摘要:
Embodiments of a pellicle, methods of fabrication and methods of use in extreme ultraviolet (EUV) photolithography are disclosed. The pellicle may include a wire mesh with a square or hexagonal geometric configuration. A thin film of a material with a high Young's modulus may be coated on at least one surface of the wire mesh. A method of fabrication may include forming at least one sacrificial layer on a surface of the wire mesh, forming a thin film on another surface of the wire mesh, and removing the sacrificial layer to form a pellicle. A method of use may include positioning a pellicle relative to a photomask to protect the photomask from particulate accumulation during an EUV photolithography process.
摘要:
According to one embodiment a broad-angle multilayer (ML) mirror system is disclosed. The ML mirror includes a multiple layer structure configured to provide uniform reflectivity over a wide range of angles with small phase shifts.
摘要:
A system and method for collecting radiation, which may be used in a lithography illumination system. The system comprises a first surface shaped to reflect radiation in a first hemisphere of a source to illuminate in a second hemisphere of the source; and a second surface shaped to reflect radiation in the second hemisphere of the source to an output plane.
摘要:
Embodiments of a pellicle, methods of fabrication and methods of use in extreme ultraviolet (EUV) photolithography are disclosed. The pellicle may include a wire mesh with a square or hexagonal geometric configuration. A thin film of a material with a high Young's modulus may be coated on at least one surface of the wire mesh. A method of fabrication may include forming at least one sacrificial layer on a surface of the wire mesh, forming a thin film on another surface of the wire mesh, and removing the sacrificial layer to form a pellicle. A method of use may include positioning a pellicle relative to a photomask to protect the photomask from particulate accumulation during an EUV photolithography process.
摘要:
A wafer comprising polycrystalline silicon is used in various applications, including as a handling wafer, a test wafer, a dummy wafer, or as a substrate in a bonded die. Use of polycrystalline material instead of single-crystal may lower expenses.
摘要:
A reflective optical illumination collector is described. In one example, the collector has a ring to collect light from a light source within a range of incident angles and to reflect the light off an inner surface of the ring to a target image of the collector. A plurality of rings concentric to the first ring may also be used. Each ring collects light from the light source within a range of incident angles and reflects the light off an inner surface of the respective ring to the target image of the collector.
摘要:
This relates to a method and system for processing subscriptions and periodically-billed services. It shows different methods by the way of examples. It improves the e-commerce by increasing the traffic and amount of transactions between interested parties. One goal of the current business is to form partnerships with the largest online merchants, to integrate digital content subscriptions into their product offerings. It provides a method to receive these orders electronically from the merchant and pass them to the content provider to activate the customer's subscription.
摘要:
A method of processing a substrate is described. A coupling agent and a metal ion solution are applied to the substrate. An activating solution is applied to activate metal ions of the metal ion solution to create a metal film out of the ions. Atoms of the metal film are used to catalyze a metal of a base metal solution to form a metal layer. The metal layer can be used as a seed layer for electroplating purposes.
摘要:
A dose transfer standard detector measures radiation intensity and dose in a lithography tool. The lithography tool may be an Extreme Ultraviolet lithography (EUVL) tool. The dose transfer standard detector may transmit intensity and dose data to a computer, which analyzes the data. Based on the analyzed data, the lithography tool may be calibrated.
摘要:
An illumination system for an extreme ultraviolet (EUV) lithography system may include multiple sources of EUV light. The system may combine the light from the multiple sources when illuminating a mask.