Enhanced EPROM structures with accentuated hot electron generation regions
    21.
    发明授权
    Enhanced EPROM structures with accentuated hot electron generation regions 失效
    增强的EPROM结构,具有突出的热电子发生区域

    公开(公告)号:US06566705B1

    公开(公告)日:2003-05-20

    申请号:US10026320

    申请日:2001-12-20

    IPC分类号: H01L2976

    CPC分类号: H01L29/66825 H01L29/7885

    摘要: An EPROM structure includes a NMOS transistor integrated with a capacitor. The terminal names of the NMOS transistor follow the conventional nomenclature: drain, source, body and gate. The gate of the NMOS transistor is connected directly and exclusively to one of the capacitor plates. In this configuration, the gate is now referred to as the “floating gate”. The remaining side of the capacitor is referred to as the “control gate”.

    摘要翻译: EPROM结构包括与电容器集成的NMOS晶体管。 NMOS晶体管的端子名称遵循常规命名法:漏极,源极,主体和栅极。 NMOS晶体管的栅极直接连接到电容器板之一。 在这种配置中,现在将栅极称为“浮动栅极”。 电容器的剩余侧称为“控制栅极”。