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公开(公告)号：US20220390735A1
公开(公告)日：2022-12-08
申请号：US17828154
申请日：2022-05-31
摘要： A method, a device, and a computer program product captures microscopy objects in image data that includes first images recorded with a first contrast and second images recorded with a second contrast, wherein in each case, one of the first and one of the second images can be correspondingly assigned to each other. The method includes capturing information indicating microscopy objects in at least one of the second images, transferring the captured information to those of the first images which correspond to the at least one of the second images, and capturing information indicating microscopy objects in the first images, to which the captured information of the second images was transferred by using the transferred information.
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公开(公告)号：US20220382038A1
公开(公告)日：2022-12-01
申请号：US17775768
申请日：2020-11-13
发明人： Manuel Amthor , Daniel Haase
摘要： A method for processing microscope images in order to generate an image processing result comprises: implementing a convolutional neural network, wherein a first convolutional layer calculates an output tensor from an input tensor formed from a microscope image. The output tensor is input into one or more further layers of the convolutional neural network in order to calculate the image processing result. The first convolutional layer comprises a plurality of filter kernels. At least several of the filter kernels are respectively representable by at least one filter matrix with learning parameters and dependent filter matrices with implicit parameters, which are determined by means of the learning parameters and one or more weights to be learned, wherein the filter matrices with learning parameters of different filter kernels are different from one another and different layers of the output tensor are calculated by different filter kernels.
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公开(公告)号：US11504798B2
公开(公告)日：2022-11-22
申请号：US16401530
申请日：2019-05-02
发明人： Josef Biberger , Ralph Pulwey
IPC分类号： B23K15/00 , H01J37/304 , H01J37/305 , B23K15/08
摘要： A method of raster scanning a surface of an object using a particle beam comprises determining a basic set of raster points within a surface; determining a surface portion of the surface of the object, wherein the surface portion is to be raster scanned; ordering a set of raster points of the basic set located within the surface portion; and scanning of the surface portion by directing the particle beam onto the raster points of the ordered set in an order corresponding to an order of the raster points in the ordered set from the outside to the inside, i.e. starting from the boundary of the surface portion towards its center, or in the reverse order, i.e. from the inside to the outside.
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公开(公告)号：US20220365332A1
公开(公告)日：2022-11-17
申请号：US17766098
申请日：2020-10-12
发明人： Daniel SCHWEDT , Tiemo ANHUT
摘要： A light microscope and a method for capturing images with a light microscope includes guiding illumination light to a sample; guiding detection light from the sample to a plurality of photon-counting sensor elements, which each successively capture a plurality of photon counts; forming a plurality of photon count distributions to be analyzed and at least one reference photon count distribution from the photon counts; calculating a similarity between each photon count distribution to be analyzed and the reference photon count distribution; and identifying sensor elements as overdriven as a function of the calculated similarity of the corresponding photon count distribution(s) to be analyzed.
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公开(公告)号：US11474335B2
公开(公告)日：2022-10-18
申请号：US16640706
申请日：2018-08-06
发明人： Thomas Ohrt , Michael Goegler , Thorsten Kues
摘要： A microscope objective for imaging a specimen using a microscope, the microscope objective being designed as an air objective for microscopy without an immersion medium or as an oil immersion objective for microscopy with an oil-based immersion medium or as a water immersion objective for microscopy with a water-based immersion medium. The front lens of the microscope objective is provided with a coating which repels an immersion medium and is lipophobic and hydrophobic if the objective is an air objective, only lipophobic if the objective is a water immersion objective, and only hydrophobic if the objective is an oil immersion objective.
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公开(公告)号：US11454790B2
公开(公告)日：2022-09-27
申请号：US16610037
申请日：2018-04-30
摘要： A microscope system having a plurality of microscope modules connected to one another for data transfer purposes. The microscope system includes a central clock generator, the clock signal of which is provided to all microscope modules. The microscope modules are configured to use the clock signal or a clock derived therefrom as an internal clock. Moreover, a corresponding method for operating such a microscope system is described.
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公开(公告)号：US20220236551A1
公开(公告)日：2022-07-28
申请号：US17578747
申请日：2022-01-19
发明人： Manuel Amthor , Daniel Haase , Thomas Ohrt
摘要： In a method for checking the rotation of a microscope camera, an overview image is captured with an overview camera of a microscope, wherein a rotational orientation of the overview camera relative to a sample stage of the microscope is known. In addition, a microscope image is captured with a microscope camera of the microscope. A rotational orientation of the microscope camera relative to the sample stage is calculated based on a relative rotation between the microscope image and the overview image, wherein the relative rotation is established by means of image structures in the microscope image and the overview image and using the known rotational orientation of the overview camera relative to the sample stage.
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公开(公告)号：US20220230843A1
公开(公告)日：2022-07-21
申请号：US17458771
申请日：2021-08-27
发明人： Alexander Orchowski
IPC分类号： H01J37/28 , H01J37/20 , H01J37/304
摘要： The system described herein relates to a method for operating a beam apparatus, such as a particle beam apparatus or laser beam apparatus, a computer program product and a beam apparatus for carrying out the method, and to an object holder for an object that, for example, is able to be arranged in a particle beam apparatus. The method includes generating a marking on an object holder using a laser beam of a laser beam device and/or using a particle beam of the particle beam apparatus, where the particle beam includes charged particles, arranging an object on the object holder, moving the object holder, positioning the particle beam and/or the laser beam in relative fashion in relation to the object using the marking, and processing, imaging and/or analyzing the object using the particle beam and/or the laser beam.
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公开(公告)号：US20220193819A1
公开(公告)日：2022-06-23
申请号：US17556070
申请日：2021-12-20
发明人： Stephan Hiller
IPC分类号： B23K26/04 , H01J37/22 , H01J37/20 , B23K26/03 , B23K26/082 , B23K26/362 , B23K26/08 , H01L21/67 , H01L21/268 , H01L23/544
摘要： A material processing system includes a particle beam column for directing a particle beam at a first processing region and a laser scanner for directing a laser beam at a second processing region. A method for operating the material processing system includes: scanning a first mark placed on an object with the particle beam; scanning the first mark with the laser beam for a first time and producing a second mark on the object with the laser beam; scanning the second mark with the particle beam; and scanning the first mark with the laser beam for a second time and removing material of the object with the laser beam based on the scanning of the second mark with the particle beam.
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公开(公告)号：US20220146804A1
公开(公告)日：2022-05-12
申请号：US17523214
申请日：2021-11-10
发明人： Nikolaj SCHRÖDER
摘要： A laser scanning microscope and method for adjusting a laser scanning microscope. The microscope has an optical system which has a light guiding fiber between the first light source and the third beam deflection unit and has no light guiding fibers between the second light source and the third beam deflection unit. In this way, the second light source can be used as an adjustment reference for the first and second beam deflection units. The adjustment can be implemented using test images recorded by means of the third and fourth beam deflection units; additional sensors or internal calibration samples are not required.
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