UNAMBIGUOUS RETARDANCE MEASUREMENT
    31.
    发明申请
    UNAMBIGUOUS RETARDANCE MEASUREMENT 审中-公开
    不可逾越的测量

    公开(公告)号:US20160091416A1

    公开(公告)日:2016-03-31

    申请号:US14866612

    申请日:2015-09-25

    IPC分类号: G01N21/21

    CPC分类号: G01N21/21 G01N21/23

    摘要: This invention is directed to methods of unambiguously measuring the absolute retardance, δA of an optical sample. A method for measuring absolute retardance of an optical sample includes directing light comprising a plurality of wavelengths through a polarization state generator source, the optical sample, and a polarization state analyzer, detecting, at an imaging device, retardance measurement light emanating from the optical sample after also passing through the polarization state analyzer at the plurality of wavelengths, determining a measurement retardance associated with the detected retardance measurement light at each of the wavelengths, and determining an absolute retardance associated with the optical sample based on the measurement retardances determined at each of the wavelengths.

    摘要翻译: 本发明涉及明确测量光学样品的绝对延迟δA的方法。 用于测量光学样本的绝对延迟的方法包括通过偏振态发生器源,光学样本和偏振状态分析器引导包括多个波长的光,在成像装置处检测从光学样本发出的延迟测量光 在通过多个波长的偏振状态分析器之后,确定与每个波长处的检测到的延迟测量光相关联的测量延迟,并且基于在每个波长处确定的测量阻抗来确定与光学样本相关联的绝对延迟 波长。

    Detection System for Birefringence Measurement
    32.
    发明申请
    Detection System for Birefringence Measurement 有权
    双折射测量检测系统

    公开(公告)号:US20090279089A1

    公开(公告)日:2009-11-12

    申请号:US12442490

    申请日:2007-09-26

    申请人: Baoliang Wang

    发明人: Baoliang Wang

    IPC分类号: G01J4/00 G02B27/30

    CPC分类号: F21V5/04 G01N21/23

    摘要: A method of controlling a light beam in an optical system includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary detector. The method includes the step selectively moving a lens into the path of the light beam for spreading the beam in instances where the path of the beam is altered by the sample between the source and the stationary detector The detector, therefore, is held stationary. Adjustment means are provided for increasing the intensity characteristic of the light that reaches the detector to account for a decrease in intensity that occurs when the lens is in the path of the light beam to spread the beam.

    摘要翻译: 一种控制光学系统中的光束的方法包括:光源,其沿着路径,通过样本并朝向固定检测器的有效区域引导准直光束。 该方法包括步骤:将透镜移动到光束的路径中,以在光束的路径被源和静态检测器之间的样本改变的情况下扩散光束。因此,检测器保持静止。 提供了调节装置,用于增加到达检测器的光的强度特性,以解决当透镜在光束的路径中扩散光束时发生的强度的降低。

    Automatic Gain Control in Photodetectors
    33.
    发明申请
    Automatic Gain Control in Photodetectors 有权
    光电探测器的自动增益控制

    公开(公告)号:US20080290257A1

    公开(公告)日:2008-11-27

    申请号:US11752225

    申请日:2007-05-22

    IPC分类号: H03G3/20

    CPC分类号: H03G3/3084

    摘要: The amount of gain applied to a photodetector such as a photomultiplier tube (PMT) is limited to an amount that does not cause the applied PMT bias voltage to overdrive, hence damage, the PMT. Techniques for limiting the PMT gain are implemented in a way that does not interfere with the precision with which the PMT gain may be established (by selection of a reference level) below that limited level.

    摘要翻译: 施加到诸如光电倍增管(PMT)的光电检测器的增益的量被限制为不会使施加的PMT偏置电压过驱动的量,从而损坏PMT。 用于限制PMT增益的技术以不影响PMT增益的精度(通过选择参考电平)低于该限制级别的方式来实现。

    Electronic control system for an optical assembly
    35.
    发明授权
    Electronic control system for an optical assembly 失效
    光学组件电子控制系统

    公开(公告)号:US5744721A

    公开(公告)日:1998-04-28

    申请号:US548502

    申请日:1995-10-25

    摘要: An electronic control system that accurately maintains oscillation of an optical assembly at resonance. In the preferred embodiment, a signal control circuit delivers an input signal to an optical assembly. A resonance detector detects the difference in phase between the input signal and a feedback signal from the optical assembly. The phase difference is used to determine whether the optical assembly is at resonance. The signal control circuit is responsive to the resonance detector and modifies the frequency of the input signal to oscillate the optical assembly at its resonant frequency. The electronic control system can also maintain multiple optical assemblies at resonance.

