Image sensor, image capturing apparatus, and forming method

    公开(公告)号:US10163971B2

    公开(公告)日:2018-12-25

    申请号:US14117981

    申请日:2012-05-31

    申请人: Makoto Takamiya

    发明人: Makoto Takamiya

    IPC分类号: H01L27/146 H04N5/3745

    摘要: An image sensor comprising a plurality of pixels, each of at least part of the plurality of pixels comprises: a plurality of photoelectric conversion parts; a microlens; and a plurality of interlayer lenses formed between the plurality of photoelectric conversion parts and the microlens and integrally formed to correspond to the plurality of photoelectric conversion parts. The plurality of interlayer lenses cause light incident on the plurality of interlayer lenses to enter the corresponding plurality of photoelectric conversion parts.

    Image pickup element unit with an image pickup element on a substrate for picking up an image and an optical low pass filter spaced from the image pickup element
    53.
    发明授权
    Image pickup element unit with an image pickup element on a substrate for picking up an image and an optical low pass filter spaced from the image pickup element 有权
    图像拾取元件单元,其具有用于拾取图像的基板上的图像拾取元件和与图像拾取元件间隔开的光学低通滤波器

    公开(公告)号:US08199231B2

    公开(公告)日:2012-06-12

    申请号:US11837191

    申请日:2007-08-10

    申请人: Makoto Takamiya

    发明人: Makoto Takamiya

    IPC分类号: H04N5/225 G02B27/46

    CPC分类号: G02B5/1871

    摘要: An image pickup apparatus which is capable of suppressing generation of shadows even when the aperture of the photographic lens is stopped down. A digital camera as an image pickup apparatus includes a photographic lens, a image pickup element that picks up an image of an object, and an optical low-pass filter disposed between the photographic lens and the image pickup element. The filter includes a liner phase diffraction grating having unit cells which are disposed in a regular pattern at a grating pitch P and are formed by equal-width recesses and equal-width protrusions adjacent to each other. When a shortest wavelength of a reference wavelength employed is λS, and a longest wavelength of the reference wavelength is λL, an optical path difference ΔH between lengths of optical paths of light of which a phase is varied by the phase grating is larger than λS/2 and smaller than λL/2.

    摘要翻译: 即使当拍摄镜头的孔径被停止时,也能够抑制阴影的产生的摄像装置。 作为图像拾取装置的数码相机包括摄影镜头,拾取物体的图像的摄像元件和设置在摄影镜头和摄像元件之间的光学低通滤波器。 滤光器包括具有单位单元的衬垫相位衍射光栅,其以格栅间距P以规则图案设置,并且由彼此相邻的等宽度的凹槽和等宽度的突起形成。 当所使用的参考波长的最短波长为λS,并且参考波长的最长波长为λL时,由相位光栅改变相位的光的光路长度之间的光程差&Dgr; H大于 λS/ 2,小于λL/ 2。

    Focus detection apparatus, focus detection method, and image sensing apparatus
    54.
    发明授权
    Focus detection apparatus, focus detection method, and image sensing apparatus 有权
    焦点检测装置,焦点检测方法和图像感测装置

    公开(公告)号:US08159599B2

    公开(公告)日:2012-04-17

    申请号:US12636509

    申请日:2009-12-11

    申请人: Makoto Takamiya

    发明人: Makoto Takamiya

    IPC分类号: H04N5/232 G03B3/10

    CPC分类号: H04N5/23212 G02B7/28

    摘要: A focus detection apparatus includes an image sensor which includes a pair of pixel groups, outputs a first image signal from one of the pair of pixel groups, and outputs a second image signal from the other of the pair of pixel groups, where the pair of pixel groups receive luminous fluxes passing different pupil regions of an imaging optical system which forms an object image; a calculation unit which generates a first corrected image signal by subtracting the second image signal multiplied by a coefficient from the first image signal and generates a second corrected image signal by subtracting the first image signal multiplied by a coefficient from the second image signal; and a focus detection unit which detects a defocus amount based on a phase difference between the first corrected image signal and the second corrected image signal generated by the calculation unit.

