摘要:
A support rail for a vehicle has an A-pillar portion and a roof rail portion. The roof rail and A-pillar are formed with a tubular body portion and longitudinally extending support flanges. The support flanges are formed by pinching the blank during the hydroforming process to provide a double thickness flange. A windshield support flange, roof support flange and door opening flange are formed to extend outwardly from the tubular body portion. Front and rear tube connectors include blind openings or notches to facilitate welding.
摘要:
A pillar to rocker joint assembly comprising a tubular pillar having a pinched flange near a lower end of the pillar is joined to a rocker assembly including a side sill and rocker reinforcement. A method of making a pillar to rocker joint assembly that comprises a vehicle structural support is formed by welding a structural support pillar to an outer body panel through an access opening in the pillar and welding a rocker reinforcement to a side sill. The rocker reinforcement is welded to the pillar through an access opening in the side sill, an access hole in the body outer panel, and an access opening in the pillar that is vertically spaced relative to the first access opening. A bottom flange of the B-pillar is welded to a lower edge flange of the rocker reinforcement and a lower edge flange of the side sill.
摘要:
A one-piece B-pillar having a front flange and a rear flange formed on an upper portion of the B-pillar. The front and rear flanges extend forwardly and rearwardly from a trapezoidal section of the B-pillar. An inner concave portion is provided in a lower portion of the B-pillar. The one-piece B-pillar is secured to the outer and upper surfaces of a roof rail and to the outer surface of a rocker to provide side impact strength. The B-pillar is hydroformed in one-piece to provide superior strength for roof crush performance. The tubular portion of the B-pillar is partially collapsed to form a trapezoidal section in the upper portion of the B-pillar.
摘要:
A photomask assembly and method for protecting the photomask assembly from contaminants generated during a lithography process are disclosed. A photomask assembly includes a pellicle assembly formed from a pellicle frame and a pellicle film coupled to a first surface of the pellicle frame. The pellicle frame further includes an inner wall and an outer wall. A photomask is coupled to a second surface of the pellicle frame opposite the pellicle film. A molecular sieve that prevents airborne molecular contaminants (AMCs) generated during a lithography process from contaminating the photomask is associated with the pellicle assembly.
摘要:
A method and apparatus evaluates the runability of a photomask inspection tool that inspects plural sets of die, each die having a standard simulated industrial device feature at plural technology nodes. A technology node size is determined for each feature at which inspection by the tool provides no false detection of faults. A sensitivity module included on a photomask test plate along with a runability module allows determination of inspection tool sensitivity and runability in a single test sequence.
摘要:
FIG. 1 is a perspective view of an LED flashlight, showing my new design; FIG. 2 is another perspective view thereof; FIG. 3 is a front view thereof; FIG. 4 is a rear view thereof; FIG. 5 is a left side side view thereof; FIG. 6 is a right side view thereof; FIG. 7 is a top plan view thereof; and, FIG. 8 is a bottom plan view thereof. The broken lines depict portions of the LED flashlight that form no part of the claimed design.
摘要:
A rapid and automatic virus imaging and analysis system includes (i) electron optical sub-systems (EOSs), each of which has a large field of view (FOV) and is capable of instant magnification switching for rapidly scanning a virus sample; (ii) sample management sub-systems (SMSs), each of which automatically loads virus samples into one of the EOSs for virus sample scanning and then unloads the virus samples from the EOS after the virus sample scanning is completed; (iii) virus detection and classification sub-systems (VDCSs), each of which automatically detects and classifies a virus based on images from the EOS virus sample scanning; and (iv) a cloud-based collaboration sub-system for analyzing the virus sample scanning images, storing images from the EOS virus sample scanning, and storing and analyzing machine data associated with the EOSs, the SMSs, and the VDCSs.
摘要:
The present invention provides an apparatus of charged-particle beam e.g. an electron microscope comprising an in-column plasma generator for selectively cleaning BSE detector and BF/DF detector. The plasma generator is located between a lower pole piece of objective lens and the BF/DF detectors, but outside trajectory area of the charged-particles from the sample stage to the BF/DF detector.
摘要:
The present invention provides a driving system comprising two actuators for moving a stage through two elastic connectors; and a general apparatus/device comprising such a driving system, such as a machine tool, an analytical instrument, an optical microscope, and an apparatus of charged-particle beam such as electron microscope and an electron beam lithographical apparatus. When used in an electron microscope, the stage can be used as a specimen stage or a plate having apertures for electron beam to pass through. The novel stage driving system exhibits numerous technical merits such as simpler structure, better manufacturability, improved cost-effectiveness, and higher reliability, among others.
摘要:
The present invention provides a digital high-resolution detector for detecting X-ray, UV light or charged particles. In various embodiments, the digital detector comprises an array of CMOS or CCD pixels and a layer of conversion material on top of the array designed for converting incident X-ray, UV light or charged particles into photons for CMOS or CCD sensors to capture. The thin and high-resolution detector of the invention is particularly useful for monitoring and aligning beams in, and optimizing system performance of, an apparatus of charged-particle beam e.g. an electron microscope.