THINNER COMPOSITION
    41.
    发明申请
    THINNER COMPOSITION 审中-公开

    公开(公告)号:US20200071640A1

    公开(公告)日:2020-03-05

    申请号:US16555183

    申请日:2019-08-29

    Abstract: A thinner composition is capable of reducing the amount of photoresist used in a reducing resist consumption (RRC) coating process, an edge bead removed (EBR) process or the like, and removing unnecessary photoresist on an edge portion or a backside portion of the wafer. The thinner composition includes C1-C10 alkyl C1-C10 alkoxy propionate, propylene glycol C1-C10 alkyl ether, and propylene glycol C1-C10 alkyl ether acetate.

    ETCHANT COMPOSITION
    44.
    发明申请
    ETCHANT COMPOSITION 审中-公开
    ETCHANT组合物

    公开(公告)号:US20160053382A1

    公开(公告)日:2016-02-25

    申请号:US14709110

    申请日:2015-05-11

    Abstract: An etchant composition is disclosed which includes hydrogen peroxide, an etch inhibitor, a chelating agent, an etch additive, an oxide semiconductor protective agent, and a pH regulator. The oxide semiconductor protective agent is included in the etchant composition by about 0.1˜3.0 wt % based on the total weight of the etchant composition. Such an etchant composition according to the present disclosure does not include any fluoride base compound and has a high pH value of about 3.5˜6. As such, the etchant composition allows an oxide semiconductor to not be etched in an etch process of copper and a molybdenum alloy. Therefore, the etchant composition can minimize faults that can be easily generated during the etching process.

    Abstract translation: 公开了一种蚀刻剂组合物,其包括过氧化氢,蚀刻抑制剂,螯合剂,蚀刻添加剂,氧化物半导体保护剂和pH调节剂。 基于蚀刻剂组合物的总重量,氧化物半导体保护剂在蚀刻剂组合物中包含约0.1〜3.0重量%。 根据本公开的这种蚀刻剂组合物不包括任何氟化物碱性化合物,并且具有约3.5〜6的高pH值。 因此,蚀刻剂组合物允许氧化物半导体在铜和钼合金的蚀刻工艺中不被蚀刻。 因此,蚀刻剂组合物可以最小化在蚀刻过程中容易产生的故障。

Patent Agency Ranking