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    AUTOMATIC ANALYSIS DEVICE
    38.
    发明申请
    AUTOMATIC ANALYSIS DEVICE 有权
    自动分析装置

    公开(公告)号：US20140241945A1

    公开(公告)日：2014-08-28

    申请号：US14347450

    申请日：2012-07-31

    申请人： Mitsuru Oonuma ,  Yoko Sato ,  Hajime Yamazaki ,  Akihito Wakui

    发明人： Mitsuru Oonuma ,  Yoko Sato ,  Hajime Yamazaki ,  Akihito Wakui

    IPC分类号： G01N35/10

    CPC分类号： G01N35/1002 ,  G01N21/51 ,  G01N35/025 ,  G01N2035/00306 ,  G01N2035/00316 ,  G01N2035/0441

    摘要： An automatic analysis device has a light scattering photometer incorporated therein, and improved accuracy resulting from reducing the influences from external light. The automatic analysis device includes a scattered light measurement unit disposed inside the main-body casing, and openable/closable protective covers to cover the top face of the main-body casing. A first protective cover at the center includes a light-shielding part to block external light. The protective covers include see-through parts enabling viewing of the inside. The light-shielding part is configured to cover an area of the reaction disk at least corresponding to the area above the scattered light measurement unit, thus reducing external light leaking into the scattered light measurement unit, and thus removing influences from external light on the scattered light measurement. The protective cover may have a divided structure.

    摘要翻译： 自动分析装置具有并入其中的光散射光度计，并且通过减少来自外部光的影响而提高了精度。 自动分析装置包括设置在主体外壳内的散射光测量单元和可打开/关闭的保护盖，以覆盖主体外壳的顶面。 中心处的第一保护盖包括遮光部分，以遮挡外部光线。 防护罩包括透视部件，可以观看内部。 所述遮光部被构造为至少覆盖所述反射盘的与所述散射光测量单元上方的区域对应的区域，从而减少外部光泄漏到所述散射光测量单元中，从而去除外部光对散射光的影响 光测量。 保护罩可以具有分开的结构。