摘要:
An OR circuit generates a spare word line group selection signal based on output signals of address coincidence detection circuits and the OR circuit generates an upper/low-order selection signal. A spare word line selecting signal generation circuit generates a spare word line selection signal based on the upper/low-order selection signal and common word line selection signal and a word line driving circuit substitutes the spare word line or lines in a redundancy memory cell array in the unit of lines smaller than the number of word lines constructing one word line group in the memory cell array according to the spare word line group selection signal and spare word line selection signal.
摘要:
According to the present invention, a semiconductor storage device includes: a first memory cell array including: a first bit line; a first plate line; a first memory cell; a first sense amplifier; a first reference power line configured to supply first reference voltage; a first switching module configured to control a connection between the first reference power line and the first bit line; a second memory cell array including: a second bit line; a second plate line; a second memory cell; a second sense amplifier; a second reference power line configured to supply second reference voltage; a second switching module configured to control a connection between the second reference power line and the second bit line; a control module configured to generate the control signal so as to control a time difference between the first memory cell array and the second memory cell array in precharge operation.
摘要:
A memory includes a cell block including ferroelectric capacitors and cell transistors, the cell block being configured by unit cells formed by the ferroelectric capacitor and the cell transistor; a dummy block configured by having one end of dummy strings connected in common, the dummy string being formed by connecting in series dummy transistors; dummy word lines connected to gates of the dummy transistors; a dummy block selection transistor connected between the dummy block and a bit line; wherein in a data read operation, a dummy-word-line driver sets the dummy transistors to a conductive state, the number of the dummy transistors in the conductive state depends on the number of the cell transistors present between the unit cell to be read and the bit line, and the dummy transistors in a conductive state are conductive to the bit line.
摘要:
A power supply circuit has a constant voltage circuit, a first MOS transistor, a second MOS transistor, a third MOS transistor, a first voltage dividing circuit that outputs a first divided voltage obtained by dividing the voltage of the output terminal by a first voltage dividing ratio, and a first differential amplifier circuit which is fed with a reference voltage and the first divided voltage and has an output connected to a gate of the second MOS transistor. The first differential amplifier circuit outputs a signal to turn on the second MOS transistor when the first divided voltage is higher than the reference voltage, and the first differential amplifier circuit outputs a signal to turn off the second MOS transistor when the first divided voltage is lower than the reference voltage.
摘要:
A ferroelectric memory device includes a cell block, a bit line, and a plate line. The cell block includes a ferroelectric capacitor and a transistor switch. The bit line applies a voltage to one electrode of the ferroelectric capacitor. The plate line applies a voltage to the other electrode of the ferroelectric capacitor. In a read operation of data, a first voltage is applied to the plate line. In a write operation of data, a second voltage different from the first voltage is applied to the plate line, and a voltage which is higher or lower than the second voltage is applied to the bit line.
摘要:
An integrated circuit device comprises a memory cell block, a word line selecting circuit and a driving circuit. The memory cell block comprises memory cells connected in series. The memory cell comprises a cell transistor including a gate which is connected to a word line, and a ferroelectric capacitor connected to terminals of the cell transistor. The word line selecting circuit successively selects the word lines connected to the cell transistors in the memory cells in the memory cell block in response to address signals successively input from an outside of the device, during an active cycle. The driving circuit applies a given voltage between ends of a current path provided of the cell transistors in the memory cells in the memory cell block, during a time period for which the word lines connected to the cell transistors are successively selected by the word line selecting circuit.
摘要:
A ferroelectric memory device includes memory cells, a memory cell block, a sense amplifier, a precharge circuit, a bit line drive circuit, and a plate line drive circuit. Each of the memory cells has a cell transistor and a ferroelectric capacitor in between a source and drain of the cell transistor. The memory cell block includes the memory cells that are series connected between a bit line via a block select transistor and a plate line. The sense amplifier amplifies data read out from the memory cell, and generates one of a first potential and a second potential higher than the first potential in accordance with the read-out data. The precharge circuit precharges the bit line at a third potential that is higher than the first potential and lower than the second potential. The bit line drive circuit sets the bit line at a fourth potential.
摘要:
A semiconductor memory device includes a first cell group having serial-connected memory cells. The memory cell includes a ferroelectric capacitor and a transistor which are connected in parallel. A first bit line is selectively electrically connected to one end of the first cell group. A second bit line is selectively electrically connected to the other end of the first cell group. A first power supply connection circuit selectively electrically connects a power supply line having a first potential to the second bit line. A sense amplifier has a first terminal electrically connected to the first bit line, generates one of first and second potentials onto the first terminal according to data stored in the memory cell and generates the other one of the first and second potentials onto a second terminal thereof. A first bit line connection circuit selectively electrically connects the second terminal to the second bit line.
摘要:
A booster circuit includes a first booster unit having a first output terminal from which a boosted voltage is output. The first output terminal is connected to an external output terminal. A second booster unit has a second output terminal from which a boosted voltage is output. The second output terminal is connected to the external output terminal. A control circuit outputs a first control signal used to control the operation of the first booster unit and a second control signal used to control the operation of the second booster unit. Further, the control circuit controls the first and second control signals so that a transition between the operative state and the non-operative state of the first booster unit and a transition between the operative state and the non-operative state of the second booster unit will be made at different timings according to output voltage of the external output terminal.
摘要:
A semiconductor memory device includes a first cell group having serial-connected memory cells. The memory cell includes a ferroelectric capacitor and a transistor which are connected in parallel. A first bit line is selectively electrically connected to one end of the first cell group. A second bit line is selectively electrically connected to the other end of the first cell group. A first power supply connection circuit selectively electrically connects a power supply line having a first potential to the second bit line. A sense amplifier has a first terminal electrically connected to the first bit line, generates one of first and second potentials onto the first terminal according to data stored in the memory cell and generates the other one of the first and second potentials onto a second terminal thereof. A first bit line connection circuit selectively electrically connects the second terminal to the second bit line.