    摘要翻译: 焦点检测装置包括包括一对像素组的图像传感器,从该对像素组中的一个输出第一图像信号,并输出来自该对像素组中的另一个的第二图像信号,其中, 像素组接收通过形成对象图像的成像光学系统的不同瞳孔区域的光通量; 计算单元,通过从第一图像信号中减去乘以系数的第二图像信号来产生第一校正图像信号,并通过从第二图像信号中减去乘以系数的第一图像信号来产生第二校正图像信号; 以及焦点检测单元,其基于由所述计算单元生成的所述第一校正图像信号和所述第二校正图像信号之间的相位差来检测散焦量。

    Semiconductor integrated circuit apparatus, measurement result management system, and management server
    55.
    发明授权
    Semiconductor integrated circuit apparatus, measurement result management system, and management server 有权
    半导体集成电路设备,测量结果管理系统和管理服务器

    公开(公告)号:US07911220B2

    公开(公告)日:2011-03-22

    申请号:US11512361

    申请日:2006-08-30

    IPC分类号: G01R31/28

    CPC分类号: G01R31/31709

    摘要: An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors.A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip.Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.

    摘要翻译: 目的是提供能够分析对实际工作的半导体集成电路的实际操作产生影响的因素的半导体集成电路装置,并进一步降低其因素。 作为测量对象的半导体集成电路和用于测量对该半导体集成电路的抖动或噪声抖动以及噪声等半导体集成电路的实际操作产生影响的物理量的测量电路, 配置在相同的芯片上。 此外,分析本发明的测量电路的测量结果,并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

    FOCUS DETECTION APPARATUS, FOCUS DETECTION METHOD, AND IMAGE SENSING APPARATUS
    56.
    发明申请
    FOCUS DETECTION APPARATUS, FOCUS DETECTION METHOD, AND IMAGE SENSING APPARATUS 有权
    聚焦检测装置,聚焦检测方法和图像感测装置

    公开(公告)号:US20100157094A1

    公开(公告)日:2010-06-24

    申请号:US12636509

    申请日:2009-12-11

    申请人: Makoto Takamiya

    发明人: Makoto Takamiya

    IPC分类号: H04N5/235

    CPC分类号: H04N5/23212 G02B7/28

    摘要: A focus detection apparatus includes an image sensor which includes a pair of pixel groups, outputs a first image signal from one of the pair of pixel groups, and outputs a second image signal from the other of the pair of pixel groups, where the pair of pixel groups receive luminous fluxes passing different pupil regions of an imaging optical system which forms an object image; a calculation unit which generates a first corrected image signal by subtracting the second image signal multiplied by a coefficient from the first image signal and generates a second corrected image signal by subtracting the first image signal multiplied by a coefficient from the second image signal; and a focus detection unit which detects a defocus amount based on a phase difference between the first corrected image signal and the second corrected image signal generated by the calculation unit.

    摘要翻译: 焦点检测装置包括包括一对像素组的图像传感器,从该对像素组中的一个输出第一图像信号,并输出来自该对像素组中的另一个的第二图像信号,其中, 像素组接收通过形成对象图像的成像光学系统的不同瞳孔区域的光通量; 计算单元,通过从第一图像信号中减去乘以系数的第二图像信号来产生第一校正图像信号,并通过从第二图像信号中减去乘以系数的第一图像信号来产生第二校正图像信号; 以及焦点检测单元,其基于由所述计算单元生成的所述第一校正图像信号和所述第二校正图像信号之间的相位差来检测散焦量。

    Optical apparatus and image-taking system
    57.
    发明授权
    Optical apparatus and image-taking system 失效
    光学仪器和摄像系统

    公开(公告)号:US07616879B2

    公开(公告)日:2009-11-10

    申请号:US11244509

    申请日:2005-10-05

    IPC分类号: G02B7/28

    摘要: There is provided an optical apparatus that provides quick and precise TTL phase difference detection and pupil slicing focus detection. An optical apparatus includes a first optical element for splitting a first polarized light component contained in light that passes an exit pupil of a first optical system and directs to a photoelectric conversion element so that the first polarized light component direct to different light-receiving areas on the photoelectric conversion element. The optical apparatus may further include a second optical element for separating a second polarized light component contained in the light from said first optical element, from the first polarized light component.

