STATIC TIMING ANALYSIS METHOD AND SYSTEM CONSIDERING CAPACITIVE COUPLING AND DOUBLE PATTERNING MASK MISALIGNMENT

    公开(公告)号:US20140013292A1

    公开(公告)日:2014-01-09

    申请号:US13723248

    申请日:2012-12-21

    CPC classification number: G06F17/5081 G06F17/5031 G06F17/504 G06F2217/84

    Abstract: A method for analyzing an IC design, comprises: using a computer implemented electronic design automation tool to perform a parasitic RC extraction for a layout of the IC design, the parasitic RC extraction outputting for each of a plurality of routing paths, a nominal capacitive coupling, a minimum capacitive coupling and a maximum capacitive coupling, where the minimum and maximum capacitive couplings correspond to circuit patterning in the presence of double patterning mask misalignments; and performing one of a setup time analysis or a hold time analysis of the IC design using a computer implemented static timing analysis tool. For a given flip-flop having a launch path and a capture path, the setup or hold time analyses is performed using the minimum capacitive coupling for one of the launch and capture paths and the maximum capacitive coupling for the other of the launch and capture paths.

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