Processes and apparatus having a semiconductor fin
    31.
    发明授权
    Processes and apparatus having a semiconductor fin 有权
    具有半导体散热片的方法和装置

    公开(公告)号:US07880232B2

    公开(公告)日:2011-02-01

    申请号:US11591627

    申请日:2006-11-01

    IPC分类号: H01L29/78 H01L21/336

    摘要: A process may include first etching a trench isolation dielectric through a dielectric hard mask that abuts the sidewall of a fin semiconductor. The first etch can be carried out to expose at least a portion of the sidewall, causing the dielectric hard mask to recede to a greater degree in the lateral direction than the vertical direction. The process may include second etching the fin semiconductor to achieve a thinned semiconductor fin, which has receded beneath the shadow of the laterally receded hard mask. The thinned semiconductor fin may have a characteristic dimension that can exceed photolithography limits. Electronic devices may include the thinned semiconductor fin as part of a field effect transistor.

    摘要翻译: 工艺可以包括首先通过与散热片半导体的侧壁邻接的电介质硬掩模蚀刻沟槽隔离电介质。 可以执行第一蚀刻以暴露侧壁的至少一部分,使得电介质硬掩模在横向方向上比垂直方向更大程度地退回。 该方法可以包括第二蚀刻鳍式半导体以实现减薄的半导体鳍片,其已经在横向后退的硬掩模的阴影之下后退。 减薄的半导体鳍片可以具有可超过光刻极限的特征尺寸。 电子器件可以包括作为场效应晶体管的一部分的变薄的半导体鳍片。

    METHOD AND SYSTEM FOR SELECTING A SYNCHRONOUS OR ASYNCHRONOUS PROCESS TO DETERMINE A FORECAST
    33.
    发明申请
    METHOD AND SYSTEM FOR SELECTING A SYNCHRONOUS OR ASYNCHRONOUS PROCESS TO DETERMINE A FORECAST 有权
    选择同步或异步过程以确定预测的方法和系统

    公开(公告)号:US20080086358A1

    公开(公告)日:2008-04-10

    申请号:US11832526

    申请日:2007-08-01

    IPC分类号: G06F17/30

    摘要: In accordance with embodiments, there are provided mechanisms and methods for selecting a synchronous or asynchronous process to determine a forecast. These mechanisms and methods for such synchronous/asynchronous process selection can enable embodiments to determine forecasts for multiple users (e.g. with hierarchical relationships, etc.) over an arbitrary time interval. The ability of embodiments to provide forecasts that involve such a large amount of data in an effective way can enable forecasting that was otherwise infeasible due to resource limitations.

    摘要翻译: 根据实施例,提供了用于选择同步或异步过程以确定预测的机制和方法。 用于这种同步/异步过程选择的这些机制和方法可使得实施例能够在任意时间间隔上确定多个用户的预测(例如,具有层次关系等)。 实施例以有效的方式提供涉及这样大量数据的预测的能力可以使由于资源限制而导致的预测是不可行的。

    Oxygen plasma treatment for a nitride surface to reduce photo footing
    35.
    发明申请
    Oxygen plasma treatment for a nitride surface to reduce photo footing 审中-公开
    用于氮化物表面的氧等离子体处理以减少照片基础

    公开(公告)号:US20050208733A1

    公开(公告)日:2005-09-22

    申请号:US11126102

    申请日:2005-05-10

    摘要: The present invention includes a method for preventing distortion in semiconductor fabrication. The method comprises providing a substrate comprising a film comprising silicon nitride. The substrate is treated in a vacuum of about 3.0-6.5 Torr in an atmosphere comprising oxygen plasma wherein the oxygen plasma flow rate is at least about 300 sccm oxygen. A resist is applied to the treated substrate and the resist is patterned over the treated substrate.

