Abstract:
An exposed two-dimensional sensor and an exposed two-dimensional sensor in the camera compartment of an electron microscope are shielded against X-rays by respective covers. When a two-dimensional sensor is outside the protective covers during recording, the electron beam from the electron gun of the electron microscope is deflected and blocked by the diaphragm, thereby preventing generation of X-rays due to scattered electrons in the camera compartment. Such an arrangement makes a mechanical shutter unnecessary so that it is possible to prevent exposure of the two-dimentional sensors due to X-rays generated at the shutter and exposure of the two-dimensional sensors due to X-rays generated by scattered electrons in the camera compartment.
Abstract:
In a system for outputting an electron microscope image, a two-dimensional sensor for storing electron beam energy thereon is exposed to an electron beam passing through a specimen in a vacuum to have the electron beam energy stored on the two-dimensional sensor, and is then exposed to light or heat to release the stored energy as light emission. The emitted light is photoelectrically detected to obtain image signals, and an electron beam image of the specimen is output on the basis of the image signals. The specimen is divided into a plurality of divisions, and the storage of the electron beam energy is carried out for each of the divisions. The image signals obtained at the divisions are combined to form composite image signals that represent an overall specimen image formed by a group of the divisions, and the image signals at the divisions are corrected so that signal values of the boundary areas of adjacent divisions become approximately equal to each other.
Abstract:
An apparatus for recording and reproducing an image of a specimen produced by an electron microscope includes a two-dimensional image sensor for storing the energy of an electron beam having passed through the specimen, a stimulating system for scanning the two-dimensional image sensor with stimulating energy to discharge the stored electron beam energy as light from the two-dimensional image sensor, a photoelectric transducer for photoelectrically detecting the light discharged from the two-dimensional image sensor, and an erasing system for applying erasing energy to the two-dimensional image sensor to discharge energy remaining thereon after the light has been photoelectrically detected.
Abstract:
A stimulable phosphor sheet is exposed to an electron beam having passed through a specimen in an electron microscope to record a first magnified image of the specimen on the sheet. A stimulating energy is applied to the sheet for discharging light therefrom which represents the first magnified image. The light discharged from the image sensor is photoelectrically detected to reproduce the first magnified image which can be observed to attain a desired focused condition and/or a desired field on the electron microscope. Then, the same or another stimulable phosphor sheet is exposed to the electron beam to record a second magnified image of the specimen on the sheet, and the second magnified image is reproduced as a final image under the desired focused condition and/or with the desired field.
Abstract:
An improved transmission-type, scanning charged-particle beam microscope including a television camera tube and a television display tube for generating and displaying a diffraction image of a specimen to be examined. The improvement of the invention comprises the provision of a transparent fluorescent screen disposed in the ray cone of the beam behind the specimen along the beam path in the microscope, light-optical means adapted for imaging the fluorescent screen on a target of the television camera tube, and detector means for integrally detecting radiation emanating from the fluorescent screen.
Abstract:
A scanning transmission electron microscope includes means for irradiating with a finely focussed electron beam a sample to be observed within an evacuated chamber, means for scanning the surface of said sample with said electron beam, means for transducing an image of electron beam passed through said sample into an image formed by the light beam, light transmission means for transmitting said light beam image to the outside of said evacuated chamber, light interrupting means adapted to allow a selected part of said light beam image to pass while interrupting the other part of said image and light detecting means adapted to detect said part of said light beam which is allowed by said interrupting means to pass.
Abstract:
A camera for photographing Kossel lines caused by irradiating crystalline specimens with electron beams is disclosed. Previously such photographs were taken either by back reflection or transmission methods with the plane of the photographic plate perpendicular to the beam axis. This causes numerous disadvantages. In the present embodiment the photographs are taken in a plane parallel to the electron beam, and technique for interpreting the photographs so taken is fully explained.
Abstract:
A method of recording an electron image, in which a metal of high reflectivity is vacuum-evaporate on a substrate of glass, plastic, or the like, an electronic image is irradiated onto the organic film coated on the metal thereby to record the image by giving the reaction of polymerization, cross-linking, or degradation to said organic material to the extent corresponding to the irradiation intensity, and then the image is obtained which is quantitatively corresponding to the intensity distribution of the incident electrons by again vacuumevaporating a metal of high reflectivity on the recorded image. Further, a method of recording an electronic image, in which the sensitivity of a recording plate is improved by using a preexposure method, whereby a recordable exposure range is increased thereby to control the lightness and color of the image.
Abstract:
An electron microscope comprising a microscope chamber having a passageway extending therethrough and a film mechanism for driving an electron stimulated means, or film plate, into the microscope chamber. The film mechanism includes a tray disposed within the microscope chamber and communicating with the passageway, a closure member positioned across the passageway for preventing the passage of X-rays through the passageway, a storage chamber disposed externally of the microscope for storing a film plate, and transport means for driving a film plate from the storage chamber to the tray so that the film plate is moved to a position to intercept a beam of electrons passing through an object to be viewed.