-
公开(公告)号：US09658219B2
公开(公告)日：2017-05-23
申请号：US12518164
申请日：2007-12-10
申请人： Coen Adrianus Verschuren , Dominique Maria Bruls , Albert Hendrik Jan Immink , Femke Karina De Theije , Thea Van Der Wijk , Alexander Marc Van Der Lee , Johannes Joseph Hubertina Barbara Schleipen
发明人： Coen Adrianus Verschuren , Dominique Maria Bruls , Albert Hendrik Jan Immink , Femke Karina De Theije , Thea Van Der Wijk , Alexander Marc Van Der Lee , Johannes Joseph Hubertina Barbara Schleipen
IPC分类号： G01N21/552 , G01N21/64 , G01N33/543 , G01N27/74 , G01N21/39
CPC分类号： G01N33/543 , G01N21/552 , G01N21/553 , G01N21/6428 , G01N21/6452 , G01N21/648 , G01N27/745 , G01N33/54306 , G01N33/54386 , Y10S436/00
摘要： A microelectronic sensor device for the detection of target components with label or magnetic particles includes a carrier with a binding surface at which target components can collect and optionally bind to specific capture elements. An input light beam is transmitted into the carrier and totally internally reflected at the binding surface. The amount of light in the output light beam is detected by a light detector. Evanescent light generated during the total internal reflection is affected by target components and/or label particles at the binding surface and will be missing in the output light beam. This is used to determine the amount of target components at the binding surface from the amount of light in the output light beam. A magnetic field generator is optionally used to generate a magnetic field at the binding surface by which magnetic label particles can be manipulated, such as attracted or repelled.
-
公开(公告)号：US20100092996A1
公开(公告)日：2010-04-15
申请号：US12518164
申请日：2007-12-10
申请人： Coen Adrianus Verschuren , Dominique Maria Bruls , Albert Hendrik Jan Immink , Femke Karina De Theije , Thea Van Der Wijk , Alexander Marc Van Der Lee , Johannes Joseph Hubertina Barbara Schleipen
发明人： Coen Adrianus Verschuren , Dominique Maria Bruls , Albert Hendrik Jan Immink , Femke Karina De Theije , Thea Van Der Wijk , Alexander Marc Van Der Lee , Johannes Joseph Hubertina Barbara Schleipen
CPC分类号： G01N33/543 , G01N21/552 , G01N21/553 , G01N21/6428 , G01N21/6452 , G01N21/648 , G01N27/745 , G01N33/54306 , G01N33/54386 , Y10S436/00
摘要： The invention relates to a microelectronic sensor device for the detection of target components that comprise label particles, for example magnetic particles (1). The sensor device comprises a carrier (11) with a binding surface (12) at which target components can collect and optionally bind to specific capture elements. An input light beam (L1) is transmitted into the carrier and totally internally reflected at the binding surface (12). The amount of light in the output light beam (L2) and optionally also of fluorescence light emitted by target components at the binding surface is then detected by a light detector (31). Evanescent light generated during the total internal reflection is affected (absorbed, scattered) by target components and/or label particles (1) at the binding surface (12) and will therefore be missing in the output light beam (L2). This can be used to determine the amount of target components at the binding surface (12) from the amount of light in the output light beam (L2, L2a, L2b). A magnetic field generator (41) is optionally used to generate a magnetic field (B) at the binding surface (12) by which magnetic label particles (1) can be manipulated, for example 15 attracted or repelled.
