Measuring method and device of machine accuracy in machine tool

    公开(公告)号:US10378872B2

    公开(公告)日:2019-08-13

    申请号:US15451439

    申请日:2017-03-07

    发明人: Tomoki Sakai

    IPC分类号: B23Q17/00 G01B21/04 G01B5/012

    摘要: A method and a device can measure machine error of an axis of rotation in a tool post having a touch probe without restriction of an angular range of an angle of rotation. Directions of a measurement plane and a measurement axis in a five-axis measurement are switched in correspondence to a range of the angle of rotation in a touch probe. The five-axis measurement is carried out by setting a position in a direction of a measurement axis in a measurement plane to a position where a reference sphere does not interfere with a lever rod of the touch probe as occasion demands. The five-axis measurement is carried out, for example, by setting the measurement plane to a position which is perpendicular to a line connecting an estimated center of the reference sphere and a center of a tip sphere or the lever rod of the touch probe.

    INSTRUMENT FOR MEASURING WORKPIECE, AND MACHINE TOOL

    公开(公告)号:US20190111534A1

    公开(公告)日:2019-04-18

    申请号:US16090108

    申请日:2016-03-31

    摘要: The present invention is configured such that: when an operator moves a spindle and a table relative to each other using a jog-feed means and when a measurement probe comes into contact with a workpiece fixed on the table, the coordinates of each feed axis are stored; the type of measurement performed by the operator is identified on the basis of the information concerning the feed axis used for moving said measurement probe, the moving direction of the feed axis, the number of times the measurement probe has come into contact with the workpiece, and the number of the jog-feed operation being currently performed by the operator; and the workpiece is measured on the basis of the stored coordinates of the respective feed axes.

    SYSTEM FOR DETERMINING A STATE OF A TOOL POSITIONING MACHINE

    公开(公告)号:US20190107378A1

    公开(公告)日:2019-04-11

    申请号:US16155702

    申请日:2018-10-09

    IPC分类号: G01B5/00 G01B5/012 G01B21/04

    摘要: A system for providing state information for at least a part of a tool positioning machine embodied as manipulating machine or as coordinate measuring machine is provided. The system comprises the tool positioning machine defining a machine coordinate system and having a base and a machine structure. The structure comprises a tool head and structural components for linking the tool head to the base, at least one drive mechanism for providing movability of the machine structure relative to the base, a position determining system for deriving at least one coordinate of the machine structure in the machine coordinate system and a controlling unit adapted for controlling movement of the machine structure. The system comprises a calibration setup. A calibration component is mounted on the machine structure and defines a moveable reference point, another calibration component is arranged with defined spatial relation to the base and provides a nominal calibration position.

    Touch trigger probe
    24.
    发明授权

    公开(公告)号:US10228229B2

    公开(公告)日:2019-03-12

    申请号:US15813006

    申请日:2017-11-14

    申请人: TESA SA

    摘要: A touch probe for a coordinate measuring machine with a processor which is programmed to generate a trigger signal signalling a contact between a stylus of the probe and a workpiece, whenever one of a plurality displacement signals exceeds a corresponding threshold. In addition, or in alternative, a delayed trigger is generated based on a processing a plurality of samples of displacement signals that are stored in a buffer. The processor is programmed to minimize anisotropy of the probe response. Furthermore, the thresholds can be modified during operations based on commands received from the CMM controller.

    MEASURING DEVICE
    25.
    发明申请
    MEASURING DEVICE 审中-公开

    公开(公告)号:US20190056210A1

    公开(公告)日:2019-02-21

    申请号:US16053160

    申请日:2018-08-02

    IPC分类号: G01B5/012 G01B5/20 G01B5/08

    摘要: The present invention relates to a measuring unit (10) for in-process measurement during a machining operation on machine tool, in particular a grinding machine comprising at least a wheel head arranged at a headstock, comprising a measuring head (14), which is movable between a rest position and a measuring position, and means for moving the measuring head between the rest position and the measuring position. The measuring unit (10) is configured such that the rest position and the measuring position of the measuring head (14) are infinitely adjustable by a user by controlling the movement of the measuring head (14) between the rest position and the measuring position.

