MICROELECTRONIC SENSOR DEVICE FOR THE DETECTION OF TARGET PARTICLES
    42.
    发明申请
    MICROELECTRONIC SENSOR DEVICE FOR THE DETECTION OF TARGET PARTICLES 有权
    用于检测目标颗粒的微电子传感器装置

    公开(公告)号:US20100267165A1

    公开(公告)日:2010-10-21

    申请号:US12747529

    申请日:2008-10-31

    IPC分类号: G01N33/53

    摘要: The invention relates to a microelectronic sensor device for the examination of target particles (1) that are bound to binding sites (3) at the binding surface (12) of a carrier (11). In a preferred embodiment, an input light beam (L1) is transmitted into the carrier (11), where a frustrated total internal reflection (FTIR) takes place at the binding surface (12). The amount of light in a resulting output light beam (L2) is detected by a light detector (31) and provides information about the presence of target particles at the binding surface. Moreover, an actuation unit (50) induces movements of the bound target particles (1) by an interaction with a magnetic field (B) or an electric field, particularly with a given modulation frequency (COIn), such that by a demodulation of the detector signal (S) effects of the target particles can be distinguished from background.

    摘要翻译: 本发明涉及一种用于检查在载体(11)的结合表面(12)处结合到结合位点(3)的靶颗粒(1)的微电子传感器装置。 在优选实施例中,输入光束(L1)被传输到载体(11)中,其中在结合表面(12)处发生挫败的全内反射(FTIR)。 通过光检测器(31)检测所得到的输出光束(L2)中的光量,并提供关于在结合表面处存在目标颗粒的信息。 此外,致动单元(50)通过与磁场(B)或电场的相互作用(特别是给定的调制频率(COIn))的相互作用来诱导结合的目标颗粒(1)的运动,使得通过解调 目标颗粒的检测器信号(S)效应可以与背景区分开。

    MICROELECTRONIC SENSOR DEVICE WITH A MODULATED LIGHT SOURCE
    43.
    发明申请
    MICROELECTRONIC SENSOR DEVICE WITH A MODULATED LIGHT SOURCE 有权
    具有调制光源的微电子传感器装置

    公开(公告)号:US20100165345A1

    公开(公告)日:2010-07-01

    申请号:US12670148

    申请日:2008-07-17

    IPC分类号: G01N21/59

    摘要: The invention relates to a microelectronic sensor device and a method for making optical examinations at a carrier (11), e.g. for the detection of magnetic particles (1) at a contact surface (12) of the carrier (11) by frustrated total internal reflection (FTIR). A light source (21), particularly a laser light source, with a laser modulator (22) are used for emitting an input light beam (L1) into the carrier (11) which is modulated such that optical interferences with reflections (L1′) of the input light beam (L1) from the entrance window (14) or other components of the carrier (11) are reduced/minimized. This can for example be achieved by a pulsed on/off modulation in which the first relaxation minimum of a currently emitted pulse (PN) coincides in the light source (21) with the first relaxation maximum of a reflected pulse (PN-1′). By reducing the effect of interferences, the setup is less prone to disturbances from dimensional variations that are e.g. induced by thermal extension.

    摘要翻译: 本发明涉及一种微电子传感器装置和一种用于在载体(11)上进行光学检查的方法。 用于通过沮丧的全内反射(FTIR)检测载体(11)的接触表面(12)处的磁性颗粒(1)。 使用具有激光调制器(22)的光源(21),特别是具有激光光源的光源(21)将输入光束(L1)发射到被调制的载波(11)中,使得与反射(L1')的光学干涉 (14)的输入光束(L1)或载体(11)的其他部件的距离减小/最小化。 这可以例如通过脉冲开/关调制实现,其中当前发射的脉冲(PN)的第一弛豫最小值与光源(21)中的第一弛豫最小值与反射脉冲(PN-1')的第一弛豫最大值一致, 。 通过减少干扰的影响,该装置不容易受到尺寸变化的干扰。 由热延伸引起。

    MICROELECTRONIC SENSOR DEVICE FOR DETECTING LABEL PARTICLES
    44.
    发明申请
    MICROELECTRONIC SENSOR DEVICE FOR DETECTING LABEL PARTICLES 有权
    用于检测标签颗粒的微电子传感器装置

