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公开(公告)号：US09036781B1
公开(公告)日：2015-05-19
申请号：US13650733
申请日：2012-10-12
Applicant: The Boeing Company
Inventor： Morteza Safai
IPC: G01N23/201 , G01N23/00
CPC classification number: G01N23/00 , G01N23/203 , G01N2223/1016 , G01N2223/631 , G01N2223/645
Abstract: A method and apparatus for inspecting an object. A radiation generation system is configured to emit radiation. A detector system is configured to detect backscatter formed in response to the radiation encountering the object. A redirection system is positioned relative to the detector system and is configured to redirect the backscatter to the detector system.
Abstract translation: 一种用于检查物体的方法和装置。 辐射生成系统被配置为发射辐射。 检测器系统被配置为检测响应于遇到物体的辐射而形成的反向散射。 重定向系统相对于检测器系统定位，并且被配置为将反向散射重定向到检测器系统。
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42.发明申请公开(公告)号：US20140273240A1
公开(公告)日：2014-09-18
申请号：US13840980
申请日：2013-03-15
Applicant: The Boeing Company
Inventor： Gary E. Georgeson , Megan N. Watson , Morteza Safai
IPC: G01N31/22
CPC classification number: G01N31/229 , C09D5/26 , G01K11/20 , G01N21/91 , G01N2021/8472
Abstract: A method of detecting high-temperature exposure of a composite may include applying a composition comprising an adduct suitable for detecting heat and/or mechanical stress in a composite, wherein the adduct reverts to first and second adduct components after exposure of the composition to a temperature of from about 190° C. to about 260° C. to a surface of the composite; exposing the surface to which the composition has been applied to ultraviolet light; and measuring fluorescence of the composition.
Abstract translation: 检测复合材料的高温暴露的方法可以包括施加包含适合于在复合材料中检测热和/或机械应力的加合物的组合物，其中在将组合物暴露于温度之后，加合物回复到第一和第二加合物组分 约190℃至约260℃的温度; 将已经施加组合物的表面暴露于紫外光下; 并测量组合物的荧光。
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公开(公告)号：US11953471B2
公开(公告)日：2024-04-09
申请号：US17450961
申请日：2021-10-14
Applicant: The Boeing Company
Inventor： Morteza Safai
CPC classification number: G01N3/307 , G01N19/04 , G01N2203/0055 , G01N2203/0296
Abstract: A system and method for evaluating a bond is provided. The system uses an underwater spark discharge to generate a compression wave in a first vessel containing a liquid. The system further includes a second vessel in which a vacuum is pulled to hold the first vessel against a bonded structure being inspected. The compression wave is directed to propagate from the liquid into the bonded structure to apply a known force to the bond being inspected.
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公开(公告)号：US20240085325A1
公开(公告)日：2024-03-14
申请号：US18509402
申请日：2023-11-15
Applicant: The Boeing Company
Inventor： Keith D. Humfeld , Morteza Safai
CPC classification number: G01N21/6402 , G01J3/0232 , G01J3/4406 , G01N2021/6419 , G01N2021/6421 , H01S5/1092
Abstract: An example system for inspecting a surface includes a laser, an optical system, a gated camera, and a control system. The laser is configured to emit pulses of light, with respective wavelengths of the pulses of light varying over time. The optical system includes at least one optical element, and is configured to direct light emitted by the laser to points along a scan line one point at a time. The gated camera is configured to record a fluorescent response of the surface from light having each wavelength of a plurality of wavelengths at each point along the scan line. The control system is configured to control the gated camera such that an aperture of the gated camera is open during fluorescence of the surface but closed during exposure of the surface to light emitted by the laser.
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公开(公告)号：US20220365006A1
公开(公告)日：2022-11-17
申请号：US17695495
申请日：2022-03-15
Applicant: The Boeing Company
Inventor： Morteza Safai
IPC: G01N23/203 , G01N23/20008
Abstract: Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The x-ray backscatter apparatus comprises an x-ray source and an x-ray filter. The x-ray filter comprises a plurality of emission apertures and a detection aperture. The x-ray backscatter apparatus further comprises an x-ray intensity sensor that is fixed to the x-ray filter over the detection aperture such that any portion of an unfiltered x-ray emission filtered into the detection aperture is detected by the x-ray intensity sensor. The x-ray backscatter apparatus additionally comprises an emission alignment adjuster that is operable to adjust a position of the unfiltered x-ray emission relative to the plurality of emission apertures and the detection aperture in response to a position, relative to the detection aperture, of a peak intensity of the unfiltered x-ray emission passing into the detection aperture, detected by the x-ray intensity sensor.
