摘要:
A Time-Of-Flight mass spectrometer is configured with a pulsing region and electronic controls that generate a potential well for ions in the pulsing region, due to the repelling effect of a high-frequency electric field that is created in the space immediately proximate to a surface, and an additional static electric field that accelerates ions toward the surface. Ions can be constrained and accumulated over time in the potential well prior to acceleration into the Time-Of-Flight tube for mass analysis. Ions can also be directed to collide with the surface with high energy to cause Surface Induced Dissociation (SID) fragmentation, or with low energy to effect collisional cooling, hence, better spatial focusing, prior to mass analysis. The apparatus and method described in the invention result in refined control of ion fragmentation energy and improved Time-Of-Flight mass analysis performance.
摘要:
The invention provides a mass spectrometric method for analyzing a sample in a solution, including the steps of directing a flow of a solution containing sample compounds to be analyzed towards a supersonic nozzle having an input end and an output end; vaporizing the solution and sample prior to its expansion from the output end of said supersonic nozzle; allowing expansion of the vaporized sample and solution from said supersonic nozzle into a vacuum system, forming a supersonic molecular beam with vibrationally cold sample molecules; ionizing the vaporized sample compounds with electrons while contained as vibrationally cold molecules in said supersonic molecular beam; mass analyzing the ions formed from said sample compounds; detecting said ions formed from said sample compounds after mass analysis, and processing the data obtained from the resulting mass spectral information, for identifying and/or quantifying the chemical content of said sample. The invention also provides apparatus for analyzing a sample in a solution.
摘要:
A mass spectrometer including at least one mass analyzer into which an ion beam to be analyzed is projected having a collision surface means in-line with the ion beam to form surface collision products which are directed into the in-line mass analyzer.