公开(公告)号：US12265125B2

公开(公告)日：2025-04-01

申请号：US17345342

申请日：2021-06-11

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Saifee F. Jasdanwala

IPC: G01R31/28 ,  G01R13/02 ,  G01R31/317 ,  G01R31/319 ,  G06F18/20 ,  G06N20/00

Abstract: A system to classify signals includes an input to receive incoming waveform data; a memory, and one or more processors configured to execute code to cause the one or more processors to: generate a ramp sweep signal from the incoming waveform data, locate a data burst in the incoming waveform data using a burst detector, receive a signal from the burst detector to cause the memory to store cyclic loop image data in the form of the incoming waveform data as y-axis data and the ramp sweep signal as x-axis data, and employ a machine learning system to receive the cyclic loop image data and classify the data burst. A method of classifying signals includes generating a ramp sweep signal from incoming waveform data, locating a data burst in the incoming waveform data, storing cyclic loop image data for the data burst in the form of the incoming waveform data as Y-axis data and the ramp sweep signal as X-axis data, and using a machine learning system to receive the cyclic loop image and classify the data burst.

公开(公告)号：US20240168471A1

公开(公告)日：2024-05-23

申请号：US18514800

申请日：2023-11-20

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd ,  Sam J. Strickling

IPC: G05B23/02

CPC classification number: G05B23/0254 ,  G05B23/0216

Abstract: A test system includes a repository of component models containing characteristic parameters for each component model, one or more processors to receive a list of selected component models through a user interface to be tested as a combination, access the characteristic parameters for each selected component model, build a tensor image using the characteristic parameters, send the tensor image to one or more trained neural networks to predict interoperability of the combination, and receive a prediction about the combination. A method includes receiving a list of selected component models through a user interface to be tested as a combination, accessing characteristic parameters for the selected component models, building a tensor image for each combination of the selected component models, sending the tensor image to one or more trained neural networks to predict interoperability of the combination, and receiving a prediction about the combination.

公开(公告)号：US11923895B2

公开(公告)日：2024-03-05

申请号：US17701186

申请日：2022-03-22

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Evan Douglas Smith ,  Heike Tritschler

IPC: H04B10/077 ,  H04B10/40

CPC classification number: H04B10/0779 ,  H04B10/40

Abstract: A test and measurement system includes a test and measurement device, a connection to allow the test and measurement device to connect to an optical transceiver, and one or more processors, configured to execute code that causes the one or more processors to: set operating parameters for the optical transceiver to reference operating parameters; acquire a waveform from the optical transceiver; repeatedly execute the code to cause the one or more processors to set operating parameters and acquire a waveform, for each of a predetermined number of sets of reference operating parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted operating parameters; set the operating parameters for the optical transceiver to the predicted operating parameters; and test the optical transceiver using the predicted operating parameters.

公开(公告)号：US20240028002A1

公开(公告)日：2024-01-25

申请号：US18353844

申请日：2023-07-17

Applicant: Tektronix, Inc.

Inventor： Wenzheng Sun ,  Evan Douglas Smith ,  John J. Pickerd

IPC: G05B19/418

CPC classification number: G05B19/4183 ,  G05B19/41885

Abstract: A test and measurement system includes a test and measurement instrument configured to receive waveform data from a device under test (DUT) on a manufacturing line, a machine learning system connected to the test and measurement instrument, and one or more processors configured to execute code that causes the one or more processors to: collect optimal tuning parameter data sets from the DUT after the DUT is tuned on the manufacturing line, determine one or more parameter data sets from the optimal tuning parameter data, load the one or more parameter data sets into the DUT, collect waveform data from the DUT for the one or more parameter data sets as training data sets, train the machine learning system using the training data sets, and use the machine learning system after training to produce an output related to the DUT.

公开(公告)号：US20230314498A1

公开(公告)日：2023-10-05

申请号：US18126342

申请日：2023-03-24

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd

IPC: G01R31/28 ,  G01R31/319 ,  G01R31/3183

CPC classification number: G01R31/2834 ,  G01R31/31908 ,  G01R31/318307

Abstract: A test system has ovens configured to hold devices under test (DUTs), DUT switches, each connected to the DUTs in an oven, splitters, each splitter connected to a DUT switch, an instrument switch connected to one output of each splitter, the other output of each splitter connected to a test instrument, and one or more processors to control the instrument switch to select one of the DUT switches connected to an oven, control the selected DUT switch to connect each DUT in the oven to a channel of the test and measurement instrument, use machine learning to tune the DUT to a set of parameters until the DUT passes or fails, repeat the connecting, tuning, and testing of each DUT until all DUTs in an oven have been tested, and repeat the selection and control of the DUT switches until each DUT in each oven has been tuned and tested.

