公开(公告)号：US6069934A

公开(公告)日：2000-05-30

申请号：US56654

申请日：1998-04-07

Applicant: Boris Verman ,  Licai Jiang

Inventor： Boris Verman ,  Licai Jiang

IPC: G01N23/20 ,  G01N23/207

CPC classification number: G01N23/207 ,  G01N23/20016 ,  G01N23/20025

Abstract: An x-ray diffractometer system comprising an x-ray optic which directs x-rays, a sample placed into said directed x-rays, wherein said sample diffracts said directed x-rays, creating a diffraction pattern, a translation stage coupled to said sample for moving said sample within said directed x-rays, whereby the resolution, angular range, and intensity of said diffraction pattern may be adjusted, and an x-ray detector for registering said diffraction pattern.

Abstract translation: x射线衍射仪系统，其包括x射线光学器件，X射线光学器件将X射线，放置在所述定向x射线中的样品放置，其中所述样品衍射所述定向x射线，产生衍射图案，耦合到所述样品的平移台 用于在所述定向x射线内移动所述样品，由此可以调节所述衍射图案的分辨率，角度范围和强度，以及用于记录所述衍射图案的X射线检测器。

公开(公告)号：US6014423A

公开(公告)日：2000-01-11

申请号：US26391

申请日：1998-02-19

Applicant: George Gutman ,  Licai Jiang ,  Boris Verman

Inventor： George Gutman ,  Licai Jiang ,  Boris Verman

IPC: G21K1/06

CPC classification number: G21K1/062 ,  B82Y10/00 ,  G21K1/06 ,  G21K2201/061

Abstract: An x-ray reflecting system comprising a plurality of x-ray reflectors, wherein the x-ray reflectors are coupled together to form a Kirkpatrick-Baez side-by-side system of multiple corners and may include multi-layer or graded-d multi-layer Bragg x-ray reflective surfaces.

Abstract translation: 包括多个x射线反射器的x射线反射系统，其中所述x射线反射器耦合在一起以形成多角的Kirkpatrick-Baez并排系统，并且可以包括多层或多层 层布拉格X射线反射面。