摘要翻译： 本发明涉及用于检测包含标签颗粒（例如磁性颗粒（1））的目标组分的微电子传感器装置。 传感器装置包括具有结合表面（12）的载体（11），靶组分可以收集并任选地结合到特定的捕获元件。 输入光束（L1）被传输到载体中并在结合表面（12）处全反射。 由光检测器（31）检测输出光束（L2）中的光量以及可选地由结合表面上的目标成分发出的荧光。 在全内反射期间产生的渐消光在目标部件和/或粘合表面（12）处的标签颗粒（1）受到影响（吸收，散射），因此在输出光束（L2）中将被丢失。 这可以用于根据输出光束（L2，L2a，L2b）中的光量来确定结合表面（12）处的目标成分的量。 可选地使用磁场发生器（41）来在绑定表面（12）处产生磁场（B），通过该磁场可以操纵磁性标签颗粒（1），例如15被吸引或排斥。
-
公开(公告)号：US20100253323A1
公开(公告)日：2010-10-07
申请号：US12746182
申请日：2008-12-04
申请人： Femke Karina De Theije , Dominique Maria Bruls , Thea Van Der Wijk , Coen Adrianus Verschuren , Albert Hendrik Jan Immink
发明人： Femke Karina De Theije , Dominique Maria Bruls , Thea Van Der Wijk , Coen Adrianus Verschuren , Albert Hendrik Jan Immink
IPC分类号： G01N27/74
CPC分类号： G01N33/54326 , G01N21/552 , G01N21/648 , G01N27/745
摘要： Detecting magnetized or magnetizable target components in a fluid containing the magnetized or magnetizable target components amongst other magnetized or magnetizable components, uses a magnetic field generator (M1, 28) to attract the magnetized or magnetizable components towards a binding surface. A magnetic field controller (C1) applies the magnetic field to concentrate the magnetized or magnetizable components in columns on the binding surface, subsequently reduces the magnetic field to enable the columns to collapse, to allow more components to reach the binding surface, and reapplies the magnetic field so as to cause other components to be pulled off the binding surface to reform columns based on the bound target components. A surface sensitive sensor (S1, 26, 29) detects the bound magnetized or magnetizable target components. The reapplication of the magnetic field acts as a magnetic washing step to release unwanted aspecific adsorption binding, leaving the targets, to improve sensitivity with simplified hardware and a reduction in cost and size.
摘要翻译： 检测包含磁化或可磁化的目标部件的流体中的磁化或可磁化的目标部件在其他磁化或可磁化部件之间，使用磁场发生器（M1,28）将磁化或可磁化的部件吸引到装订表面。 磁场控制器（C1）施加磁场以将磁化的或可磁化的组件在列中集中在结合表面上，随后减小磁场以使柱能够塌陷，以允许更多的部件到达结合表面，并重新应用 磁场，以便使其他组分从结合表面上拉出，以便根据结合的目标组分重新制备柱。 表面敏感传感器（S1,26,29）检测结合的磁化或可磁化的目标部件。 磁场的重新应用充当磁性洗涤步骤以释放不期望的特异性吸附结合，留下目标，以通过简化的硬件提高灵敏度并降低成本和尺寸。
-
4.发明授权Microelectronic sensor device for optical examinations on a wetted surface 有权用于在湿润表面进行光学检查的微电子传感器装置公开(公告)号：US08411274B2
公开(公告)日：2013-04-02
申请号：US12666814
申请日：2008-06-24
CPC分类号： G01N21/552 , G01N21/11 , G01N21/648
摘要： A method and a microelectronic sensor device for making optical examinations in an investigation region at the contact surface of a carrier, wherein an input light beam is sent from a light source towards the investigation region, and wherein an output light beam coming from the investigation region is detected by a light detector. An evaluation unit that is coupled to the light detector is adapted to determine the wetting grade of the investigation region based on a characteristic parameter of the output light beam. The evaluation unit may be adapted to determine a change in the light intensity caused by a liquid contacting the contact surface. The wetting grade may be detected in a test region that is located adjacent to the investigation region and that has a higher roughness than the investigation region.
摘要翻译： 一种用于在载体的接触表面处的调查区域中进行光学检查的方法和微电子传感器装置，其中输入光束从光源向调查区域发送，并且其中来自调查区域的输出光束 由光检测器检测。 耦合到光检测器的评估单元适于基于输出光束的特征参数来确定调查区域的润湿等级。 评估单元可以适于确定由接触表面的液体引起的光强度的变化。 可以在位于与调查区域相邻并且具有比调查区域更高的粗糙度的测试区域中检测润湿等级。
-
5.发明申请MICROELECTRONIC SENSOR DEVICE FOR OPTICAL EXAMINATIONS IN A SAMPLE MEDIUM 审中-公开用于在样品介质中进行光学检查的微电子传感器装置公开(公告)号：US20110188030A1
公开(公告)日：2011-08-04
申请号：US12671735
申请日：2008-07-17
IPC分类号： G01N21/41
CPC分类号： G01N21/552 , G01N21/41 , G01N2021/4153 , G01N2021/434 , G01N2021/437
摘要： The invention relates to a microelectronic sensor device with a light source (21) for emitting an input light beam (L1) into a transparent carrier (11) such that it is totally internally reflected at a contact surface (12) as an output light beam (L2), which is detected by a light detector (31). Frustration of the total internal reflection at the contact surface (12) can then for example be used to determine the amount of target particles (1) present at this surface. The sensor device further comprises a refractive index measurement unit (100, 200, 300) for measuring the refractive index (nB) of the sample medium, and an evaluation unit (50) for evaluating the measurement of the light detector (31) taking the measured refractive index (nB) into account and/or for changing the conditions of total internal reflection of the input light beam (L1). The refractive index measurement unit may particularly be designed to infer the refractive index (nB) from the deflection of a test-light beam (L3) that is transmitted through the sample medium, or from a reflection of a test-light beam (L1) at an interface (12) to the sample medium. In the latter case, it is possible to determine the critical angle of total internal reflection and/or to measure the reflectivity of the interface.
