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公开(公告)号：US20220108865A1
公开(公告)日：2022-04-07
申请号：US17302031
申请日：2021-04-21
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
IPC: H01J37/141 , H01J37/147 , H01J37/20 , H01J37/28
Abstract: The present invention provides an apparatus of charged-particle beam such as an electron microscope with co-condensers. A source of charged particles is configured to emit a beam of charged particles, and the co-condensers including two or more magnetic condensers are configured to coherently focus the beam to a single crossover spot. The invention exhibits numerous technical merits such as continuous image resolution tuning, and automatic switching between multiple resolutions, among others.
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公开(公告)号：US11295927B1
公开(公告)日：2022-04-05
申请号：US17302031
申请日：2021-04-21
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
IPC: H01J37/141 , H01J37/147 , H01J37/28 , H01J37/20
Abstract: The present invention provides an apparatus of charged-particle beam such as an electron microscope with co-condensers. A source of charged particles is configured to emit a beam of charged particles, and the co-condensers including two or more magnetic condensers are configured to coherently focus the beam to a single crossover spot. The invention exhibits numerous technical merits such as continuous image resolution tuning, and automatic switching between multiple resolutions, among others.
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公开(公告)号：US20220115204A1
公开(公告)日：2022-04-14
申请号：US17644789
申请日：2021-12-17
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
IPC: H01J37/26 , H01J37/244 , B08B7/00
Abstract: The present invention provides an apparatus of charged-particle beam e.g. an electron microscope comprising an in-column plasma generator for selectively cleaning BSE detector and BF/DF detector. In various embodiments, the plasma generator is located between a lower pole piece of objective lens and the BF/DF detectors, but outside trajectory area of the charged-particles from the sample stage to the BF/DF detector. Cleaning decomposed biological samples or contaminants on the surface of the detectors frequently and selectively with in-situ generated plasma can prevent the detectors from performance deterioration such as losing resolution and contrast in imaging at high levels of magnification.
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公开(公告)号：US20220108869A1
公开(公告)日：2022-04-07
申请号：US17444192
申请日：2021-08-01
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
IPC: H01J37/28 , H01J37/20 , H01J37/317 , H01J37/141
Abstract: The present invention provides a driving system comprising two actuators for moving a stage through two elastic connectors; and a general apparatus/device comprising such a driving system, such as a machine tool, an analytical instrument, an optical microscope, and an apparatus of charged-particle beam such as electron microscope and an electron beam lithographical apparatus. When used in an electron microscope, the stage can be used as a specimen stage or a plate having apertures for electron beam to pass through. The novel stage driving system exhibits numerous technical merits such as simpler structure, better manufacturability, improved cost-effectiveness, and higher reliability, among others.
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公开(公告)号：US11257659B1
公开(公告)日：2022-02-22
申请号：US17302820
申请日：2021-05-12
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
IPC: H01J37/28 , H01J37/153 , H01J37/147 , H01J37/14
Abstract: The present invention provides an electrode assembly comprising two or more electrodes arranged around a primary axis forming a non-cylindrical channel space. General electronic apparatus/device, particularly apparatus of charged-particle beam such as electron microscope, may use the electrode assembly to create an optimized pattern of electrical field within non-cylindrical channel space. When the electrode assembly is used as a beam deflector in a magnetic objective lens, the electrical field within the central channel space can be co-optimized with the magnetic field for reducing aberration(s) such as distortion, field curvature, astigmatism, and chromatic aberration, after the beam passes through the central channel space.
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Patent Agency Ranking
公开(公告)号：US11094499B1
公开(公告)日：2021-08-17
申请号：US17178249
申请日：2021-02-18
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Abstract: The present invention provides an apparatus of charged-particle beam such as an electron microscope including a specimen table that can slide on a planar surface around the lower pole piece of the objective lens. The specimen table is confined in a specimen stage having one elastic protrusion and one or more elastic force receiving parts (e.g three permanent protrusions) that contact and press the table. When the specimen is under microscopic examination, disturbing vibration cannot generate a force sufficient to overcome the limiting friction between the specimen table and the planar surface of the objective lens. The invention exhibits numerous technical merits such as minimal or zero vibration noise, and improved image quality, among others.
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公开(公告)号：US11593938B2
公开(公告)日：2023-02-28
申请号：US17452999
申请日：2021-10-31
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Abstract: A rapid and automatic virus imaging and analysis system includes (i) electron optical sub-systems (EOSs), each of which has a large field of view (FOV) and is capable of instant magnification switching for rapidly scanning a virus sample; (ii) sample management sub-systems (SMSs), each of which automatically loads virus samples into one of the EOSs for virus sample scanning and then unloads the virus samples from the EOS after the virus sample scanning is completed; (iii) virus detection and classification sub-systems (VDCSs), each of which automatically detects and classifies a virus based on images from the EOS virus sample scanning; and (iv) a cloud-based collaboration sub-system for analyzing the virus sample scanning images, storing images from the EOS virus sample scanning, and storing and analyzing machine data associated with the EOSs, the SMSs, and the VDCSs.
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公开(公告)号：US11569059B2
公开(公告)日：2023-01-31
申请号：US17644789
申请日：2021-12-17
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
IPC: H01J37/26 , B08B7/00 , H01J37/244
Abstract: The present invention provides an apparatus of charged-particle beam e.g. an electron microscope comprising an in-column plasma generator for selectively cleaning BSE detector and BF/DF detector. The plasma generator is located between a lower pole piece of objective lens and the BF/DF detectors, but outside trajectory area of the charged-particles from the sample stage to the BF/DF detector.
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公开(公告)号：US11355312B2
公开(公告)日：2022-06-07
申请号：US17444192
申请日：2021-08-01
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
IPC: H01J37/28 , H01J37/20 , H01J37/317 , H01J37/141
Abstract: The present invention provides a driving system comprising two actuators for moving a stage through two elastic connectors; and a general apparatus/device comprising such a driving system, such as a machine tool, an analytical instrument, an optical microscope, and an apparatus of charged-particle beam such as electron microscope and an electron beam lithographical apparatus. When used in an electron microscope, the stage can be used as a specimen stage or a plate having apertures for electron beam to pass through. The novel stage driving system exhibits numerous technical merits such as simpler structure, better manufacturability, improved cost-effectiveness, and higher reliability, among others.
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公开(公告)号：US20220108867A1
公开(公告)日：2022-04-07
申请号：US17305514
申请日：2021-07-08
Applicant: Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
Inventor： Zhongwei Chen , Xiaoming Chen , Daniel Tang , Liang-Fu Fan
IPC: H01J37/244 , H01J37/28 , H01J37/22
Abstract: The present invention provides a digital high-resolution detector for detecting X-ray, UV light or charged particles. In various embodiments, the digital detector comprises an array of CMOS or CCD pixels and a layer of conversion material on top of the array designed for converting incident X-ray, UV light or charged particles into photons for CMOS or CCD sensors to capture. The thin and high-resolution detector of the invention is particularly useful for monitoring and aligning beams in, and optimizing system performance of, an apparatus of charged-particle beam e.g. an electron microscope.
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