摘要:
In response to complementary clock signals provided from a driver, a charge pump operates to provide an output voltage which is a down-converted negative voltage. The voltage between this output voltage and a predetermined positive reference voltage is capacitance-divided by capacitors. The capacitance-divided positive voltage is applied to a comparator, whereby a reference voltage is compared with the above positive voltage. An output signal of the comparator is applied to the driver. In response, the driver controls the operation of the charge pump, whereby the output voltage is clamped at a predetermined voltage level for output.
摘要:
Particular blocks are a boot block and parameter block having a storage capacity smaller than that of a general block. In the case where a boot block is not required, a signal BOOTE is set at an L level. In the case where a signal BLKSEL is at an H level in an erasure mode, a control unit selects four blocks aligned in a horizontal direction at the same time. The control unit also selects two blocks simultaneously in the vertical direction. As a result, the particular eight blocks are selected. The boot block and parameter block can be erased collectively as one block having a capacity similar to that of a general block. Therefore, a flash memory corresponding to the case of including a boot block and not including a boot block can be implemented simultaneously with one chip. Thus, the designing and fabrication process can be simplified.
摘要:
In a flash memory, a reading bit line and a writing bit line are provided corresponding to a respective column of memory cells. A well voltage and a voltage on a source line can be controlled for each sub-block. Accordingly, data can be read at a sub-block while data can be written/erased at another sub-block, and therefore, the capacity ratio of a back ground operation region to the main memory region can be changed as desired.
摘要:
A method of erasing data of a nonvolatile semiconductor memory unit includes the first step of collectively applying a preliminary write pulse to memory transistors, the second step of repeating, up to a first erased state, an operation of collective application of a first erase pulse to the memory transistors with change of intensity of the first erase pulse in second and subsequent application operations of the first erase pulse, the third step of repeating, up to a recovered state, an operation of collective application of a write pulse to the memory transistors with change of intensity of the write pulse in second and subsequent application operations of the write pulse, the fourth step of repeating, up to a second erased state, an operation of collective application of a second erase pulse to the memory transistors with change of intensity of the second erase pulse in second and subsequent application operations of the second erase pulse and the fifth step of repeating a selective recovery operation on the memory transistors until the memory transistors are not in an overerased state.
摘要:
An internal potential generation circuit operates with the potential levels of an output node N.sub.H1 of a first boosting circuit and an output node N.sub.H2 of a second boosting circuit maintained in common in response to a high voltage switch circuit attaining a conductive state at the initial stage of the operation of the internal potential generation circuit. After the output potential level of the second boosting circuit arrives at a predetermined potential level, the high voltage switch circuit is cut off, whereby the first and second boosting circuits drive independently the potential level of corresponding output nodes.