INSTRUCTIVE ACTIONS BASED ON CATEGORIZATION OF INPUT DATA

    公开(公告)号:US20240143631A1

    公开(公告)日:2024-05-02

    申请号:US18391976

    申请日:2023-12-21

    CPC classification number: G06F16/285 G06F21/6245 G06N5/04 G06N20/00

    Abstract: Systems, devices, and methods related to generating instructive actions based on categorization of input data are described. In an example, a method can include receiving, from an edge device and at a processing resource of a device, a plurality of input data associated with a plurality of sources communicatively coupled to the edge device and categorizing each piece of the plurality of input data as private or public based on an associated one of the plurality of sources. The categorizing can include writing each piece of data with metadata that indicates that it is private or public and/or selecting a first data path indicated as private or a second data path indicated as public. The method can include writing each piece of the plurality of input data categorized as private to a dedicated buffer or a dedicated address space of a memory resource.

    Instructive actions based on categorization of input data

    公开(公告)号:US11874852B2

    公开(公告)日:2024-01-16

    申请号:US17006684

    申请日:2020-08-28

    CPC classification number: G06F16/285 G06F21/6245 G06N5/04 G06N20/00

    Abstract: Systems, devices, and methods related to generating instructive actions based on categorization of input data are described. In an example, a method can include receiving, from an edge device and at a processing resource of a device, a plurality of input data associated with a plurality of sources communicatively coupled to the edge device and categorizing each piece of the plurality of input data as private or public based on an associated one of the plurality of sources. The categorizing can include writing each piece of data with metadata that indicates that it is private or public and/or selecting a first data path indicated as private or a second data path indicated as public. The method can include writing each piece of the plurality of input data categorized as private to a dedicated buffer or a dedicated address space of a memory resource.

    INSTRUCTIVE ACTIONS BASED ON CATEGORIZATION OF INPUT DATA

    公开(公告)号:US20220067070A1

    公开(公告)日:2022-03-03

    申请号:US17006684

    申请日:2020-08-28

    Abstract: Systems, devices, and methods related to generating instructive actions based on categorization of input data are described. In an example, a method can include receiving, from an edge device and at a processing resource of a device, a plurality of input data associated with a plurality of sources communicatively coupled to the edge device and categorizing each piece of the plurality of input data as private or public based on an associated one of the plurality of sources. The categorizing can include writing each piece of data with metadata that indicates that it is private or public and/or selecting a first data path indicated as private or a second data path indicated as public. The method can include writing each piece of the plurality of input data categorized as private to a dedicated buffer or a dedicated address space of a memory resource.

    TESTING SEMICONDUCTOR DEVICES BASED ON WARPAGE AND ASSOCIATED METHODS

    公开(公告)号:US20190333796A1

    公开(公告)日:2019-10-31

    申请号:US15962648

    申请日:2018-04-25

    Abstract: Several embodiments of the present technology are directed to semiconductor devices, and systems and associated methods for treating semiconductor devices based on warpage data. In some embodiments, a method can include heating a plurality of semiconductor devices from a first temperature to a second temperature, and determining warpage data at a plurality of points on the surfaces of the semiconductor devices as they are being heated. The method can further comprise applying a multivariate analysis to the surface warpage data to generate a multivariate statistic for each of the semiconductor devices at various sample temperatures. The multivariate statistics can be used to determine whether the semiconductor devices exceed or fall below a threshold limit.

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