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公开(公告)号：US20160209519A1
公开(公告)日：2016-07-21
申请号：US14972906
申请日：2015-12-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Young KIM , Jae-Chul PARK
IPC: G01T1/24
Abstract: A radiation detector includes: a radiation detecting module including a photoconductive layer containing at least one heavy metal; a voltage controller configured to detect current flowing through the photoconductive layer and control application of a voltage to the photoconductive layer based on the detected current; and a sealing part configured to seal the photoconductive layer and surround a portion of the radiation detecting module.
Abstract translation: 辐射检测器包括：辐射检测模块，包括含有至少一种重金属的光电导层; 电压控制器，被配置为检测流过光电导层的电流，并且基于检测到的电流控制对光电导层施加电压; 以及密封部分，其构造成密封光电导层并且围绕辐射检测模块的一部分。
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32.发明申请X-RAY DETECTING METHOD, PHOTOGRAPHING METHOD USING THE X-RAY DETECTING METHOD, AND X-RAY DETECTOR USING THE METHODS 有权X射线检测方法，使用X射线检测方法的摄影方法和使用该方法的X射线探测器公开(公告)号：US20150326802A1
公开(公告)日：2015-11-12
申请号：US14685006
申请日：2015-04-13
Applicant: Samsung Electronics Co., Ltd.
Inventor： Young KIM , Yongchul Kim , Jaechul Park , Kangho Lee
Abstract: Provided are methods of detecting X-rays, a photographing methods using the X-ray detecting method and/or an X-ray detector using the methods. For example, one method of detecting X-rays includes radiating a first X-ray, removing, by a first X-ray detection unit, a first electric charge generated by the radiated first X-ray, and outputting, by a second X-ray detection unit adjacent to the first X-ray detection unit, a voltage corresponding to the first X-ray.
Abstract translation: 提供了检测X射线的方法，使用X射线检测方法的拍摄方法和/或使用该方法的X射线检测器。 例如，检测X射线的一种方法包括照射第一X射线，由第一X射线检测单元除去由辐射的第一X射线产生的第一电荷，并且通过第二X射线 与第一X射线检测单元相邻的X射线检测单元，对应于第一X射线的电压。
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公开(公告)号：US20140210035A1
公开(公告)日：2014-07-31
申请号：US14017787
申请日：2013-09-04
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jae-chul PARK , Young KIM , Chae-hun LEE , Yong-woo JEON , Chang-jung KIM
IPC: H01L31/105
CPC classification number: H01L31/105 , G01T1/2018 , G01T1/208 , H01L27/1446 , H01L27/14658 , H01L31/103 , H01L31/107
Abstract: A silicon photomultiplier detector cell may include a photodiode region and a readout circuit region formed on a same substrate. The photodiode region may include a first semiconductor layer exposed on a surface of the silicon photomultiplier detector cell and doped with first type impurities; a second semiconductor layer doped with second type impurities; and/or a first epitaxial layer between the first semiconductor layer and the second semiconductor layer. The first epitaxial layer may contact the first semiconductor layer and the second semiconductor layer. The first epitaxial layer may be doped with the first type impurities at a concentration lower than a concentration of the first type impurities of the first semiconductor layer.
Abstract translation: 硅光电倍增管检测器单元可以包括形成在同一衬底上的光电二极管区域和读出电路区域。 光电二极管区域可以包括暴露在硅光电倍增管检测器单元的表面上并掺杂有第一类型杂质的第一半导体层; 掺杂有第二类型杂质的第二半导体层; 和/或在第一半导体层和第二半导体层之间的第一外延层。 第一外延层可以接触第一半导体层和第二半导体层。 第一外延层可以以低于第一半导体层的第一类型杂质的浓度的浓度掺杂第一类型的杂质。
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公开(公告)号：US20140119517A1
公开(公告)日：2014-05-01
申请号：US13904600
申请日：2013-05-29
Applicant: Samsung Electronics Co., Ltd.
Inventor： Chae-hun LEE , Jae-chul PARK , Young KIM , Ho Kyung KIM , Dae-kun YOON
IPC: G01T7/00
CPC classification number: G01T7/005
Abstract: A method of calibrating a first threshold voltage that is a reference of X-ray detection for each unit cell of a plurality of unit cells of an X-ray detector may comprise detecting an X-ray by using a plurality of second threshold voltages for each of a plurality of X-rays having spectra at different energy levels; determining a correspondence relationship between energies having a maximum intensity in the spectra of X-rays and third threshold voltages at which a maximum number of photons having a same energy intensity are detected; and/or calibrating the first threshold voltage based on the determined correspondence relationship.