    摘要翻译: 本发明包括一种用于防止半导体制造中的变形的方法。 该方法包括提供包含含氮化硅的膜的衬底。 在包含氧等离子体的气氛中,在约3.0-6.5乇的真空中处理衬底,其中氧等离子体流速为至少约300sccm的氧气。 将抗蚀剂施加到经处理的基底上,并且将抗蚀剂图案化在经处理的基底上。

    Methods of forming gated semiconductor assemblies
    36.
    发明授权
    Methods of forming gated semiconductor assemblies 失效
    形成门控半导体组件的方法

    公开(公告)号:US06635530B2

    公开(公告)日:2003-10-21

    申请号:US09057148

    申请日:1998-04-07

    IPC分类号: H01L21336

    摘要: The invention includes a method of forming a gated semiconductor assembly. A first transistor gate layer is formed over a substrate. A silicon nitride layer is formed over the first transistor gate layer. The silicon nitride layer comprises a first portion and a second portion elevationally displaced above the first portion. The first portion has less electrical resistance than the second portion and a different stoichiometric composition than the second portion. The first portion is physically against the second portion. A second transistor gate layer is formed over the silicon nitride layer.

    摘要翻译: 本发明包括一种形成门控半导体组件的方法。 在衬底上形成第一晶体管栅极层。 在第一晶体管栅极层上形成氮化硅层。 氮化硅层包括第一部分和在第一部分上方向上移位的第二部分。 第一部分具有比第二部分更少的电阻和不同于第二部分的化学计量组成。 第一部分物理地抵靠第二部分。 在氮化硅层上形成第二晶体管栅极层。

    Semiconductor wafer assemblies comprising silicon nitride, methods of forming silicon nitride, and methods of reducing stress on semiconductive wafers
    37.
    发明授权
    Semiconductor wafer assemblies comprising silicon nitride, methods of forming silicon nitride, and methods of reducing stress on semiconductive wafers 有权
    包括氮化硅的半导体晶片组件,形成氮化硅的方法以及减少半导体晶片上的应力的方法

    公开(公告)号:US06429151B1

    公开(公告)日:2002-08-06

    申请号:US09619468

    申请日:2000-07-19

    IPC分类号: H01L2131

    摘要: In one aspect, the invention includes a method of semiconductive wafer processing comprising forming a silicon nitride layer over a surface of a semiconductive wafer, the silicon nitride layer comprising at least two portions, one of said at least two portions generating a compressive force against the other of the at least two portions, and the other of the at least two portions generating a tensile force against the one of the at least two portions. In another aspect, the invention includes a method of reducing stress on semiconductive wafer, the semiconductive wafer having a pair of opposing surfaces and having more silicon nitride over one of the opposing surfaces than over the other of the opposing surfaces, the method comprising providing the silicon nitride over the one of the opposing surfaces to comprise a first portion, a second portion and a third portion, the first, second and third portions being elevationally displaced relative to one another, the second portion being between the first and third portions, the second portion having a greater stoichiometric amount of silicon than the first and third portions, the semiconductive wafer being subjected to less stress than if the silicon nitride over the one of the opposing surfaces had a constant stoichiometric amount of silicon throughout its thickness. In yet other aspects, the invention includes semiconductive wafer assemblies.

    摘要翻译: 在一个方面,本发明包括半导体晶片处理方法,包括在半导体晶片的表面上形成氮化硅层,所述氮化硅层包括至少两个部分,所述至少两个部分中的一个产生抵抗 所述至少两个部分中的另一个,并且所述至少两个部分中的另一部分产生相对于所述至少两个部分中的一个部分的张力。 在另一方面,本发明包括减少半导体晶片上的应力的方法,该半导体晶片具有一对相对的表面,并且在相对表面的一个之上具有比另一个相对表面更多的氮化硅,该方法包括提供 所述相对表面中的一个上的氮化硅包括第一部分,第二部分和第三部分,所述第一部分,第二部分和第三部分相对于彼此正向移位,所述第二部分位于第一部分和第三部分之间, 第二部分具有比第一和第三部分更大的化学计算量的硅,与相对表面上的一个相反的表面上的氮化硅在整个厚度上具有恒定的化学计量的硅时,半导体晶片受到的应力较小。 在另一方面,本发明包括半导体晶片组件。

