摘要:
A method and system for fracturing or mask data preparation or proximity effect correction is disclosed in which a series of charged particle beam shots is determined, where the series of shots is capable of forming a continuous non-manhattan track on a surface, such that the non-manhattan track has a line width roughness (LWR) which nearly equals a target LWR. A method and system for fracturing or mask data preparation or proximity effect correction is also disclosed in which at least two series of shots are determined, where each series of shots is capable of forming a continuous non-manhattan track on a surface, and where the space between tracks has space width roughness (SWR) which nearly equals a target SWR.
摘要:
Some embodiments of the invention provide a method of for routing nets within a region of an integrated circuit (“IC”) layout. The method selects a net in the IC layout region. It then identifies a topological route for the selected net. From the selected net's topological route, this method then generates a geometric route for the selected net.
摘要:
Some embodiments of the invention provide a method of routing nets in a region of a design layout. The region contains a plurality of nets and has multiple interconnect layers. The method identifies routes for a set of nets in the region, where some of the routes utilize vias to traverse multiple interconnect layers. The method then moves at least one via to improve the routing.
摘要:
Some embodiments of the invention provide a method for generating a route for a net in an integrated circuit (“IC”) layout. The method receives a previously defined route. From the received route, it generates several constraining points for specifying a geometric route that is based on a particular wiring model. The method then uses the constraining points to generate a geometric route that traverses diagonal and Manhattan directions.