    摘要翻译: 提供了一种提供快速和精确的TTL相位差检测和瞳孔切片焦点检测的光学装置。 一种光学装置包括:第一光学元件,用于分离包含在通过第一光学系统的出射光瞳的光中的第一偏振光分量,并引导到光电转换元件,使得第一偏振光分量直接导向不同的光接收区域 光电转换元件。 光学装置还可以包括用于将包含在光中的第二偏振光分量与第一偏振光分量分离的第二光学元件。

    Semiconductor integrated circuit apparatus, measurement result management system, and management server
    58.
    发明授权
    Semiconductor integrated circuit apparatus, measurement result management system, and management server 失效
    半导体集成电路设备,测量结果管理系统和管理服务器

    公开(公告)号:US07307439B2

    公开(公告)日:2007-12-11

    申请号:US10926364

    申请日:2004-08-26

    IPC分类号: G01R31/02

    CPC分类号: G01R31/31709

    摘要: A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

    摘要翻译: 更具体地说,提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。 更具体地,是作为测量对象的半导体集成电路,以及测量对半导体集成电路的实际操作(例如抖动或噪声抖动)和该半导体集成的噪声产生影响的物理因素的测量电路 电路设置在相同的芯片上; 此外,分析本发明的测量电路的测量结果,并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

    Semiconductor integrated circuit apparatus, measurement result management system, and management server
    59.
    发明申请
    Semiconductor integrated circuit apparatus, measurement result management system, and management server 有权
    半导体集成电路设备,测量结果管理系统和管理服务器

    公开(公告)号:US20060290373A1

    公开(公告)日:2006-12-28

    申请号:US11512361

    申请日:2006-08-30

    IPC分类号: G01R31/26

    CPC分类号: G01R31/31709

    摘要: An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.

    摘要翻译: 目的是提供能够分析对实际工作的半导体集成电路的实际操作产生影响的因素的半导体集成电路装置,并进一步降低其因素。 作为测量对象的半导体集成电路和用于测量对该半导体集成电路的抖动或噪声抖动以及噪声等半导体集成电路的实际操作产生影响的物理量的测量电路, 配置在相同的芯片上。 此外,分析本发明的测量电路的测量结果,并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

    Optical apparatus
    60.
    发明申请
    Optical apparatus 失效
    光学仪器

    公开(公告)号:US20060045507A1

    公开(公告)日:2006-03-02

    申请号:US11218154

    申请日:2005-09-01

    申请人: Makoto Takamiya

    发明人: Makoto Takamiya

    IPC分类号: G03B13/00

    CPC分类号: G03B13/36 G02B7/34 G02B7/36

    摘要: An optical apparatus is disclosed, which is suitable for the focus detection by the TTL phase difference detection method, and capable of producing a pair of phase difference images for focus detection with high accuracy. The optical apparatus comprises a deflection optical element which deflects at least one of first and second luminous fluxes with respect to the other. The first and second luminous fluxes are transmitted respectively through first and second areas of an exit pupil of an optical system, and then reach a photoelectric conversion element. The deflection direction of the luminous flux is different from the division direction of the first and second areas.

    摘要翻译: 公开了一种适用于通过TTL相位差检测方法进行焦点检测的光学装置,并能够以高精度产生用于焦点检测的一对相位差图像。 光学装置包括偏转光学元件,该偏转光学元件使第一和第二光束中的至少一个相对于另一光束偏转。 第一和第二光束分别通过光学系统的出射光瞳的第一和第二区域传输,然后到达光电转换元件。 光束的偏转方向与第一和第二区域的分割方向不同。