摘要翻译： 本发明涉及一种具有用于将输入光束（L1）发射到透明载体（11）中的光源（21）的微电子传感器装置，使得其在接触表面（12）处作为输出光束被全内反射 （L2），其由光检测器（31）检测。 接触表面（12）处的全内反射的挫折可以例如用于确定存在于该表面的目标颗粒（1）的量。 传感器装置还包括用于测量样品介质的折射率（nB）的折射率测量单元（100,200,300），以及用于评估光检测器（31）的测量的评估单元（50） 测量的折射率（nB）和/或用于改变输入光束（L1）的全内反射的条件。 折射率测量单元可以特别地被设计为从透射通过样品介质的测试光束（L3）的偏转或从测试光束（L1）的反射推断折射率（nB） 在样品介质的界面（12）处。 在后一种情况下，可以确定全内反射的临界角和/或测量界面的反射率。
-
6.发明申请MICROELECTRONIC SENSOR DEVICE FOR OPTICAL EXAMINATIONS ON A WETTED SURFACE 有权用于在湿润表面进行光学检查的微电子传感器装置公开(公告)号：US20100328654A1
公开(公告)日：2010-12-30
申请号：US12666814
申请日：2008-06-24
IPC分类号： G01N21/00
CPC分类号： G01N21/552 , G01N21/11 , G01N21/648
摘要： The application relates to a method and a microelectronic sensor device for making optical examinations in an investigation region (13) at the contact surface (12) of a carrier (10), wherein an input light beam (L1, L1′) is sent from a light source (20) towards the investigation region (13), and wherein an output light beam (L2, L2′) coming from the investigation region (13) is detected by a light detector (30). An evaluation unit (50) that is coupled to the light detector (30) is adapted to determine the wetting grade of the investigation region (13) based on a characteristic parameter of the output light beam (L2, L2′), e.g. its intensity. In a preferred embodiment, the evaluation unit (50) is adapted to determine a change in the light intensity caused by a liquid contacting the contact surface (12). The wetting grade may particularly be detected in a test region (14) that is located adjacent to the investigation region (13) and that has a higher roughness than the investigation region (13).
摘要翻译： 本申请涉及一种用于在载体（10）的接触表面（12）处的调查区域（13）中进行光学检查的方法和微电子传感器装置，其中输入光束（L1，L1'）从 朝向调查区域（13）的光源（20），并且其中来自调查区域（13）的输出光束（L2，L2'）由光检测器（30）检测。 耦合到光检测器（30）的评估单元（50）适于基于输出光束（L2，L2'）的特征参数来确定调查区域（13）的润湿等级。 其强度。 在优选实施例中，评估单元（50）适于确定由与接触表面（12）接触的液体引起的光强度的变化。 可以在与调查区域（13）相邻并且具有比调查区域（13）更高的粗糙度的测试区域（14）中特别地检测润湿等级。
-
7.发明申请X-RAY DETECTOR WITH IMPROVED SPATIAL GAIN UNIFORMITY AND RESOLUTION AND METHOD OF FABRICATING SUCH X-RAY DETECTOR 有权具有改进的空间增益均匀性和分辨率的X射线探测器以及制造这种X射线探测器的方法公开(公告)号：US20130037723A1
公开(公告)日：2013-02-14
申请号：US13642861
申请日：2011-04-19
CPC分类号： G01T1/2002
摘要： An X-raydetector (1) is proposed comprising a light detection arrangement (3) such as a CMOS photodetector, a scintillator layer (5) such as a CsI:T1 layer, a reflector layer (9) and a light emission layer (7) interposed between the scintillator layer (5) and the reflector layer (9). The light emission layer (7) may comprise an OLED and may be made with a thickness of less than 50 μm. Thereby, a sensitivity and resolution of the X-raydetector may be improved.
