公开(公告)号：US11251840B1

公开(公告)日：2022-02-15

申请号：US17107169

申请日：2020-11-30

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Ya Jing ,  Li Cao ,  Thorsten Hertel

IPC: H04B3/46 ,  H04B7/0426 ,  G01R29/08 ,  H04B17/10

Abstract: A system and method are provided to determine equivalent isotropic radiated power (EIRP), effective isotropic sensitivity (EIS) and/or signal quality of a DUT in a test chamber, where the DUT has an AUT that has beam-forming capability and is offset from a center of a quiet zone of the test chamber. The method includes establishing a connection with the DUT using a far-field probe antenna in a far-field of the test chamber relative to the AUT so that the AUT forms a beam in a beam peak direction towards the far-field probe antenna; locking the beam of the AUT in the beam peak direction to prevent subsequent beam forming; and performing a near-field measurement of the EIRP, the EIS and/or the signal quality of the AUT with the beam locked in the beam peak direction using a near-field probe antenna in a near-field of the test chamber.

公开(公告)号：US10917937B2

公开(公告)日：2021-02-09

申请号：US15520572

申请日：2014-10-20

Applicant: Keysight Technologies, Inc.

Inventor： Steve G. Duffy ,  Xu Zhao ,  Hong-Wei Kong ,  Ya Jing

IPC: H04W88/06 ,  H04W76/15 ,  H04W36/14 ,  H04W24/06 ,  H04W36/24 ,  H04W36/28 ,  H04W36/30 ,  H04W88/02

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

公开(公告)号：US20170318623A1

公开(公告)日：2017-11-02

申请号：US15520572

申请日：2014-10-20

Applicant: Stephen G. DUFFY ,  Hongwei KONG ,  Ya JING ,  Xu ZHAO ,  Keysight Technologies, Inc.

Inventor： Steve G. Duffy ,  Xu Zhao ,  Hong-Wei Kong ,  Ya Jing

IPC: H04W88/06 ,  H04W36/28 ,  H04W24/06 ,  H04W36/14 ,  H04W76/02 ,  H04W36/30

CPC classification number: H04W88/06 ,  H04W24/06 ,  H04W36/14 ,  H04W36/24 ,  H04W36/28 ,  H04W36/30 ,  H04W76/15 ,  H04W88/02

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

公开(公告)号：US11057119B2

公开(公告)日：2021-07-06

申请号：US16367642

申请日：2019-03-28

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Hong-Wei Kong ,  Zhu Wen

IPC: G01R29/10 ,  H04B17/10 ,  H04B17/12

Abstract: A method is provided for testing an antenna array of a DUT using a probe antenna, the antenna array including multiple antenna elements. The method includes providing a correction table that includes predetermined correction data of differences between far field antenna patterns from different positions in a far field of the antenna array and a middle field antenna pattern from a position in a middle field of the antenna array, where the middle field satisfies near field criteria for the antenna array and satisfies far field criteria for each antenna element in the antenna array; measuring an antenna pattern at a first position in the middle field of the antenna array; retrieving predetermined correction data from the correction table corresponding to a second position located in the far field of the antenna array; and translating the measured antenna pattern to the far field by adding the retrieved predetermined correction data.

公开(公告)号：US20200209296A1

公开(公告)日：2020-07-02

申请号：US16551240

申请日：2019-08-26

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Zhu Wen

IPC: G01R29/08 ,  G01R29/10 ,  H04B7/06 ,  H04B7/0452 ,  H04B17/10

Abstract: A system and method determine beam dynamics and multi-user performance of a base station having an antenna array including multiple antenna elements. The system includes a measurement probe antenna positioned in a mid-field of the antenna array, a reference antenna having a fixed position with respect to the base station antenna array, and a coupling probe array including multiple coupling probe antennas positioned in a reactive field of the base station antenna array for coupling RF signals of the antenna elements to selected coupling probe antennas to form high dimension radiation channel matrix between the antenna array and the coupling probe array. The system further includes a channel emulator configured to receive the measured antenna element patterns from the measurement probe antenna, to receive the RF signals coupled to the selected coupling probe antennas, to provide bi-directional channel models of channels between the base station and user devices.

公开(公告)号：US10177862B2

公开(公告)日：2019-01-08

申请号：US15615442

申请日：2017-06-06

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Ya Jing ,  Shao-Bo Chen ,  Hong-Wei Kong

IPC: H04B17/00 ,  H04B17/29 ,  H04B17/391 ,  H04B7/04 ,  H04B17/12

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

公开(公告)号：US09859995B2

公开(公告)日：2018-01-02

申请号：US15001164

申请日：2016-01-19

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Xu Zhao

IPC: H04W24/00 ,  H04B17/00 ,  H04B17/391 ,  H04B7/0413

CPC classification number: H04B17/0087 ,  H04B7/0413 ,  H04B17/3911

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

公开(公告)号：US20170317769A1

公开(公告)日：2017-11-02

申请号：US15531421

申请日：2015-01-19

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Xu Zhao

IPC: H04B17/29 ,  H04B17/15

CPC classification number: H04B17/29 ,  G06F11/2733 ,  H04B17/15

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

公开(公告)号：US20170223559A1

公开(公告)日：2017-08-03

申请号：US15423440

申请日：2017-02-02

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Yu Zuo ,  Zhu Wen ,  Ya Jing ,  Shao-Bo Chen

IPC: H04W24/06 ,  H04B7/0413

Abstract: A testing system includes a test chamber including an array of spaced-apart probe antennas and a positioner configured to support a device under test (DUT) having an array of digital antenna elements, a radio frequency (RF) signal generator and analyzer configured to send and receive RF test signals to/from the spaced-apart probe antennas, and an RF switch component configured to selectively couple the RF signal generator and analyzer to the array of spaced-apart probe antennas within the test chamber. A digital test instrument includes at least one digital signal generator and analyzer configured to generate digital test signals to the digital antenna elements of the DUT in a transmitter test mode, and to analyze received digital test signals from the digital antenna elements of the DUT in a receiver test mode, a programmable hardware device configured to implement a custom digital fiber interface protocol for the generated and received digital test signals, and a digital fiber interface configured to couple the programmable hardware device to the array of digital antenna elements of the DUT and transceive the digital test signals to/from the array of digital antenna elements of the DUT. A synchronization module is configured to synchronize the RF signal generator and analyzer, and the digital test instrument. A test controller is configured to control operation of the positioner, the RF signal generator and analyzer, the RF switch component and the digital test instrument during testing of the DUT.

公开(公告)号：US20170180175A1

公开(公告)日：2017-06-22

申请号：US15388526

申请日：2016-12-22

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing

IPC: H04L27/26 ,  H04L7/04 ,  H04L7/00 ,  H04B7/04 ,  H04B7/06

CPC classification number: H04L27/2602 ,  H04B7/0413 ,  H04B7/06 ,  H04L7/0091 ,  H04L7/04 ,  H04L27/227 ,  H04L27/3818 ,  H04L2027/0016 ,  H04L2027/0024

Abstract: The multi-channel signal processing device includes a multi-channel continuous waveform (CW) phase shifter module configured to generate phase control and filter interference therein for multiple local oscillator (LO) signals at a same frequency, a multi-channel up-converter module configured to up-convert the multiple LO signals to a desired frequency and filter respective image signals therein, and a multi-channel wideband mixer module configured to receive and mix the up-converted LO signals at the desired frequency from the multi-channel up-converter module with radio frequency (RF) signals.