    公开(公告)号:US20100092996A1

    公开(公告)日:2010-04-15

    申请号:US12518164

    申请日:2007-12-10

    IPC分类号: G01N33/53 C12M1/34

    摘要: The invention relates to a microelectronic sensor device for the detection of target components that comprise label particles, for example magnetic particles (1). The sensor device comprises a carrier (11) with a binding surface (12) at which target components can collect and optionally bind to specific capture elements. An input light beam (L1) is transmitted into the carrier and totally internally reflected at the binding surface (12). The amount of light in the output light beam (L2) and optionally also of fluorescence light emitted by target components at the binding surface is then detected by a light detector (31). Evanescent light generated during the total internal reflection is affected (absorbed, scattered) by target components and/or label particles (1) at the binding surface (12) and will therefore be missing in the output light beam (L2). This can be used to determine the amount of target components at the binding surface (12) from the amount of light in the output light beam (L2, L2a, L2b). A magnetic field generator (41) is optionally used to generate a magnetic field (B) at the binding surface (12) by which magnetic label particles (1) can be manipulated, for example 15 attracted or repelled.

    摘要翻译: 本发明涉及用于检测包含标签颗粒(例如磁性颗粒(1))的目标组分的微电子传感器装置。 传感器装置包括具有结合表面(12)的载体(11),靶组分可以收集并任选地结合到特定的捕获元件。 输入光束(L1)被传输到载体中并在结合表面(12)处全反射。 由光检测器(31)检测输出光束(L2)中的光量以及可选地由结合表面上的目标成分发出的荧光。 在全内反射期间产生的渐消光在目标部件和/或粘合表面(12)处的标签颗粒(1)受到影响(吸收,散射),因此在输出光束(L2)中将被丢失。 这可以用于根据输出光束(L2,L2a,L2b)中的光量来确定结合表面(12)处的目标成分的量。 可选地使用磁场发生器(41)来在绑定表面(12)处产生磁场(B),通过该磁场可以操纵磁性标签颗粒(1),例如15被吸引或排斥。

    Optical scanning device
    46.
    发明授权
    Optical scanning device 失效
    光学扫描装置

    公开(公告)号:US07209413B2

    公开(公告)日:2007-04-24

    申请号:US10521658

    申请日:2003-07-02

    IPC分类号: G11B7/00

    摘要: An optical scanning device for scanning an information layer of an optical record carrier and including a rotary aim (2; 102; 202; 302; 402; 502) which is arranged to swing about a rotation axis (CR) to alter an angular position of the rotary arm about the rotation axis; a detector arrangement (10) arranged separate from the rotary arm (2; 102; 202; 302; 402; 502) for detecting a radiation beam spot, the radiation beam spot (40; 140; 240; 340; 440; 540) having an angular disposition; a first reflective surface (4; 104; 204; 304; 404; 504) attached to the rotary arm (2; 102; 202; 302; 402; 502); a second reflective surface (6; 106; 206; 306; 406; 506) attached to the rotary arm (2; 102; 302; 402; 502); a first light path (LP 1; LP 1 O 1; LP201; LP301; LP401; LP501; running from a location on the record carrier to said first reflective surface; a second light path (LP2; LP102; LP202; LP302; LP402; LP502) running from said first reflective surface to said second reflective surface; a third light path (LP3; LP103; LP203; LP303; LP403; LP503) running from said second reflective surface to said detector arrangement (10). The rotary arm includes at least one optical inversion element (52; 54; 56; 58; 64; 66) arranged such that a dependence between variation of the angular disposition of the radiation beam spot and variation of the angular position of the rotary arm is reduced.

    摘要翻译: 一种用于扫描光学记录载体的信息层并包括旋转瞄准镜(2; 102; 202; 302; 402; 502)的光学扫描装置,其被设置成围绕旋转轴线(CR)摆动以改变角度位置 旋转臂围绕旋转轴线; 与所述旋转臂(2; 102; 202; 302; 402; 502)分开布置的用于检测辐射束点的检测器装置(10),所述辐射束点(40; 140; 240; 340; 440; 540)具有 角度配置; 附接到旋转臂(2; 102; 202; 302; 402; 502)的第一反射表面(4; 104; 204; 304; 404; 504) 附接到旋转臂(2; 102; 302; 402; 502)的第二反射表面(6; 106; 206; 306; 406; 506) 第一光路(LP 1; LP 1 O 1; LP 201; LP 301; LP 401; LP 501;从记录载体上的位置运行到所述第一反射表面;第二光路(LP 2; LP 102; LP 202; LP 302; LP 402; LP 502),从所述第一反射表面延伸到所述第二反射表面;第三光路(LP 3; LP 103; LP 203; LP 303; LP 403; LP 503) 所述旋转臂包括至少一个光学反转元件(52; 54; 56; 58; 64; 66),所述至少一个光学反转元件被布置成使得所述辐射束光斑的角度配置的变化之间的相关性 并且减小了旋转臂的角位置的变化。