Methods and apparatus for microdielectrometry
    31.
    发明授权
    Methods and apparatus for microdielectrometry 失效
    微电解法的方法和装置

    公开(公告)号:US4423371A

    公开(公告)日:1983-12-27

    申请号:US299264

    申请日:1981-09-03

    CPC classification number: G01N33/442 G01N27/221 G01R27/02

    Abstract: An impedance measuring apparatus having a measuring transistor with its gate electrode adapted to form a two electrode, interdigitated capacitor with the material to be measured forming the dielectric, a second reference transistor connected in differential configuration to the measuring transistor so that their drain currents are constrained to be equal, a time-varying voltage generator connected to one electrode of the interdigitated capacitor and a gain-phase meter connected to the gate of the reference transistor.

    Abstract translation: 一种具有测量晶体管的阻抗测量装置,其栅电极适于与被测材料形成介质的两个电极,叉指电容器,以差分配置连接到测量晶体管的第二参考晶体管,使得它们的漏极电流受到约束 相等的是连接到交错电容器的一个电极的时变电压发生器和连接到参考晶体管的栅极的增益相位计。

    Charge-flow transistors
    32.
    发明授权
    Charge-flow transistors 失效
    电荷流量晶体管

    公开(公告)号:US4316140A

    公开(公告)日:1982-02-16

    申请号:US76037

    申请日:1979-09-17

    CPC classification number: H01L29/435 G01N27/4148

    Abstract: A charge-flow transistor having a source region and a drain region in a semiconductor substrate, a gate insulator and a gapped gate electrode with a gap material having some electrical conductance disposed in the gap thereof.

    Abstract translation: 具有半导体衬底中的源极区和漏极区的电荷流量晶体管,栅极绝缘体和间隙材料具有间隙材料的间隙栅电极设置在其间隙中。

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