    摘要翻译: 一种能够精确地保持光学组件在共振时的振荡的电子控制系统。 在优选实施例中,信号控制电路将输入信号传送到光学组件。 共振检测器检测输入信号和来自光学组件的反馈信号之间的相位差。 相位差用于确定光学组件是否处于共振。 信号控制电路响应谐振检测器并修改输入信号的频率以使光学组件以其谐振频率振荡。 电子控制系统还可以在谐振时保持多个光学组件。

    SYNCHRONOUS PHOTOELASTIC MODULATOR DRIVING AND DETECTION

    公开(公告)号:US20200174289A1

    公开(公告)日:2020-06-04

    申请号:US16692796

    申请日:2019-11-22

    发明人: John Freudenthal

    IPC分类号: G02F1/03 G02F1/11 H03L7/093

    摘要: Apparatus include a photoelastic modulator (PEM) optical element, a controller having a frequency generator configured to produce a frequency signal at a selected frequency based on a clock signal of the controller wherein the controller is configured to produce a PEM driving signal based on the frequency signal, a PEM transducer coupled to the PEM optical element and the controller and configured to drive the PEM with the PEM driving signal, and a detector optically coupled to the PEM optical element and configured to receive a PEM modulated output and to produce a PEM detection signal that includes a PEM modulation signal, wherein the controller is configured to receive the PEM detection signal and to extract the PEM modulation signal from the PEM detection signal using the frequency signal and the clock signal.

    MITIGATING MENISCUS EFFECTS IN VERTICALLY ORIENTED CIRCULAR DICHROISM SPECTROMETERY

    公开(公告)号:US20180283948A1

    公开(公告)日:2018-10-04

    申请号:US15765698

    申请日:2016-10-06

    发明人: Baoliang Wang

    摘要: Example embodiments of methods, apparatus, and systems for measuring polarimetric parameters using spectroscopy are disclosed herein. Particular embodiments concern circular dichroism (CD) spectrometers that use a vertically aligned beam. In such embodiments, the solution being analyzed may have a top surface that forms a convex or concave meniscus, creating a surface through which the measuring beam passes that may refract the beam in undesirable ways. Accordingly, particular embodiments of the disclosed technology include one or more meniscus-compensating (meniscus-effect-reducing) components or subsystems. These components and/or subsystems can be used alone or in combination with one another to reduce the undesirable refractive effects caused by the meniscus at the solution's surface, thereby improving the resulting quality of the spectroscopy measurement and potentially improving the speed with which CD spectroscopy can be performed.

    Unambiguous retardance measurement
    38.
    发明授权

    公开(公告)号:US09841372B2

    公开(公告)日:2017-12-12

    申请号:US14866612

    申请日:2015-09-25

    IPC分类号: G01J4/00 G01N21/21 G01N21/23

    CPC分类号: G01N21/21 G01N21/23

    摘要: This invention is directed to methods of unambiguously measuring the absolute retardance, δA of an optical sample. A method for measuring absolute retardance of an optical sample includes directing light comprising a plurality of wavelengths through a polarization state generator source, the optical sample, and a polarization state analyzer, detecting, at an imaging device, retardance measurement light emanating from the optical sample after also passing through the polarization state analyzer at the plurality of wavelengths, determining a measurement retardance associated with the detected retardance measurement light at each of the wavelengths, and determining an absolute retardance associated with the optical sample based on the measurement retardances determined at each of the wavelengths.

    POLARIZATION PROPERTIES IMAGING SYSTEMS
    39.
    发明申请
    POLARIZATION PROPERTIES IMAGING SYSTEMS 有权
    偏振特性成像系统

    公开(公告)号:US20160116397A1

    公开(公告)日:2016-04-28

    申请号:US14893157

    申请日:2014-05-20

    IPC分类号: G01N21/23

    摘要: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

    摘要翻译: 本公开一般涉及用于对光学材料样品的偏振特性进行成像的系统。 作为一个示例,提供了一种用于在宽范围的入射角下精确地同时成像样品材料的面内和平面外双折射性质的系统的系统。 除了作为优选实施例讨论的平面内和平面外双折射度量之外,本文描述的示例性空间分辨成像方法适于确定宽范围的偏振特性。

    Birefringence measurement of polycrystalline silicon samples or the like
    40.
    发明授权
    Birefringence measurement of polycrystalline silicon samples or the like 有权
    多晶硅样品的双折射测量等

    公开(公告)号:US09228936B2

    公开(公告)日:2016-01-05

    申请号:US14095833

    申请日:2013-12-03

    发明人: Baoliang Wang

    IPC分类号: G01N21/23

    CPC分类号: G01N21/23

    摘要: A birefringence measurement system includes a lens mounted for selective movement into and out of use in the optical setup so that a wide range of sample types can be handled by the system without reconfiguring the primary components of the optical setup of the system (moving the detector, changing the light source power, etc.) in a manner that would sacrifice the cost effectiveness, efficiency, mechanical reliability and repeatability of measurements for such systems.

    摘要翻译: 双折射测量系统包括安装用于在光学设置中选择性地移入和移出使用的透镜,使得可以由系统处理大范围的采样类型,而不重新配置系统的光学设置的主要部件(移动检测器 ,改变光源功率等),以牺牲这种系统的成本效益,效率,机械可靠性和测量重复性。