    Method of forming a capacitor
    38.
    发明授权

    公开(公告)号:US5789304A

    公开(公告)日:1998-08-04

    申请号:US741832

    申请日:1996-10-31

    摘要: A semiconductor processing method of forming a stacked container capacitor includes, a) providing a pair of spaced conductive runners relative to a substrate, the conductive runners respectively having electrically insulative sidewall spacers and an electrically insulative cap, the caps having respective outer surfaces; b) providing a node between the runners to which electrical connection to a capacitor is to be made; c) providing an electrically conductive pillar in electrical connection with the node, the pillar projecting outwardly relative to the node between the runners and having a first outer surface positioned outwardly of both runner caps, the pillar completely filling the space between the pair of runners at the location where the pillar is located; d) providing an insulating dielectric layer outwardly of the caps and the conductive pillar; e) etching a container opening through the insulating dielectric layer to outwardly expose the conductive pillar first outer surface; f) etching the exposed conductive pillar to define a pillar second outer surface which is closer to the node than the pillar first outer surface and to deepen the container opening; g) providing an electrically conductive storage node container layer within the container opening over the second outer conductive pillar surface; h) providing a capacitor dielectric layer over the capacitor storage node layer; and i) providing an electrically conductive outer capacitor plate over the capacitor dielectric layer. Such a capacitor construction is also disclosed.

    Management Of Structured, Non-Structured, And Semi-Structured Data In A Multi-Tenant Environment
    39.
    发明申请
    Management Of Structured, Non-Structured, And Semi-Structured Data In A Multi-Tenant Environment 审中-公开
    多租户环境中结构化,非结构化和半结构化数据管理

    公开(公告)号:US20160350303A1

    公开(公告)日:2016-12-01

    申请号:US14722403

    申请日:2015-05-27

    IPC分类号: G06F17/30

    摘要: Disclosed is a network of systems that includes plural disparate storage systems that store user data, the disparate storage systems including NoSQL server databases that provide storage and retrieval of data modeled in forms besides tabular relations used in relational databases, and index storage system, a relational graph storage system and one or more data storage query platforms in communication with the plural disparate storage that have queries produced in a modeling language that abstracts application programmer functionality from network functionality.

    摘要翻译: 公开了一种系统网络,其包括存储用户数据的多个不同的存储系统,不同的存储系统包括NoSQL服务器数据库,其提供除了在关系数据库中使用的表格关系之外的形式的建模的数据的存储和检索,以及索引存储系统 图形存储系统和与多个不同存储器通信的一个或多个数据存储查询平台,其具有以建模语言生成的查询,其将应用程序编程器功能从网络功能抽象出来。

    Method and apparatus for profiling and identifying the source of a signal

    公开(公告)号:US09098458B1

    公开(公告)日:2015-08-04

    申请号:US13625431

    申请日:2012-09-24

    申请人: Mark Fischer

    发明人: Mark Fischer

    摘要: A method and apparatus for profiling and identifying the source of a signal is provided. A first method includes receiving a signal produced by a known source and creating a matrix of wavelet coefficients corresponding to a wavelet transform of the signal. The method also includes profiling the signal according to an output of a wavelet transform utilizing a particular base function and a particular scale set. A second method includes performing a wavelet transform having a particular profile on a received signal and determining the presence of a particular signal-producing entity as a function of wavelet coefficients exceeding a threshold. An apparatus includes a receiver configured to receive a signal and a processor coupled to the receiver, such that the processor is configured to perform wavelet transforms on the signals. A database is coupled to the processor and configured to store wavelet transform profiles.