Abstract:
A NROM memory device includes an array of memory cells and first and second bit lines. The first and second bit lines are coupled to opposite sides of the memory cells. During an erase operation, one of the sides of the memory cells receives a positive voltage and the other side couples to a common node or a limited current source. Methods are also disclosed that can easily screen for marginal memory cells based on a threshold voltage distribution of the memory cells.
Abstract:
An exemplary power supply circuit (20) includes an input terminal (201), an output terminal (202), voltage converting circuits (23, 24), and a pulse width modulation circuit (22). The input terminal is capable of receiving a direct current voltage. The output terminal is capable of providing voltage to a load circuit. The voltage converting circuits are connected in parallel between the input terminal and the output terminal. The pulse width modulation circuit is configured to control the voltage converting circuits to convert the direct current voltage into pulse voltages. A phase of each pulse voltage is delayed relative to that of an adjacent preceding pulse voltage.
Abstract:
A memory cell array, such as an EEPROM flash memory array, includes a current limiting circuit that limits a sum of leakage currents from nonselected memory cells during operation of the array, such as during a programming operation.