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公开(公告)号:US20220334488A1
公开(公告)日:2022-10-20
申请号:US17858172
申请日:2022-07-06
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Brian J. Cardineau , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Alan J. Telecky
IPC: G03F7/16 , G03F7/004 , G03F7/20 , C23C14/08 , G03F7/38 , C23C16/455 , G03F7/40 , G03F7/32 , C23C16/40
Abstract: Organometallic precursors are described for the formation of high resolution lithography patterning coatings based on metal oxide hydroxide chemistry. The precursor compositions generally comprise ligands readily hydrolysable by water vapor or other OH source composition under modest conditions. The organometallic precursors generally comprise a radiation sensitive organo ligand to tin that can result in a coating that can be effective for high resolution patterning at relatively low radiation doses and is particularly useful for EUV patterning. The precursors compositions are readily processable under commercially suitable conditions. Solution phase processing with in situ hydrolysis or vapor based deposition can be used to form the coatings.
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32.
公开(公告)号:US20220291582A1
公开(公告)日:2022-09-15
申请号:US17705795
申请日:2022-03-28
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Michael K. Kocsis , Alan J. Telecky , Brian J. Cardineau
Abstract: Organometallic radiation resist compositions are described based on tin ions with alkyl ligands. Some of the compositions have branched alkyl ligands to provide for improved patterning contrast while maintaining a high degree of solution stability. Blends of compounds with distinct alkyl ligands can provide further improvement in the patterning. High resolution patterning with a half-pitch of no more than 25 nm can be achieved with a line width roughness of no more than about 4.5 nm. Synthesis techniques have been developed that allow for the formation of alkyl tin oxide hydroxide compositions with very low metal contamination.
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33.
公开(公告)号:US20210048745A1
公开(公告)日:2021-02-18
申请号:US17085024
申请日:2020-10-30
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Michael K. Kocsis , Alan J. Telecky , Brian J. Cardineau
Abstract: Organometallic radiation resist compositions are described based on tin ions with alkyl ligands. Some of the compositions have branched alkyl ligands to provide for improved patterning contrast while maintaining a high degree of solution stability. Blends of compounds with distinct alkyl ligands can provide further improvement in the patterning. High resolution patterning with a half-pitch of no more than 25 nm can be achieved with a line width roughness of no more than about 4.5 nm. Synthesis techniques have been developed that allow for the formation of alkyl tin oxide hydroxide compositions with very low metal contamination.
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公开(公告)号:US20200371439A1
公开(公告)日:2020-11-26
申请号:US16987120
申请日:2020-08-06
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Brian J. Cardineau , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Alan J. Telecky
Abstract: Organometallic precursors are described for the formation of high resolution lithography patterning coatings based on metal oxide hydroxide chemistry. The precursor compositions generally comprise ligands readily hydrolysable by water vapor or other OH source composition under modest conditions. The organometallic precursors generally comprise a radiation sensitive organo ligand to tin that can result in a coating that can be effective for high resolution patterning at relatively low radiation doses and is particularly useful for EUV patterning. The precursors compositions are readily processable under commercially suitable conditions. Solution phase processing with in situ hydrolysis or vapor based deposition can be used to form the coatings.
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35.
公开(公告)号:US20190315782A1
公开(公告)日:2019-10-17
申请号:US15950292
申请日:2018-04-11
Applicant: Inpria Corporation
Inventor: Joseph B. Edson , Thomas J. Lamkin , William Earley , Truman Wambach
IPC: C07F7/22
Abstract: A pure composition comprises a monoalkyltin trialkoxide compound represented by the chemical formula RSn(OR′)3 or a monoalkyl tin triamide compound represented by the chemical formula RSn(NR′2)3 and no more than 4 mole % dialkyltin compounds relative to the total tin amount, where R is a hydrocarbyl group with 1-31 carbon atoms, and wherein R′ is a hydrocarbyl group with 1-10 carbon atoms. Methods are described for the formation of the pure compositions. A solid composition comprises a monoalkyl triamido tin compound represented by the chemical formula RSn—(NR′COR″)3, where R is a hydrocarbyl group with 1-31 carbon atoms, and where R′ and R″ are independently a hydrocarbyl group with 1-10 carbon atoms. The compositions are suitable for the formation of resist compositions suitable for EUV patterning in which the compositions have a high EUV absorption.
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公开(公告)号:US20190137870A1
公开(公告)日:2019-05-09
申请号:US16238779
申请日:2019-01-03
Applicant: Inpria Corporation
Inventor: Stephen T. Meyers , Jeremy T. Anderson , Brian J. Cardineau , Joseph B. Edson , Kai Jiang , Douglas A. Keszler , Alan J. Telecky
Abstract: Organometallic precursors are described for the formation of high resolution lithography patterning coatings based on metal oxide hydroxide chemistry. The precursor compositions generally comprise ligands readily hydrolysable by water vapor or other OH source composition under modest conditions. The organometallic precursors generally comprise a radiation sensitive organo ligand to tin that can result in a coating that can be effective for high resolution patterning at relatively low radiation doses and is particularly useful for EUV patterning. The precursors compositions are readily processable under commercially suitable conditions. Solution phase processing with in situ hydrolysis or vapor based deposition can be used to form the coatings.
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