Rotor tip clearance
    41.
    发明授权
    Rotor tip clearance 有权
    转子顶端间隙

    公开(公告)号:US09546564B2

    公开(公告)日:2017-01-17

    申请号:US14223447

    申请日:2014-03-24

    申请人: ROLLS-ROYCE PLC

    发明人: Leo Vivian Lewis

    摘要: A method of characterizing mechanical and thermal growth of a rotor tip clearance arrangement and a method of controlling such an arrangement. The characterization method comprising constructing a finite element model and calibration cases; run the model for the calibration cases to obtain displacements; and calculating component growth therefrom. The growth is characterized and scaled for the operating conditions. The clearance is calculated in a time step from the growths and input to a control arrangement for subsequent time steps.

    摘要翻译: 表征转子顶端间隙布置的机械和热生长的方法和控制这种布置的方法。 表征方法包括构建有限元模型和校准案例; 运行校准案例的模型以获得位移; 并计算其成分。 增长的特点和规模的运行条件。 间隔在从增长和输入到随后的时间步长的控制装置的时间步长中计算。

    System of measuring warpage and method of measuring warpage
    42.
    发明授权
    System of measuring warpage and method of measuring warpage 有权
    翘曲测量系统和翘曲测量方法

    公开(公告)号:US09470635B2

    公开(公告)日:2016-10-18

    申请号:US14048703

    申请日:2013-10-08

    IPC分类号: G01N21/88 G01B11/30 G01N25/16

    摘要: Disclosed herein are a system of measuring a warpage and a method of measuring a warpage. The system of measuring a warpage of a sample by analyzing an image photographed by the camera using light that is diffused from a light source and reflected on a surface of a sample and is arrived at the camera through a reference grating part, the system includes: an intake part that removes a fume generated from the sample. By this configuration, it is possible to measure the warpage while effectively removing the fume generated from the sample according to the increase in the temperature of the sample at the time of measuring the warpage, thereby improving the accuracy of the warpage measurement.

    摘要翻译: 这里公开了测量翘曲的系统和测量翘曲的方法。 通过使用从光源扩散并在样品表面上反射的光通过分析由相机拍摄的图像并通过参考光栅部件到达相机的方式来测量样品的翘曲的系统,该系统包括: 一个摄取部分去除样品产生的烟雾。 通过该结构,可以根据测定翘曲时的试样的温度的上升而有效地除去样品产生的烟雾,能够测量翘曲,提高翘曲测定精度。

    THERMAL DISPLACEMENT CORRECTION DEVICE FOR MACHINE TOOL
    43.
    发明申请
    THERMAL DISPLACEMENT CORRECTION DEVICE FOR MACHINE TOOL 有权
    用于机床的热位移校正装置

    公开(公告)号:US20150276633A1

    公开(公告)日:2015-10-01

    申请号:US14670719

    申请日:2015-03-27

    申请人: FANUC CORPORATION

    IPC分类号: G01N25/16 G01M99/00

    摘要: A thermal displacement correction device for a machine tool is provided with detection result determination unit configured to determine, based on an actual position and a reference position detected by position detection unit, whether or not the actual position is based on correct detection, correction error calculation unit configured to calculate a correction error in the actual position if it is determined that the result of detection is based on correct detection, and correction amount modification unit configured to modify a thermal displacement correction amount based on the correction error.

    摘要翻译: 设置有用于机床的热位移校正装置,检测结果确定单元被配置为基于由位置检测单元检测到的实际位置和基准位置来确定实际位置是否基于正确检测,校正误差计算 如果确定检测结果是基于正确的检测,则被配置为计算实际位置中的校正误差的单元,以及被配置为基于校正误差来修改热位移校正量的校正量修改单元。

    WAFER OR RETICLE THERMAL DEFORMATION MEASURING TECHNIQUES
    44.
    发明申请
    WAFER OR RETICLE THERMAL DEFORMATION MEASURING TECHNIQUES 有权
    散热或热变形测量技术

    公开(公告)号:US20150204665A1

    公开(公告)日:2015-07-23

    申请号:US14159604

    申请日:2014-01-21

    IPC分类号: G01B21/32 G01N25/16

    CPC分类号: G01B21/32 G01N25/16

    摘要: A system includes a wafer stage adapted to hold a semiconductor wafer thereon. A moveable temperature sensor array is configured to move to a plurality of different positions over a surface of the wafer stage and to take a plurality of temperature measurements at the plurality of positions, respectively. Based on the plurality of temperature measurements, a controller is adapted to determine an expected thermal deformation for the semiconductor wafer or for a reticle arranged over the semiconductor wafer.

