公开(公告)号：US07786746B2

公开(公告)日：2010-08-31

申请号：US11847712

申请日：2007-08-30

申请人： Makoto Takamiya ,  Masayuki Mizuno

发明人： Makoto Takamiya ,  Masayuki Mizuno

IPC分类号： G01R31/02

CPC分类号： G01R31/31709

摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

摘要翻译： 更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。 更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路 电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

公开(公告)号：US07616878B2

公开(公告)日：2009-11-10

申请号：US11218154

申请日：2005-09-01

申请人： Makoto Takamiya

发明人： Makoto Takamiya

IPC分类号： G02B7/28

CPC分类号： G03B13/36 ,  G02B7/34 ,  G02B7/36

摘要： An optical apparatus is disclosed, which is suitable for the focus detection by the TTL phase difference detection method, and capable of producing a pair of phase difference images for focus detection with high accuracy. The optical apparatus comprises a deflection optical element which deflects at least one of first and second luminous fluxes with respect to the other. The first and second luminous fluxes are transmitted respectively through first and second areas of an exit pupil of an optical system, and then reach a photoelectric conversion element. The deflection direction of the luminous flux is different from the division direction of the first and second areas.

摘要翻译： 公开了一种适用于通过TTL相位差检测方法进行焦点检测的光学装置，并能够以高精度产生用于焦点检测的一对相位差图像。 光学装置包括偏转光学元件，该偏转光学元件使第一和第二光束中的至少一个相对于另一光束偏转。 第一和第二光束分别通过光学系统的出射光瞳的第一和第二区域传输，然后到达光电转换元件。 光束的偏转方向与第一和第二区域的分割方向不同。

公开(公告)号：US20090250777A1

公开(公告)日：2009-10-08

申请号：US12413141

申请日：2009-03-27

申请人： Makoto Takamiya

发明人： Makoto Takamiya

IPC分类号： H01L31/0232

CPC分类号： H01L27/14625 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14629

摘要： In an upper waveguide structure (14), a width (W1) of the upper portion is larger than a width (W2) of the lower portion. The upper waveguide structure (14) has a side face (14a) which obliquely extends from an edge portion (14b) of the upper face to an edge portion (14c) of the lower face to come close to a normal (PA1) passing through the center of a light receiving surface (2a) of a photoelectric conversion unit (2). A gap (11) in the air gap structure (AG1) is formed by etching a first insulating layer (4a l: see FIG. 4A) serving as a first interlayer dielectric film (4a) so as to expose not an inner region (2a1) but an outer region (2a2) on the light receiving surface (2a) of the photoelectric conversion unit (2).

摘要翻译： 在上部波导结构（14）中，上部的宽度（W1）大于下部的宽度（W2）。 上波导结构（14）具有从上表面的边缘部分（14b）向下表面的边缘部分（14c）倾斜延伸的侧面（14a），以接近正常（PA1）穿过 光电转换单元（2）的光接收表面（2a）的中心。 气隙结构（AG1）中的间隙（11）通过蚀刻用作第一层间电介质膜（4a）的第一绝缘层（4a1：参见图4A）而形成，以便不暴露内部区域（2a1 ），而在光电转换单元（2）的光接收表面（2a）上的外部区域（2a2）。

公开(公告)号：US20090128134A1

公开(公告)日：2009-05-21

申请号：US12358652

申请日：2009-01-23

申请人： Makoto Takamiya ,  Masayuki Mizuno

发明人： Makoto Takamiya ,  Masayuki Mizuno

IPC分类号： G01R31/00

CPC分类号： G01R31/31709

摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

摘要翻译： 更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。 更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路 电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

公开(公告)号：US20060120710A1

公开(公告)日：2006-06-08

申请号：US11244509

申请日：2005-10-05

申请人： Akihiko Nagano ,  Makoto Takamiya ,  Koichi Washisu

发明人： Akihiko Nagano ,  Makoto Takamiya ,  Koichi Washisu

IPC分类号： G03B13/00

CPC分类号： G02B5/1833 ,  G02B5/3016 ,  G02B7/343 ,  G03B13/06 ,  G03B13/36 ,  G03B19/12

摘要： There is provided an optical apparatus that provides quick and precise TTL phase difference detection and pupil slicing focus detection. An optical apparatus includes a first optical element for splitting a first polarized light component contained in light that passes an exit pupil of a first optical system and directs to a photoelectric conversion element so that the first polarized light component direct to different light-receiving areas on the photoelectric conversion element. The optical apparatus may further include a second optical element for separating a second polarized light component contained in the light from said first optical element, from the first polarized light component.