Abstract translation: 校准作为X射线检测器的多个单位单元的每个单位单元的X射线检测的参考的第一阈值电压的方法可以包括通过使用多个第二阈值电压来检测X射线 具有不同能级的光谱的多个X射线; 确定在X射线的光谱中具有最大强度的能量与检测到具有相同能量强度的最大光子数的第三阈值电压之间的对应关系; 和/或基于确定的对应关系来校准第一阈值电压。
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Patent Agency Ranking
公开(公告)号：US20130256545A1
公开(公告)日：2013-10-03
申请号：US13853166
申请日：2013-03-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Young KIM , Jun-su LEE , Sun-il KIM , Jae-chul PARK , Dae-kun YOON , Sang-wook HAN
IPC: G01T1/24
CPC classification number: G01T1/247 , H01L27/14636 , H01L27/14676
Abstract: An X-ray detector may include a silicon substrate including a first area and a second area; a plurality of pixels in the first area configured to detect X-rays; a control pad in the second area configured to supply a common control signal to the plurality of pixels; and/or a power supply pad in the first area configured to supply a power supply voltage to groups of pixels grouped from among the plurality of pixels.
Abstract translation: X射线检测器可以包括包括第一区域和第二区域的硅衬底; 所述第一区域中的多个像素被配置为检测X射线; 所述第二区域中的控制焊盘被配置为向所述多个像素提供公共控制信号; 和/或第一区域中的电源焊盘，被配置为将电源电压提供给从多个像素中分组的像素组。
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公开(公告)号：US20240385491A1
公开(公告)日：2024-11-21
申请号：US18787388
申请日：2024-07-29
Applicant: SAMSUNG ELECTRONICS CO, LTD.
Inventor： Kanghee WON , Young KIM , Jungkwuen AN , Hongseok LEE
IPC: G02F1/29 , G02B27/00 , G02B30/00 , G02F1/1337 , G02F1/1343 , G02F1/137 , G03H1/00 , G03H1/22
Abstract: A beam deflector includes a first electrode layer including a plurality of line electrodes extending in a first direction and arranged parallel to each other in a second direction crossing the first direction; a second electrode layer separated from the first electrode layer by a predetermined distance to face the first electrode layer; and a deflection layer between the first electrode layer and the second electrode layer and having a plurality of optically anisotropic molecules controlled by an electric field formed between the first electrode layer and the second electrode layer. Each of the optically anisotropic molecules has an ellipse shape having a major axis and a minor axis, wherein the major axis is arranged to head for the first direction.
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公开(公告)号：US20220137479A1
公开(公告)日：2022-05-05
申请号：US17324489
申请日：2021-05-19
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kanghee WON , Young KIM , Jungkwuen AN , Hongseok LEE
Abstract: A beam deflector includes a first electrode layer including a plurality of line electrodes extending in a first direction and arranged parallel to each other in a second direction crossing the first direction; a second electrode layer separated from the first electrode layer by a predetermined distance to face the first electrode layer; and a deflection layer between the first electrode layer and the second electrode layer and having a plurality of optically anisotropic molecules controlled by an electric field formed between the first electrode layer and the second electrode layer. Each of the optically anisotropic molecules has an ellipse shape having a major axis and a minor axis, wherein the major axis is arranged to head for the first direction.
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公开(公告)号：US20170200423A1
公开(公告)日：2017-07-13
申请号：US15171587
申请日：2016-06-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Young KIM , Yunhee KIM , Hoon SONG
CPC classification number: G09G3/3433 , G02B27/2214 , G02F1/29 , G09G3/2003 , G09G3/36 , G09G2310/0235
Abstract: A light deflector includes a first light deflecting member disposed on a transparent substrate and has a refractive index that varies depending on a magnitude of an electric field applied thereto. The light deflector may adjust the refractive index by applying electric fields differently according to regions of the first light deflecting member or time divisions. The light deflector may have a smaller size than a light deflector including an optical device, and may easily adjust the refractive index.
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公开(公告)号：US20160116611A1
公开(公告)日：2016-04-28
申请号：US14744277
申请日：2015-06-19
Applicant: Samsung Electronics Co., Ltd.
Inventor： Young KIM , Jaechul PARK , Kangho LEE
IPC: G01T1/24
Abstract: A method and apparatus for detecting an X-ray, the apparatus includes a detector which comprises a pixel array in which a plurality of pixels for detecting an X-ray transmitted by a body to be examined are arranged in a matrix form, a read-out unit which reads out electrical signals corresponding to the detected X-ray from the pixel array, and a reset controller which controls the pixel array to be reset after the X ray is detected, by performing switching so that the plurality of pixels of the pixel array are commonly connected to the reset power source.
Abstract translation: 一种用于检测X射线的方法和装置，该装置包括检测器，该检测器包括像素阵列，其中用于检测由被检体发射的X射线的多个像素以矩阵形式布置， 从像素阵列读出与检测到的X射线相对应的电信号;以及复位控制器，其通过执行切换来控制在检测到X射线之后复位像素阵列，使得像素的多个像素 阵列通常连接到复位电源。
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