摘要:
An optic device includes a multilayer zone forming a redirection section for redirecting and transmitting photons through total internal reflection, each multilayer zone including a high index material having a first real refractive index n1 and a first absorption coefficient β1, a low index material having a second real refractive index n2 and a second absorption coefficient β2, and a grading zone disposed between the high index material and the low index material and including a grading layer having a third real refractive index n3 and a third absorption coefficient β3, wherein n1>n3>n2.
摘要:
A mammograph is provided. The mammograph includes a source of X-rays; a detector of X-rays, the source being configured to emit at least one beam of X-rays to the detector; and an optic control device configured to control the direction of X-rays emitted by the source such that the X-rays emitted. by the source are substantially parallel to one another,
摘要:
A system to detect a plurality of elements is proposed. The system includes one or more X-ray sources for transmitting X-rays towards a sample and also includes plurality of photon detectors. An array of crystals are arranged in a curvature with appropriate geometry for receiving a plurality of photon energies emitted from the sample and focusing the photon energy on the plurality of detectors. The plurality of photon detectors are spatially arranged at Bragg angles corresponding to signature photon energies to detect the plurality of elements simultaneously.
摘要:
A system to detect a plurality of elements is proposed. The system includes one or more X-ray sources for transmitting X-rays towards a sample and also includes plurality of photon detectors. An array of crystals are arranged in a curvature with appropriate geometry for receiving a plurality of photon energies emitted from the sample and focusing the photon energy on the plurality of detectors. The plurality of photon detectors are spatially arranged at Bragg angles corresponding to signature photon energies to detect the plurality of elements simultaneously.
摘要:
An X-ray detection and inspection system is disclosed. The system includes an X-ray source configured to generate an interrogating X-ray beam, wherein the X-ray beam is directed towards a probe volume in a sample, one or more two-dimensional area detectors, wherein the one or more detectors are positioned at angles other than 90 degrees with respect to the direction of the interrogating beam and are configured to receive and detect non-circular conic sections of diffracted X rays from the probe volume, and an acquisition and analysis system configured to generate position and intensity data of the non-circular conic sections such that the corresponding mathematical equations of the conic sections could be generated, to identify one of a quasi-monochromatic or monochromatic XRD pattern from the non-circular conic sections, and to determine a position of the probe volume and at least two Bragg diffraction angles from said XRD pattern.