公开(公告)号：US08742838B2

公开(公告)日：2014-06-03

申请号：US13123811

申请日：2009-04-17

申请人： Ken Takeuchi ,  Tadashi Yasufuku ,  Koichi Ishida ,  Makoto Takamiya ,  Takayasu Sakurai

发明人： Ken Takeuchi ,  Tadashi Yasufuku ,  Koichi Ishida ,  Makoto Takamiya ,  Takayasu Sakurai

IPC分类号： H01L25/00 ,  G05F1/46 ,  H02M3/145 ,  G11C16/30 ,  G11C5/14

CPC分类号： G11C5/04 ,  G11C5/02 ,  G11C5/145 ,  G11C11/005 ,  G11C16/12 ,  G11C16/30 ,  H01L25/0657 ,  H01L25/16 ,  H01L25/18 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2924/0002 ,  H01L2924/19106 ,  H01L2924/00

摘要： The interposer 30 is disposed on an upper surface of the stacked structure 24 formed by stacking a plurality of a DRAM chip 20 and a plurality of a flash memory chip 22. Thus down-size of an entire device is accomplished. A boost converter having an inductor is used as a voltage boost circuit 40. Thus down-size of the entire device is accomplished.

摘要翻译： 插入器30设置在通过堆叠多个DRAM芯片20和多个闪存芯片22而形成的堆叠结构24的上表面上。因此，可以实现整个装置的尺寸缩小。 具有电感器的升压转换器被用作升压电路40.因此，可以实现整个装置的小型化。

公开(公告)号：US08576329B2

公开(公告)日：2013-11-05

申请号：US13126839

申请日：2009-11-09

申请人： Makoto Takamiya

发明人： Makoto Takamiya

IPC分类号： H04N5/225

CPC分类号： H04N5/23212 ,  G02B7/34 ,  G02B7/36 ,  G03B13/36 ,  H01L27/14623

摘要： A focus detection apparatus includes an image sensor including pixels for focus detection for receiving a pair of respective light beams transmitted through different pupil areas of a photographing lens to output a pair of signals; an acquisition unit for acquiring exit window information on the photographing lens; an arithmetic circuit for calculating a tilt for detection area in the detecting position, depending on an image height for a detecting position in which a focus state is detected and on the exit window information; and a calculation unit for calculating the shape of the detection area depending on the calculated tilt, in which the defocus amount is detected on the basis of a phase difference between the pair of signals obtained from pixels for focus detection included in the calculated detection area.

摘要翻译： 焦点检测装置包括图像传感器，其包括用于焦点检测的像素，用于接收通过拍摄镜头的不同瞳孔区域传输的一对相应的光束，以输出一对信号; 获取单元，用于获取关于拍摄镜头的出口窗口信息; 算术电路，用于根据检测到焦点状态的检测位置的图像高度和出射窗口信息计算检测位置中检测区域的倾斜度; 以及计算单元，用于根据从计算出的检测区域中包含的用于焦点检测的像素获得的一对信号之间的相位差来检测散焦量，根据计算出的倾斜来计算检测区域的形状。

公开(公告)号：US20110273602A1

公开(公告)日：2011-11-10

申请号：US13144840

申请日：2010-02-23

申请人： Makoto Takamiya ,  Akihiko Nagano

发明人： Makoto Takamiya ,  Akihiko Nagano

IPC分类号： H04N5/335

CPC分类号： H04N5/23212 ,  H04N5/3696 ,  H04N5/37457 ,  H04N2101/00

摘要： A camera 200 comprises an image pickup element 107 which has imaging pixels performing a photoelectric conversion of an object image formed by a light beam emitted from an image pickup optical system and focus detection pixels performing a photoelectric conversion of two images formed by two divided light beams, a focus detector which obtains first and second pairs of image signals having optical base lengths different from each other from the focus detection pixels, a selector which selects one of the first and second pairs of image signals based on at least one correlation amount of the first and second pairs of image signals, and a calculator which calculates a defocus amount based on the selected pair of image signals.

