摘要:
The present invention is intended to prevent the deformation of a cylindrical mouth portion of a preform when a blow pressure acts thereon in a diameter expanding direction during biaxial orientation blow molding. During biaxial orientation blow molding, sealing of the blow pressure is accomplished by means of a neck ring P1 circumferentially provided on a lower end of the circumferentially provided on a lower end of the circumferential surface of a cylindrical mouth portion P2 of a preform to thereby make the blow pressure act uniformly on the whole area of the cylindrical mouth portion P2, whereby the unreasonable deformation of the cylindrical mouth portion P2 due to the ununiform application of blow pressure thereto can totally be eliminated.
摘要:
A coating composition contains (A) a water-based emulsion containing (a) amino group-containing polyorganosiloxane having a self crosslinking property, (b) chlorinated polyolefin, and (c) a water dispersible polyurethane resin, and (B) spherical particles made up of a rubbery elastic body mixed and dispersed in the water-based emulsion (A). The water-based emulsion (A) can be obtained by mixing a first emulsion containing the amino group-containing polyorganosiloxane (a), a second emulsion containing the chlorinated polyolefin (b), and the water dispersion of the polyurethane resin (c). The coating composition can form a coating film excellent in preservation stability, coating uniformity, working life, having good non-tackness, water repellancy, lubricity, and excellent in adhesiveness and abrasion resistance.
摘要:
A method for driving a plasma display panel is disclosed in which generation of a region having brightness non-uniformity can be reduced over an entire screen without changing the voltage and pulse width of sustain pulses thus enabling suppression of an increase in power consumption. This method for driving a plasma display panel comprises an initialization period for forming a discharge cell at an intersection where scan electrode and sustain electrode meet data electrode and generating initialization discharge in the cell, a writing period for generating writing discharge in the discharge cell, and a sustain period for generating sustain discharge by alternately applying sustain pulses to the scan electrode and sustain electrode of the discharge cell, and rise time of the sustain pulses to be applied to the scan electrode and sustain electrode during the sustain period is shortened at a frequency of once every several times.
摘要:
An optical pick-up module includes rotating means, a carriage mounting at least a light source and various optical members and disposed movably, and a cover having a first opening formed thereon, a tray having a second opening and having the optical pick-up module attached thereto in order to expose a part of the optical pick-up module form the second opening, and a housing for holding the tray to freely appear, and a third opening is provided on a part of the optical disk attachment region outside portion of the tray which is opposed to the first opening.
摘要:
A magnetic reproducer for reproducing data recorded on a magnetic tape by forming tracks sequentially and obliquely along a longitudinal direction of the magnetic tape, has magnetic heads for reproducing the information by sequentially scanning the tracks formed on the magnetic tape with a first track width for a first recording system or a second track width for a second recording system wider than that for the first recording system. And, a gap width between the magnetic heads is set at a value which is wider than the first track width and narrower than the second track width.
摘要:
In a magnetic recording device and method, a magnetic reproduction method and its method and a tape recording medium, the performance can be improved. In the case of successively and obliquely forming tracks along the longitudinal direction of a second magnetic tape having a width wider than a first magnetic tape and continuously recording recording data for at least two tracks in a digital recording format on each track, each track is to be formed at a predetermined track pitch set based on the recording time and the reproduction signal characteristic. Thereby, recording data based on the digital recording format which is applied to the first magnetic tape can keep a practically sufficient C/N ratio and can be recorded on the second magnetic tape for a long time. And thus, a magnetic recording device and method, a magnetic reproduction device and method, and a tape recording medium capable of improving the performance can be realized.
摘要:
A method for producing a silicon single crystal in accordance with the Czochralski method. The single crystal is grown in an N2(V) region where a large amount of precipitated oxygen and which is located within an N region located outside an OSF ring region, or is grown in a region including the OSF ring region, N1(V) and N2(V) regions located inside and outside the OSF ring region, in a defect distribution chart which shows a defect distribution in which the horizontal axis represents a radial distance D (mm) from the center of the crystal and the vertical axis represents a value of F/G (mm2/° C.·min), where F is a pulling rate (mm/min) of the single crystal, and G is an average intra-crystal temperature gradient (° C./mm) along the pulling direction within a temperature range of the melting point of silicon to 1400° C. The method allows production of silicon single crystal wafers in which neither FPDs nor L/D defects exist on the wafer surface, and gettering capability stemming from oxygen precipitation is provided over the entire wafer surface, and silicon single crystal wafers wherein OSF nuclei exit but no OSF ring appears when the wafer is subjected to thermal oxidation treatment, neither FPDs nor L/D defects exist on the wafer surface, and gettering capability is provided over the entire wafer surface.
