Compact opto-electric probe
    41.
    发明授权

    公开(公告)号:US11747363B2

    公开(公告)日:2023-09-05

    申请号:US17552847

    申请日:2021-12-16

    摘要: Described are various configurations for performing efficient optical and electrical testing of an opto-electrical device using a compact opto-electrical probe. The compact opto-electrical probe can include electrical contacts arranged for a given electrical contact layout of the opto-electrical device, and optical interface with a window in a probe core that transmits light from the opto-electrical device. An adjustable optical coupler of the probe can be mechanically positioned to receive light from the device's emitter to perform simultaneous optical and electrical analysis of the device.

    Smooth waveguide structures and manufacturing methods

    公开(公告)号:US11513288B2

    公开(公告)日:2022-11-29

    申请号:US17146956

    申请日:2021-01-12

    摘要: In integrated optical structures (e.g., silicon-to-silicon-nitride mode converters) implemented in semiconductor-on-insulator substrates, wire waveguides whose sidewalls substantially consist of portions coinciding with crystallographic planes and do not extend laterally beyond the top surface of the wire waveguide may provide benefits in performance and/or manufacturing needs. Such wire waveguides may be manufactured, e.g., using a dry-etch of the semiconductor device layer down to the insulator layer to form a wire waveguide with exposed sidewalls, followed by a smoothing crystallographic wet etch.

    On-chip photonic integrated circuit optical validation

    公开(公告)号:US11499923B2

    公开(公告)日:2022-11-15

    申请号:US17038422

    申请日:2020-09-30

    摘要: Photonic errors in a photonic integrated circuit can be imaged using an on-chip light source integrated in a photonic layer of the circuit. The on-chip light source can generate light at wavelengths that propagates through one or more substrate layers to an image sensor sensitive to the wavelength range. The on-chip light source can be tunable and provide different power settings that can be utilized to detect different types of optical errors in the photonic integrated circuit.

    Optical cladding layer design
    49.
    发明授权

    公开(公告)号:US11430901B2

    公开(公告)日:2022-08-30

    申请号:US17065180

    申请日:2020-10-07

    摘要: Embodiments of the invention describe apparatuses, optical systems, and methods related to utilizing optical cladding layers. According to one embodiment, a hybrid optical device includes a silicon semiconductor layer and a III-V semiconductor layer having an overlapping region, wherein a majority of a field of an optical mode in the overlapping region is to be contained in the III-V semiconductor layer. A cladding region between the silicon semiconductor layer and the III-V semiconductor layer has a spatial property to substantially confine the optical mode to the III-V semiconductor layer and enable heat dissipation through the silicon semiconductor layer.