摘要翻译： 相机200包括图像拾取元件107，其具有执行由从摄像光学系统发射的光束形成的物体图像的光电转换的成像像素和执行由两个分割光束形成的两个图像的光电转换的焦点检测像素 获取具有与焦点检测像素彼此不同的光学基准长度的第一和第二对图像信号的聚焦检测器，选择器，其基于至少一个相关量来选择第一和第二对图像信号中的一个; 第一和第二对图像信号，以及基于所选择的一对图像信号计算散焦量的计算器。

公开(公告)号：US20070103754A1

公开(公告)日：2007-05-10

申请号：US11555365

申请日：2006-11-01

申请人： Makoto Takamiya ,  Ichiro Onuki

发明人： Makoto Takamiya ,  Ichiro Onuki

IPC分类号： G02B26/08

CPC分类号： G02B7/346

摘要： An optical apparatus is disclosed which can reliably form AF images and split the AF images to provide excellent focus detection performance in the phase difference detection method. The optical apparatus comprises a light deflection unit including a deflection optical member. The deflection optical member deflects at least one of a first luminous flux and a second luminous flux relative to the other, the first and second luminous fluxes passing through a first area and a second area in the exit pupil of an optical system, respectively, and forming images on a photoelectrical conversion element. The light deflection unit comprises a light-limiting member which limits an image-forming area where at least one of the first and second luminous fluxes emerging from the light deflection unit forms the image on the photoelectrical conversion element.

摘要翻译： 公开了一种能够可靠地形成AF图像并分割AF图像以在相位差检测方法中提供优异的聚焦检测性能的光学装置。 光学装置包括具有偏转光学构件的光偏转单元。 偏转光学构件相对于彼此偏转第一光束和第二光束中的至少一个，第一和第二光束分别穿过光学系统的出射光瞳中的第一区域和第二区域，以及 在光电转换元件上形成图像。 光偏转单元包括限定光束限制部件，该限制部件限制从光偏转单元出射的第一和第二光束中的至少一个在光电转换元件上形成图像的图像形成区域。

公开(公告)号：US20050007919A1

公开(公告)日：2005-01-13

申请号：US10915347

申请日：2004-08-11

申请人： Makoto Takamiya ,  Naoki Kawamata

发明人： Makoto Takamiya ,  Naoki Kawamata

IPC分类号： G11B19/20 ,  G01B11/26 ,  G11B5/55 ,  G11B5/596 ,  G11B21/10 ,  G11B7/00 ,  G11B5/09

CPC分类号： G11B5/59677 ,  G11B5/55 ,  G11B5/59605 ,  G11B5/59627 ,  G11B5/59633

摘要： An apparatus for optically detecting rotational position information of a rotating object, includes a light source, a detector which is located at a position to receive scattered light from the rotating object when the rotating object is irradiated with a light beam from the light source, and outputs a frequency signal based on the scattered light, a signal processing system for detecting rotational position information by performing signal processing for the frequency signal from the detector, and a rotation control system for controlling rotation of the rotating object. The rotation control system preliminarily rotates the rotating object in detecting the rotational position information.

摘要翻译： 一种用于光学检测旋转物体的旋转位置信息的装置，包括光源，当旋转物体被来自光源的光束照射时，位于接收来自旋转物体的散射光的位置的检测器，以及 输出基于散射光的频率信号，用于通过对来自检测器的频率信号执行信号处理来检测旋转位置信息的信号处理系统，以及用于控制旋转物体旋转的旋转控制系统。 旋转控制系统在检测旋转位置信息时预先旋转旋转体。