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Patent Agency Ranking
46.发明授权公开(公告)号：US11410294B2
公开(公告)日：2022-08-09
申请号：US17365221
申请日：2021-07-01
Applicant: The Boeing Company
Inventor： Morteza Safai
Abstract: An example system includes a sensor housing defining a plurality of horizontal layers and a controller. The sensor housing includes a plurality of light-emitted diode (LED) light sources, a plurality of cameras, and a plurality of optical devices. Each camera of the plurality of cameras is positioned within a respective horizontal layer of the plurality of horizontal layers and configured to detect a respective range of wavelengths of light. The plurality of optical devices is configured to receive light reflected by the surface through a common input lens and direct the light to one of the cameras of the plurality of cameras depending on a wavelength of the light. The controller is configured to receive signals from the plurality of cameras indicative of the light reflected by the surface and determine whether there is any foreign object debris material on the surface using the signals from the plurality of cameras.
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公开(公告)号：US20220136825A1
公开(公告)日：2022-05-05
申请号：US17013236
申请日：2020-09-04
Applicant: The Boeing Company
Inventor： Keith D. Humfeld , Morteza Safai
IPC: G01B17/02 , B29C70/38 , G01N29/06 , C08J5/04 , B29C70/02 , B29C70/54 , G01N29/11 , G01N29/07 , B29C70/30 , G01N29/04
Abstract: Systems and methods are provided for ultrasonic imaging of composite parts. One embodiment is a method that includes providing an object having multiple layers of fibers and resin, inducing ultrasonic waves at locations along the object, and attenuating the ultrasonic waves at the regions due to regions interspersed among the layers that each exhibit an elastic modulus distinct from an elastic modulus of the fibers and distinct from an elastic modulus of the matrix. The method further includes receiving the attenuated ultrasonic waves, and analyzing the attenuated ultrasonic waves to determine depths of the regions.
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公开(公告)号：US20220034861A1
公开(公告)日：2022-02-03
申请号：US17451290
申请日：2021-10-18
Applicant: The Boeing Company
Inventor： Morteza Safai
IPC: G01N33/207 , G01N29/04 , H05H1/24
Abstract: A system for evaluating a bond includes a first electrode and a second electrode that are spaced apart from one another. The system also includes a sacrificial material layer positioned proximate to a surface of a bonded structure that includes the bond. The system also includes a power source configured to cause the first and second electrodes to generate an electrical arc that at least partially ablates the sacrificial material layer as part of a non-destructive inspection of the bond.
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公开(公告)号：US11231397B2
公开(公告)日：2022-01-25
申请号：US16522752
申请日：2019-07-26
Applicant: The Boeing Company
Inventor： Morteza Safai
IPC: G01N29/24
Abstract: Methods, systems, and apparatuses are disclosed for non-destructively inspecting a substrate by measuring the Doppler effect in sound waves comprising wide bandwidth ultrasound wavelengths generated from a piezoelectric polymer coating material with the sound waves read by a laser in communication with a Doppler velocity meter.
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公开(公告)号：US11169098B2
公开(公告)日：2021-11-09
申请号：US16838329
申请日：2020-04-02
Applicant: The Boeing Company
Inventor： Morteza Safai
IPC: G01N23/20008 , G01N23/203 , G21K1/04 , H01J35/14 , H01J35/12
Abstract: Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The apparatus comprises an emission shaping mechanism that is configured to receive an electron emission from a cathode and to adjust a shape of the electron emission from a circular cross-sectional shape into a first elliptical cross-sectional shape. The x-ray source further comprises an anode that is configured to convert the electron emission into an unfiltered x-ray emission having a second elliptical cross-sectional shape. The apparatus also comprises an x-ray filter that comprises an emission aperture having a cross-sectional area smaller than an area of the second elliptical cross-sectional shape of the unfiltered x-ray emission. The x-ray filter is located relative to the unfiltered x-ray emission to allow only a portion of the unfiltered x-ray emission to pass through the emission aperture and form a filtered x-ray emission.
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