿与垂直方向正交的第一方向延伸的条纹图案。 多个第一导电层的第一方向的端部相对于彼此分步地形成,多个第二导电层的整体形成在第一导电层的顶层的正上方的区域中, 并且多个第一导电层和多个第二导电层被与多个第一导电层和第二导电层连续形成的保护绝缘层覆盖。