摘要:
A method for producing a silicon single crystal, wherein, when a silicon single crystal is grown by the Czochralski method, the crystal is pulled with such conditions as present in a region defined by a boundary between a V-rich region and an N-region and a boundary between an N-region and an I-rich region in a defect distribution chart showing defect distribution which is plotted with D [mm] as abscissa and F/G [mm2/° C.·min] as ordinate, wherein D represents a distance between center of the crystal and periphery of the crystal, F/G [mm/min] represents a pulling rate and G [° C./mm] represents an average temperature gradient along the crystal pulling axis direction in the temperature range of from the melting point of silicon to 1400° C., and time required for crystal temperature to pass through the temperature region of from 900° C. to 600° C. is controlled to be 700 minutes or shorter, and a silicon single crystal wafer grown by the Czochralski method, which is a silicon single crystal wafer having N-region for its entire plane, and does not generate OSFs by a single-step thermal oxidation treatment, but generates OSFs by a two-step thermal oxidation treatment. According to the method, a silicon single crystal wafer of an extremely low defect density, which has the N-region for the entire plane of the crystal, is obtained by the CZ, while maintaining high productivity.
摘要翻译:一种硅单晶的制造方法,其中,当通过切克劳斯斯克方法生长硅单晶时,以存在于富V区和N区之间的边界的区域中的条件拉伸晶体 和缺陷分布图中的N区域和富I区域之间的边界,示出了以D [mm]为横坐标绘制的缺陷分布,F / G [mm2 /℃·min]为纵坐标,其中D 表示晶体的中心和晶体的周边之间的距离,F / G [mm / min]表示拉伸速度,G [℃/ mm]表示在温度范围内沿着拉晶轴方向的平均温度梯度 从硅的熔点到1400℃,晶体温度通过900℃至600℃的温度所需的时间被控制为700分钟或更短,并且硅单晶 通过Czochralski方法生长的晶片,其是硅单体 晶片在其整个平面上具有N区,并且不通过单步热氧化处理产生OSF,而是通过两步热氧化处理产生OSF。 根据该方法,通过CZ获得具有用于整个晶体平面的N区域的具有极低缺陷密度的硅单晶晶片,同时保持高生产率。
摘要:
In a method for producing a silicon single crystal wafer, a silicon single crystal is grown in accordance with the Czochralski method such that the F/G value becomes 0.112-0.142 mm.sup.2 /.degree. C..multidot.min at the center of the crystal, where F is a pulling rate (mm/min) of the single crystal, and G is an average intra-crystal temperature gradient (.degree. C./mm) along the pulling direction within a temperature range of the melting point of silicon to 1400.degree. C. Additionally, the single crystal is pulled such that the interstitial oxygen concentration becomes less than 24 ppma, or the time required to pass through a temperature zone of 1050-850.degree. C. within the crystal is controlled to become 140 minutes or less. The method allows production of silicon single crystal wafers in which neither FPDs nor L/D defects exist on the wafer surface, which therefore has an extremely low defect density, and whose entire surface is usable.
摘要:
In a single crystal manufacturing method by a horizontal magnetic field applied CZ method wherein coils are disposed interposing a crucible coaxially with each other, the coils constituting superconductive electromagnets of a magnetic field application apparatus and the silicon crystal is pulled from melt in the crucible while applying a horizontal magnetic field to the melt; an elavation apparatus capable of finely adjusting relative positions of the superconductive electromagnets and the crcucible in a vertical direction is disposed. The descent of a central portion Cm in a depth direction of the melt is canceled by elevating the crucible with the elevating apparatus, the descent being accompanied with proceeding of process of pulling the single crystal, thereby a coil central axis Cc of the superconductive electromagnets always passes through the central portion Cm or below this portion. Compared with the conventional HMCZ method, an uniformity of an intensity distribution of the magnetic field applied to the melt is increased so that a suppression effect on the melt convection all over the crucible is enhanced.