公开(公告)号：US20230050162A1

公开(公告)日：2023-02-16

申请号：US17876817

申请日：2022-07-29

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G06F11/273 ,  G06F11/267

Abstract: A test and measurement instrument has an input configured to receive a signal from a device under test, a memory, a user interface to allow the user to input settings for the test and measurement instrument, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to: acquire a waveform representing the signal received from the device under test; generate one or more tensor arrays based on the waveform; apply machine learning to the one or more tensor arrays to produce equalizer tap values; and apply equalization to the waveform using the equalizer tap values to produce an equalized waveform; and perform a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test. A method of testing a device under test includes acquiring a waveform representing a signal received from the device under test, generating one or more tensor arrays based on the waveform, applying machine learning to the one or more tensor arrays to produce equalizer tap values, applying the equalizer taps values to the waveform to produce an equalized waveform, performing a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test.

公开(公告)号：US20230019734A1

公开(公告)日：2023-01-19

申请号：US17862293

申请日：2022-07-11

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Justin E. Patterson

IPC: G01R13/02 ,  G06T13/00

Abstract: A test and measurement instrument has a user interface configured to allow a user to provide one or more user inputs, a display to display results to the user, a memory, one or more processors configured to execute code to cause the one or more processors to receive a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recover a clock signal from the waveform array, generate a waveform image for each waveform, render the waveform images into video frames to produce an image array of the video frames, select at least some of the video frames to form a video sequence, and play the video sequence on a display. A method of animating waveform data includes receiving a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recovering a clock signal from the waveforms, generating a waveform image from each of the waveforms, rendering the waveform images into video frames to produce an image array of the video frames, selecting at least some of the video frames to play as a video sequence, and playing the video sequence on a display.

公开(公告)号：US20220390515A1

公开(公告)日：2022-12-08

申请号：US17831181

申请日：2022-06-02

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Mark Anderson Smith ,  Kan Tan ,  Evan Douglas Smith ,  Justin E. Patterson ,  Heike Tritschler

IPC: G01R31/3183 ,  G01R31/317

Abstract: A test and measurement system includes a machine learning system configured to communicate with a test automation system, a user interface configured to allow a user to provide one or more user inputs and to provide results to the user, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive one or more user inputs through the user interface, the one or more user inputs at least identifying a selected machine learning system configuration to be used to configure the machine learning system, receive a waveform created by operation of a device under test, apply the configured machine learning system to analyze the waveform, and provide an output of predicted metadata about the waveform.

公开(公告)号：US20220373598A1

公开(公告)日：2022-11-24

申请号：US17747954

申请日：2022-05-18

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G01R31/3183 ,  G01R31/319 ,  G01R31/28

Abstract: A test and measurement system includes a test and measurement device configured to receive a signal from a device under test, and one or more processors configured to execute code that causes the one or more processors to generate a waveform from the signal, apply an equalizer to the waveform, receive an input identifying one or more measurements to be made on the waveform, select a number of unit intervals (UIs) for a known data pattern, scan the waveform for the known data patterns having a length of the number of UIs, identify the known data patterns as short pattern waveforms, apply a machine learning system to the short pattern waveforms to obtain a value for the one or more measurements, and provide the values of the one or more measurements for the waveform. A method includes receiving a signal from a device under test, generating a waveform from the signal, applying an equalizer to the waveform, receiving an input identifying one or more measurements to be made on the waveform, selecting a number of unit intervals (UIs), scanning the waveform to identify short pattern waveforms having a length equal to the number of UIs, applying a machine learning system to the short pattern waveforms to obtain a value for the one or more measurements, and providing the values of the one or more measurements for the waveform from the machine learning system.

公开(公告)号：US20220334180A1

公开(公告)日：2022-10-20

申请号：US17724393

申请日：2022-04-19

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Heike Tritschler ,  Evan Douglas Smith ,  Williams Fabricio Flores Yepez

IPC: G01R31/317 ,  G01R31/319 ,  G06N20/00

Abstract: A test and measurement system includes a clock recovery circuit configured to receive a signal from a device under test and to produce a pattern trigger signal, a flash array digitizer having an array of counters having rows and columns configured to store a waveform image representing the signal received from the device under test, a row selection circuit configured to select a row in the array of counters, and a ring counter circuit configured to receive a clock signal, select a column in the array of counters, produce end of row signals, and produce a fill complete signal upon all of the columns having been swept, the fill complete signal indicating completion of the waveform image, an equivalent time sweep logic circuit configured to receive the pattern trigger signal and the end of row signals from the ring counter and to produce the clock signal with a delay to increment a clock delay to the ring counter until the fill complete signal is received, and a machine learning system configured to receive the waveform image and provide operating parameters for the device under test. A test and measurement system includes a flash array digitizer having an array of counters having rows and columns configured to store a waveform image representing a signal received from a device under test, a row selection circuit configured to select a row in the array of counters, a column selection circuit configured to select a column in the array of counters, a sample clock connected to the row selection circuit and the column selection circuit, and a machine learning system configured to receive the waveform image from the flash array digitizer and provide operating parameters for the device under test.