摘要翻译： 提出了一种X射线检测器（1），其包括诸如CMOS光电检测器的光检测装置（3），诸如CsI：T1层的闪烁体层（5），反射器层（9）和发光层（7） ）插入在闪烁体层（5）和反射层（9）之间。 发光层（7）可以包括OLED，并且可以制成具有小于50μm的厚度。 因此，可以提高X射线检测器的灵敏度和分辨率。
-
公开(公告)号：US20110169024A1
公开(公告)日：2011-07-14
申请号：US13054668
申请日：2009-07-22
CPC分类号： H01L51/5036
摘要： A method is presented for reducing the light output capacity of light emitting components (C1, C2, C3), each with a different absorption band, of an OLED device (1). By irradiating at least a portion of each light emitting component (C1, C2, C3) with light (L) having a wavelength within at least one of the absorption bands, the light output capacity of the irradiated portion (P, P1, P2, P3) of each organic light emitting component having a light absorption band in which the wavelength of the light (L) is included is reduced. An OLED device (1) is also presented.
摘要翻译： 提出了一种用于降低OLED器件（1）的各自具有不同吸收带的发光元件（C1，C2，C3）的光输出能力的方法。 通过用具有至少一个吸收带内的波长的光（L）照射每个发光成分（C1，C2，C3）的至少一部分，照射部分（P，P1，P2， 具有包含光（L）的波长的光吸收带的每个有机发光部件的P3（P3）减小。 还提出了OLED器件（1）。
-
公开(公告)号：US20100253229A1
公开(公告)日：2010-10-07
申请号：US12741059
申请日：2008-11-03
IPC分类号： H05B39/02
CPC分类号： H05B33/08 , H05B37/0272
摘要： This invention relates to a luminaire comprising an OLED device, where a light detecting function of the OLED device is employed for transmitting light setting commands to the luminaire from a remote position by means of a control light signal, which carries command information. The control light signal has a header portion, which can be recognized by the luminaire and makes it ready to receive a command, and a following control command portion.
摘要翻译： 本发明涉及一种包括OLED器件的照明器，其中采用OLED器件的光检测功能，通过携带命令信息的控制光信号从远程位置向光源发射光设定命令。 控制光信号具有可由灯具识别并使其准备好接收命令的报头部分和后续控制命令部分。
-
10.发明申请MICROELECTRONIC SENSOR DEVICE FOR OPTICAL EXAMINATIONS WITH TOTAL INTERNAL REFLECTION 审中-公开用于内部反射光学检测的微电子传感器装置公开(公告)号：US20100197038A1
公开(公告)日：2010-08-05
申请号：US12669844
申请日：2008-07-21
IPC分类号： G01N21/75
CPC分类号： G01N21/552 , G01N21/59 , G01N21/648 , G01N33/54326
摘要： The invention relates to a microelectronic sensor device for optical examinations like the detection of target components that comprise label particles (1), for example magnetic particles (1). An input light beam (L1) is transmitted into a carrier (111) and totally internally reflected at a binding surface (112) to yield a “TIR-beam of first order” (LTIR(1)), which is redirected by a mirroring system (e.g. reflective 5 facets (114)) to the binding surface (112), where it is again totally internally reflected as a “TIR-beam of second order” (LTIR(2)), and so on. Finally, an output light beam (L2) comprising light of the “TIR-beam of (N+1)-th order”, with a given natural number N, leaves the carrier to be detected by a light detector (31).
摘要翻译： 本发明涉及一种用于光学检查的微电子传感器装置，例如检测包括标签颗粒（1）的目标部件，例如磁性颗粒（1）。 输入光束（L1）被传输到载体（111）中，并且在结合表面（112）处被全内反射以产生“一阶的TIR波束”（LTIR（1）），其被镜像 系统（例如反射的5个面（114））到结合表面（112），其中它再次完全内部反射为“二阶TIR波束”（LTIR（2））等等。 最后，包含具有给定自然数N的“（N + 1）次的TIR光束”的光的输出光束（L2）离开要由光检测器（31）检测的载体。
-
-
-
-
-
-
-
-
-
搜索结果
54 条记录 (耗时 0.058 秒)
