公开(公告)号：US20180283984A1

公开(公告)日：2018-10-04

申请号：US15947882

申请日：2018-04-09

Applicant: APPLE INC.

Inventor： Denis G. Chen ,  Brian S. Medower ,  Chin Han Lin

IPC: G01M11/02 ,  G01J3/02

Abstract: Optical apparatus includes a primary radiation source, which emits first optical radiation along a first optical axis. A DOE includes at least an entrance surface, upon which the first optical radiation from the primary radiation source is incident, and an exit surface, through which one or more primary diffraction orders of the first optical radiation are emitted from the DOE. At least one secondary radiation source is configured to direct second optical radiation to impinge on the DOE along a second optical axis, which is non-parallel to the first optical axis, causing at least a part of the second optical radiation to be diffracted by the DOE such that one or more secondary diffraction orders of the second optical radiation are emitted through the entrance face of the DOE. At least one detector is configured to sense at least one of the secondary diffraction orders of the second optical radiation.

公开(公告)号：US20180084241A1

公开(公告)日：2018-03-22

申请号：US15597166

申请日：2017-05-17

Applicant: APPLE INC.

Inventor： Denis G. Chen ,  Meng Zhang

IPC: H04N13/02 ,  G02B27/42 ,  G02B27/10 ,  G02B27/30 ,  G02B27/64 ,  G02B26/08 ,  G02B26/10

CPC classification number: H04N13/271 ,  G02B26/0875 ,  G02B26/10 ,  G02B27/106 ,  G02B27/1086 ,  G02B27/30 ,  G02B27/4233 ,  G02B27/646 ,  H04N13/218 ,  H04N13/254

Abstract: A method for projection includes projecting a pattern toward a target by directing optical radiation, which is collimated along an optical axis by projection optics, through a diffractive optical element (DOE). An optical signal that is indicative of a shift of the projected pattern is detected. An actuator is driven to translate the projection lens in a direction transverse to the optical axis responsively to the detected optical signal.

公开(公告)号：US20180080758A1

公开(公告)日：2018-03-22

申请号：US15674260

申请日：2017-08-10

Applicant: Apple Inc.

Inventor： Denis G. Chen ,  Jui Hua Liu ,  Xingxing Cai

IPC: G01B11/14 ,  G01D5/20

CPC classification number: G01B11/14 ,  G01B11/002 ,  G01D5/142 ,  G01D5/2013 ,  G01D5/30

Abstract: Systems and techniques are described for measuring displacement of a mass by using an array of beams for scanning a binary intensity pattern disposed on a surface of the mass. Further, systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass. Furthermore, systems and techniques are described for measuring displacement of a mass by illuminating an intensity pattern disposed on a surface of the mass with an array of beams and monitoring intensity of each of the beams that is redirected by the intensity pattern.