    Fabrication and monitoring device for micro probe ball tip

    公开(公告)号:US10209049B2

    公开(公告)日:2019-02-19

    申请号:US15587380

    申请日:2017-05-04

    IPC分类号: G01B5/012 G01B1/00 B21K1/02

    摘要: A fabrication and monitoring device for micro probe ball tips includes a magnetic field generator, a 3-dimensional displacement adjusting mechanism, a wire supplier and an image monitoring system. The magnetic field generator includes a U-shaped electromagnet. The 3-dimensional displacement adjusting mechanism includes a 2-dimensional moving platform, a 1-dimensional moving platform, a guiding tube, and a sparking plug. The wire supplier includes a transmission wheel, a pressing roller, a wire feeding roller and a tungsten wire material supplier. The image monitoring system includes a micro objective, a third-generation infinite beam structure lens and a supporting frame. The present invention overcomes an eccentric problem of a tungsten ball and a tungsten rod, and also overcomes a sphericity problem caused by gravity, so as to improve sphericity, eccentric accuracy and enable monitoring of dynamic manufacturing process of the probe ball tips.

    Correcting apparatus and correcting method

    公开(公告)号:US10184774B2

    公开(公告)日:2019-01-22

    申请号:US15350295

    申请日:2016-11-14

    IPC分类号: G01B5/004 G01B5/008 G01B5/012

    摘要: A correcting apparatus includes: a detecting pin; a microcomputer configured or programmed to acquire a first coordinate value indicative of a first coordinate of a detection point, and a first height, and to acquire a second coordinate value indicative of a second coordinate of the detection point, and a second height; to rotate the detecting pin by 180 degrees, and to acquire, with the detecting pin rotated by 180 degrees, a third coordinate value indicative of a third coordinate of the detection point, and a fourth coordinate value indicative of a fourth coordinate of the detection point; to generate, in accordance with the values acquired, a first linear equation including a third height as a variable; and to correct a fifth coordinate value indicative of a coordinate of a measurement point using the first linear equation.

    OPERATION METHOD OF POSITION MEASURING DEVICE

    公开(公告)号:US20180340763A1

    公开(公告)日:2018-11-29

    申请号:US15987439

    申请日:2018-05-23

    发明人: Shinsaku Abe

    IPC分类号: G01B5/012 G06F3/041

    摘要: To provide an operation method of a position measuring device capable of accurately and quickly designating a detection point of an object by intuitive operability, such as directly moving the probe with a hand. One aspect of the present invention is an operation method of a position measuring device that includes a measurement head having a probe for designating a detection point of a position of an object, and a moving mechanism for moving the measurement head, and acquires a coordinate of the detection point designated by the probe. The operation method of a position measuring device includes the steps of: using a terminal device including an image acquisition part and a display part to acquire an image of the probe by the image acquisition part and display the image on the display part; detecting a relative positional relation between the probe and the terminal device when having received a movement instruction by the terminal device in a state where an image of the probe is displayed on the display part; and performing a movement control of the measurement head following the movement instruction received by the terminal device by actuating the moving mechanism on the basis of the positional relation.

    TOUCH TRIGGER PROBE
    30.
    发明申请
    TOUCH TRIGGER PROBE 审中-公开

    公开(公告)号:US20180328707A1

    公开(公告)日:2018-11-15

    申请号:US15813006

    申请日:2017-11-14

    申请人: TESA SA

    IPC分类号: G01B5/012 G01B7/012

    摘要: A touch probe for a coordinate measuring machine with a processor which is programmed to generate a trigger signal signalling a contact between a stylus of the probe and a workpiece, whenever one of a plurality displacement signals exceeds a corresponding threshold. In addition, or in alternative, a delayed trigger is generated based on a processing a plurality of samples of displacement signals that are stored in a buffer. The processor is programmed to minimize anisotropy of the probe response. Furthermore, the thresholds can be modified during operations based on commands received from the CMM controller.