    摘要翻译: 系统包括适于在其上保持半导体晶片的晶片台。 可移动温度传感器阵列被配置为移动到晶片台的表面上的多个不同位置并且分别在多个位置处进行多个温度测量。 基于多个温度测量,控制器适于确定半导体晶片或布置在半导体晶片上的掩模版的预期热变形。

    METHOD, APPARATUS, AND STRUCTURE FOR DETERMINING INTERPOSER THICKNESS
    45.
    发明申请
    METHOD, APPARATUS, AND STRUCTURE FOR DETERMINING INTERPOSER THICKNESS 有权
    方法,装置和结构确定间距厚度

    公开(公告)号:US20150153406A1

    公开(公告)日:2015-06-04

    申请号:US14554088

    申请日:2014-11-26

    摘要: The present invention includes the following steps: setting the thickness of an interposer to an initial value; determining the axial force of the interposer and the radius of curvature of the warpage caused by the difference in the thermal expansion coefficients of the supporting substrate, the joined layer and the interposer at the set thickness; determining the absolute value of the stress on the chip-connecting surface of the interposer from the stress due to the axial force of the interposer and the stress due to the warpage using the determined axial force and the radius of curvature; determining whether or not the absolute value of the stress is within a tolerance; changing the thickness of the interposer by a predetermined value; and confirming the set thickness as the thickness of the interposer when the determined absolute value of the stress is within the tolerance.

    摘要翻译: 本发明包括以下步骤:将中介层的厚度设定为初始值; 确定插入件的轴向力和由设定厚度的支撑基板,接合层和插入件的热膨胀系数的差异引起的翘曲的曲率半径; 确定插入件的芯片连接表面上的应力的绝对值与由插入件的轴向力引起的应力和使用所确定的轴向力和曲率半径的翘曲引起的应力; 确定应力的绝对值是否在容差内; 将所述插入件的厚度改变预定值; 并且当确定的应力绝对值在公差内时,将设定厚度确认为中介层的厚度。

    Ultrasensitive ratiometric capacitance dilatometer and related methods
    46.
    发明授权
    Ultrasensitive ratiometric capacitance dilatometer and related methods 有权
    超敏感比例电容膨胀计及相关方法

    公开(公告)号:US08992077B2

    公开(公告)日:2015-03-31

    申请号:US14042665

    申请日:2013-09-30

    IPC分类号: G01N25/56 G01N25/16 G01N27/22

    CPC分类号: G01N25/16 G01B7/22 G01N27/226

    摘要: An ultrasensitive ratiometric capacitance dilatometer and related methods are described. The dilatometer provides a capacitance measurement based on a ratiometric capacitance, or the capacitance ratio measured between two or more parallel plate capacitors of the dilatometer. In this regard, an absolute capacity bridge is not required, and even more advantageously, the effects of adsorbed gas are greatly reduced compared to conventional dilatometers. The ratiometric capacitance dilatometer provides a symmetrical configuration, which reduces the effects of temperature gradients. Moreover, certain embodiments provide a “v-groove design”, wherein a first parallel plate capacitor forms an angle with a second parallel plate capacitor of the dilatometer along a key centerline of the dilatometer cell, which improves manufacturability due to simpler grinding, metalizing and assembly.

