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    Probe for combined signals
    33.
    发明申请
    Probe for combined signals 失效
    探测组合信号

    公开(公告)号：US20060214677A1

    公开(公告)日：2006-09-28

    申请号：US11442503

    申请日：2006-05-25

    Applicant: Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

    Inventor： Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

    IPC: G01R31/02

    CPC classification number: G01R1/06766 ,  G01R1/06738 ,  G01R1/06772

    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.

    Abstract translation: 直流电流和调制信号同时施加到被测器件（例如激光二极管）上的接触焊盘，探头通过传输调制信号通过阻抗匹配电阻器和直接传输来降低信号失真和功耗 电流超过阻抗匹配电阻的第二信号通路。

    Probe for combined signals
    35.
    发明授权
    Probe for combined signals 失效
    探测组合信号

    公开(公告)号：US06806724B2

    公开(公告)日：2004-10-19

    申请号：US10712579

    申请日：2003-11-12

    Applicant: Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

    Inventor： Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

    IPC: G01R3102

    CPC classification number: G01R1/06766 ,  G01R1/06738 ,  G01R1/06772

    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a wafer to test certain devices, such as a laser diode. A probe, probing system, and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a signal path that avoids the impedance matching resistor.

    Abstract translation: 直流电流和调制信号同时施加到晶片上的接触焊盘，以测试某些器件，例如激光二极管。 探头，探测系统和探测方法通过阻抗匹配电阻将调制信号传送到被测器件，并通过信号通道将直流电流传输到被测器件，从而降低信号失真和功耗 避免了阻抗匹配电阻。

    Wafer probe
    37.
    发明授权
    Wafer probe 有权
    晶圆探针

    公开(公告)号：US07688097B2

    公开(公告)日：2010-03-30

    申请号：US11796237

    申请日：2007-04-26

    Applicant: Leonard Hayden ,  John Martin ,  Mike Andrews

    Inventor： Leonard Hayden ,  John Martin ,  Mike Andrews

    IPC: G01R1/073 ,  H01L21/00

    CPC classification number: G01R1/06772 ,  G01R1/07342 ,  Y10T29/49121 ,  Y10T29/49147 ,  Y10T29/49204 ,  Y10T29/49208

    Abstract: The present invention relates to a probe tip assembly for testing of integrated circuits or other microelectronic devices. The probe tip assembly may include a plurality of independently flexible contact fingers extending from a support, each contact finger spaced apart from the other contact fingers, and each contact finger terminating in free space at an end distal from the support. A probe may be constructed by attaching the free ends of the contact fingers to electrical contacts on a circuit board and then removing the support from the contact fingers.

    Abstract translation: 本发明涉及一种用于测试集成电路或其他微电子器件的探针头组件。 探针针尖组件可以包括从支撑件延伸的多个独立地柔性的接触指状物，每个接触指状物与其它接触指状物间隔开，并且每个接触指状物在远离支撑物的一端处于自由空间中。 可以通过将接触指的自由端附接到电路板上的电触点，然后从接触指中移除支撑件来构造探针。

    Probe for combined signals
    39.
    发明授权
    Probe for combined signals 失效
    探测组合信号

    公开(公告)号：US07453276B2

    公开(公告)日：2008-11-18

    申请号：US11901626

    申请日：2007-09-18

    Applicant: Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

    Inventor： Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

    IPC: G01R31/02

    CPC classification number: G01R1/06766 ,  G01R1/06738 ,  G01R1/06772

    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.

    Abstract translation: 直流电流和调制信号同时施加到被测器件（例如激光二极管）上的接触焊盘，探头通过传输调制信号通过阻抗匹配电阻器和直接传输来降低信号失真和功耗 电流超过阻抗匹配电阻的第二信号通路。

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