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公开(公告)号:US07271603B2
公开(公告)日:2007-09-18
申请号:US11391895
申请日:2006-03-28
申请人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
IPC分类号: G01R31/02
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path extending between the first and second surfaces of a membrane and a probe contact electrically connected to the conductive path.
摘要翻译: 用于测量高频集成电路或其他微电子器件的电气特性的探针测量系统。 探针测量系统优选地包括具有在膜的第一和第二表面之间延伸的导电路径的探针和电连接到导电路径的探针接触。
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公开(公告)号:US07898273B2
公开(公告)日:2011-03-01
申请号:US12378659
申请日:2009-02-17
申请人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
IPC分类号: G01R31/20
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
摘要翻译: 用于测量高频集成电路或其他微电子器件的电气特性的探针测量系统。
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公开(公告)号:US07501842B2
公开(公告)日:2009-03-10
申请号:US11975471
申请日:2007-10-19
申请人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
IPC分类号: G01R31/02
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
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公开(公告)号:US20090267625A1
公开(公告)日:2009-10-29
申请号:US12378659
申请日:2009-02-17
申请人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
摘要翻译: 用于测量高频集成电路或其他微电子器件的电气特性的探针测量系统。
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公开(公告)号:US20060170439A1
公开(公告)日:2006-08-03
申请号:US11391895
申请日:2006-03-28
申请人: K. Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Gleason , Tim Lesher , Mike Andrews , John Martin
IPC分类号: G01R31/02
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号:US07057404B2
公开(公告)日:2006-06-06
申请号:US10445174
申请日:2003-05-23
申请人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
IPC分类号: G01R31/02
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path between the first and second sides of a substrate and a probe contact electrically connected to the conductive path.
摘要翻译: 用于测量高频集成电路或其他微电子器件的电气特性的探针测量系统。 探针测量系统优选地包括具有在衬底的第一和第二侧之间的导电路径的探针和电连接到导电路径的探针接触。
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公开(公告)号:US20050099191A1
公开(公告)日:2005-05-12
申请号:US10445174
申请日:2003-05-23
申请人: K. Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Gleason , Tim Lesher , Mike Andrews , John Martin
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
摘要翻译: 用于测量高频集成电路或其他微电子器件的电气特性的探针测量系统。
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公开(公告)号:US07394269B2
公开(公告)日:2008-07-01
申请号:US11888957
申请日:2007-08-03
申请人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
IPC分类号: G01R31/02
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号:US20070273399A1
公开(公告)日:2007-11-29
申请号:US11888957
申请日:2007-08-03
申请人: K. Gleason , Tim Lesher , Mike Andrews , John Martin
发明人: K. Gleason , Tim Lesher , Mike Andrews , John Martin
IPC分类号: G01R31/02
CPC分类号: G01R1/07342 , G01R1/06738 , G01R1/06772
摘要: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
摘要翻译: 用于测量高频集成电路或其他微电子器件的电气特性的探针测量系统。
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公开(公告)号:US07797856B2
公开(公告)日:2010-09-21
申请号:US11733676
申请日:2007-04-10
申请人: Mike Andrews , Paul Litchfield , Jorgen Romer , Ricardo Vestuti
发明人: Mike Andrews , Paul Litchfield , Jorgen Romer , Ricardo Vestuti
IPC分类号: A43B13/18
CPC分类号: A43B13/12 , A43B13/14 , A43B13/186 , A43B13/188
摘要: A sole for an article of footwear comprising a midsole having a plurality of polygonal-shaped openings, or cavities, therein. In alternative embodiments, the sole includes reinforcement elements such as a plate disposed along at least a portion of one of the surfaces of the midsole. The plate includes at least one polygonal-shaped extension adapted to fit within at least a portion of at least one of the polygonal-shaped openings within the midsole. Additionally, a polyurethane film is disposed on at least a portion of the bottom surface of the midsole. The shoe also includes an outsole disposed on at least a portion of a bottom surface of the polyurethane film, wherein the outsole comprises a plurality of polygonal-shaped openings aligned with the polygonal-shaped openings of the midsole.
摘要翻译: 一种用于鞋类物品的鞋底,包括在其中具有多个多边形开口或中空的中底。 在替代实施例中,鞋底包括加强元件,例如沿着中底的一个表面的至少一部分设置的板。 板包括至少一个多边形的延伸部,其适于装配在中底内的至少一个多边形开口的至少一部分内。 此外,在中底的底面的至少一部分上设置聚氨酯膜。 鞋还包括设置在聚氨酯膜的底表面的至少一部分上的外底,其中外底包括与中底的多边形开口对准的多个多边形开口。
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