    摘要翻译: 描述了超灵敏比率电容膨胀计及相关方法。 膨胀计提供基于比例电容或在膨胀计的两个或更多个平行板电容器之间测量的电容比的电容测量。 在这方面,不需要绝对容量的桥,并且甚至更有利地,与传统的膨胀计相比,吸附的气体的效果大大降低。 比例电容膨胀计提供对称配置,可以降低温度梯度的影响。 此外,某些实施例提供了一种“V沟槽设计”,其中第一平行板电容器沿着膨胀计单元的关键中心线与膨胀计的第二平行板电容器形成一个角度,从而通过更简单的研磨,金属化和改善制造性而提高可制造性 部件。

    Method for determining the thermal expansion coefficient of ceramic bodies and glazes
    48.
    发明授权
    Method for determining the thermal expansion coefficient of ceramic bodies and glazes 有权
    确定陶瓷体和釉料的热膨胀系数的方法

    公开(公告)号:US07722246B1

    公开(公告)日:2010-05-25

    申请号:US11110586

    申请日:2005-04-20

    申请人: William M. Carty

    发明人: William M. Carty

    IPC分类号: G01N25/16

    CPC分类号: G01N25/16 Y10S252/96

    摘要: A method of measuring the coefficient of thermal expansion of a ceramic material, including the steps of applying a glaze to a substantially densified refractory body, wherein the coefficient of thermal expansion of either the glaze or the body is known, bonding the glaze to the body, putting the glaze insufficient tension to induce crazing, measuring the average distance between cracks in the crazed glaze; and determining the unknown coefficient of thermal expansion of the glaze or body.

    摘要翻译: 一种测量陶瓷材料的热膨胀系数的方法,包括将釉料施加到基本致密化的耐火材料体上的步骤,其中已知釉料或者釉体的热膨胀系数,将釉料结合到本体 ,使釉料不足以引起裂纹,测量釉料中裂纹之间的平均距离; 并确定釉料或身体的未知热膨胀系数。

    Rapid and Easy Bottle Test
    49.
    发明申请
    Rapid and Easy Bottle Test 失效
    快速和容易的瓶子测试

    公开(公告)号:US20090310647A1

    公开(公告)日:2009-12-17

    申请号:US12522039

    申请日:2008-01-24

    IPC分类号: G01N25/16

    摘要: A method for predicting the drop impact resistance of a stretch-blow moulded polypropylene container which comprises the steps of measuring the initial size of the container, placing it in an oven, remeasuring its size after removing it from the oven, calculating the percentage difference in size of the container and determining its drop impact resistance, which is proportional to said difference.

    摘要翻译: 一种用于预测拉伸吹塑聚丙烯容器的耐滴落冲击性的方法,包括以下步骤:测量容器的初始尺寸,将其放置在烘箱中,在从烘箱中取出之后重新测量其尺寸,计算出百分比差 容器的尺寸并确定其与所述差成比例的落下冲击阻力。

    Furnace for performing dilatometric assays
    50.
    发明申请
    Furnace for performing dilatometric assays 审中-公开
    用于进行膨胀测定的炉

    公开(公告)号:US20070248493A1

    公开(公告)日:2007-10-25

    申请号:US11790269

    申请日:2007-04-24

    申请人: Heinz Baehr

    发明人: Heinz Baehr

    IPC分类号: G01N31/12

    CPC分类号: G01N25/16 G01N25/4826

    摘要: A furnace for performing dilatometric assays includes a closable sample chamber on which windows for the passage of beams are provided, a sample carrier having a horizontal contact surface for receiving samples situated in the sample chamber and the sample chamber being heatable via one or more heating elements. The heating elements are implemented as essentially flat on the side facing toward the sample carrier and delimit the sample chamber on the top side and the bottom side, the heating elements extending on all sides beyond the sample carrier in the horizontal direction. An especially uniform temperature distribution on the sample is thus ensured.

    摘要翻译: 用于进行膨胀测定的炉包括一个可关闭的样品室,在其上提供用于通过光束的窗口,具有水平接触表面的样品载体,用于接收位于样品室中的样品,并且样品室可通过一个或多个加热元件加热 。 加热元件在面向样品载体的一侧被实施为基本上平坦的,并且在顶侧和底侧限定了样品室,加热元件在水平方向上在所有侧面上延伸超出样品载体。 因此确保了样品上特别均匀的温度分布。