摘要:
A system for providing an optimal preplacement of cells on a bounded surface of a semiconductor chip is disclosed herein. A percentage of the cells have predetermined interconnections with other cells. The system initially locates the cells on said surface, then computes coordinates for interconnected cells, determines a weight associated with each cell, and calculates a new cell coordinate for each cell based on the coordinates and weights from said determining step.
摘要:
A system for optimally locating cells on the surface of an integrated circuit chip is presented herein. The system comprises constructing a plurality of neighborhoods containing elements positionally related to one another; initially evaluating the lowest level of region hierarchy; iteratively developing a logical one-dimensional preplacement of elements on said surface; performing an affinity driven discrete preplacement optimization; evaluating whether a highest level of regional hierarchy has been attained; iteratively performing a dispersion driven spring system to levelize cell density and an unconstrained sinusoidal optimization; executing a density levelizing procedure; iteratively optimizing while controlling element densities; removing element overlap; iteratively optimizing for desired spacing between elements, adjusting element spacing, and permuting elements; locating elements on grid lines; and iteratively performing a functional sieve crystallization.
摘要:
A system for computing an affinity for relocating a cell on a surface of a semiconductor chip is disclosed herein. The cell is located within a region and belongs to a net of cells. The system initially computes a weight associated with all cells in the net. The sytem then sums the weights of all cells in the net containing the cell for all cells located inside the region and at positions greater than and less than edges of the region and computes the affinity for moving the cell to points on the surface greater than, equal to, and less than the current position of the cell based on the weight sums from said summing function. The computing function further comprises combining the affinities determined based on weight sums with other affinities. The summing function further comprises computing a relationship between the amount of rows and columns of regions on the semiconductor chip surface, and the affinity computation function comprises combining the relationship with the weight sums.
摘要:
A system for optimizing placement of a plurality of cells located on a surface of a semiconductor chip divided into regions by grid lines is disclosed herein. The system first increases the size associated with each cell by a fixed amount. The system then performs various density equalization routines to all cells, and locates cells having a size greater than a predetermined quantity and fixes those cells. Finally, the system executes a plurality of optimal cell movement routines to crystallize cell placement.
摘要:
Several inventions are disclosed. A cell architecture using hexagonal shaped cells is disclosed. The architecture is not limited to hexagonal shaped cells. Cells may be defined by clusters of two or more hexagons, by triangles, by parallelograms, and by other polygons enabling a variety of cell shapes to be accommodated. Polydirectional non-orthogonal three layer metal routing is disclosed. The architecture may be combined with the tri-directional routing for a particularly advantageous design. In the tri-directional routing arraingement, electrical conductors for interconnecting terminals of microelectronic cells of an integrated circuit preferrably extend in three directions that are angularly displaced from each other by 60.degree.. The conductors that extend in the three directions are preferrably formed in three different layers. A method of minimizing wire length in a semiconductor device is disclosed. A method of minimizing intermetal capacitance in a semiconductor device is disclosed. A novel device called a "tri-ister" is disclosed. Triangular devices are disclosed, including triangular NAND gates, triangular AND gates, and triangular OR gates. A triangular op amp and triode are disclosed. A triangular sense amplifier is disclosed. A DRAM memory array and an SRAM memory array, based upon triangular or parallelogram shaped cells, are disclosed, including a method of interconnecting such arrays. A programmable variable drive transistor is disclosed. CAD algorithms and methods are disclosed for designing and making semiconductor devices, which are particularly applicable to the disclosed architecture and tri-directional three metal layer routing.
摘要:
The present invention is a configurable binary BCH encoder having a variable number of errors. The encoder may implement a universal multipole block which may be configured for receiving an error number input, which may include a maximum error number limit for the encoder, and for calculating a plurality of error coefficients based on the error number input. The encoder may be further configured for receiving a plurality of information bits of an information word. The encoder may be further configured for transmitting/outputting a first (ex.—unmodified) subset of the information bits as an encoder output. The encoder may be further configured for calculating a plurality of parity bits based on a second subset of the information bits and the error coefficients. The encoder may be further configured for transmitting/outputting the calculated parity bits as part of the encoder output.
摘要:
An apparatus comprising a processor and an internal memory. The processor may be configured to test an external memory using (i) a netlist and (ii) a testing program. The internal memory may be configured to store the testing program. The testing program may be downloadable to the internal memory independently from the storing of the netlist.
摘要:
A memory testing system for testing a plurality of memory locations in an electronic memory device is provided. The system includes a programmable memory device integrated into the electronic memory device capable of receiving and storing a compiled memory testing program. A processor is in communication with the programmable memory device to read and execute instructions from the compiled testing program stored in the programmable memory device and a command interpreter is configured to receive data from the processor related to commands to be executed during memory testing.
摘要:
The present invention is directed to a FIFO memory with single port memory modules that may allow simultaneous read and write operations. In an exemplary aspect of the present invention, a method for employing a FIFO memory with single port memory modules of half capacity to perform simultaneous read and write operations includes the following steps: (a) providing a first single port memory module for an even address of a read or write operation; (b) providing a second single port memory module for an odd address of a read or write operation; (c) alternating even address and odd address; and (d) when both a read request and a write request reach either the first single port memory module or the second single port memory module at a clock cycle, fulfilling the read request at the current clock cycle and fulfilling the write request at the next clock cycle.
摘要:
A decoder for access data stored in n memories comprises a function matrix containing addresses of the memory locations at unique coordinates. A decomposer sorts addresses from coordinate locations of first and second m×n matrices, such that each row contains no more than one address from the same memory. Positional apparatus stores entries in third and fourth m×n matrices identifying coordinates of addresses in the function matrix such that each entry in the third matrix is at coordinates that matches corresponding coordinates in the first matrix, and each entry in the fourth matrix is at coordinates that matches corresponding coordinates in the second matrix. The decoder is responsive to entries in the matrices for accessing data in parallel from the memories.