摘要:
An image sensor comprising a plurality of pixels, each of at least part of the plurality of pixels comprises: a plurality of photoelectric conversion parts; a microlens; and a plurality of interlayer lenses formed between the plurality of photoelectric conversion parts and the microlens and integrally formed to correspond to the plurality of photoelectric conversion parts. The plurality of interlayer lenses cause light incident on the plurality of interlayer lenses to enter the corresponding plurality of photoelectric conversion parts.
摘要:
A booster circuit is configured, such that: in response to a reading request for reading data from a flash memory, when a voltage of an output terminal detected by a voltage detection circuit is not higher than a voltage, an oscillator outputs a control clock signal of predetermined on time and off time to a transistor of a boost converter to perform switching control of the transistor; and when the voltage detection circuit detects that the voltage of the output terminal reaches a voltage, an oscillator outputs a control clock signal of an on time and an off time input from a selection circuit to a transistor of a boost converter to perform switching control of the transistor.
摘要:
An image pickup apparatus which is capable of suppressing generation of shadows even when the aperture of the photographic lens is stopped down. A digital camera as an image pickup apparatus includes a photographic lens, a image pickup element that picks up an image of an object, and an optical low-pass filter disposed between the photographic lens and the image pickup element. The filter includes a liner phase diffraction grating having unit cells which are disposed in a regular pattern at a grating pitch P and are formed by equal-width recesses and equal-width protrusions adjacent to each other. When a shortest wavelength of a reference wavelength employed is λS, and a longest wavelength of the reference wavelength is λL, an optical path difference ΔH between lengths of optical paths of light of which a phase is varied by the phase grating is larger than λS/2 and smaller than λL/2.
摘要:
A focus detection apparatus includes an image sensor which includes a pair of pixel groups, outputs a first image signal from one of the pair of pixel groups, and outputs a second image signal from the other of the pair of pixel groups, where the pair of pixel groups receive luminous fluxes passing different pupil regions of an imaging optical system which forms an object image; a calculation unit which generates a first corrected image signal by subtracting the second image signal multiplied by a coefficient from the first image signal and generates a second corrected image signal by subtracting the first image signal multiplied by a coefficient from the second image signal; and a focus detection unit which detects a defocus amount based on a phase difference between the first corrected image signal and the second corrected image signal generated by the calculation unit.
摘要:
An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors.A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip.Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要:
A focus detection apparatus includes an image sensor which includes a pair of pixel groups, outputs a first image signal from one of the pair of pixel groups, and outputs a second image signal from the other of the pair of pixel groups, where the pair of pixel groups receive luminous fluxes passing different pupil regions of an imaging optical system which forms an object image; a calculation unit which generates a first corrected image signal by subtracting the second image signal multiplied by a coefficient from the first image signal and generates a second corrected image signal by subtracting the first image signal multiplied by a coefficient from the second image signal; and a focus detection unit which detects a defocus amount based on a phase difference between the first corrected image signal and the second corrected image signal generated by the calculation unit.
摘要:
There is provided an optical apparatus that provides quick and precise TTL phase difference detection and pupil slicing focus detection. An optical apparatus includes a first optical element for splitting a first polarized light component contained in light that passes an exit pupil of a first optical system and directs to a photoelectric conversion element so that the first polarized light component direct to different light-receiving areas on the photoelectric conversion element. The optical apparatus may further include a second optical element for separating a second polarized light component contained in the light from said first optical element, from the first polarized light component.
摘要:
A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要:
An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要:
An optical apparatus is disclosed, which is suitable for the focus detection by the TTL phase difference detection method, and capable of producing a pair of phase difference images for focus detection with high accuracy. The optical apparatus comprises a deflection optical element which deflects at least one of first and second luminous fluxes with respect to the other. The first and second luminous fluxes are transmitted respectively through first and second areas of an exit pupil of an optical system, and then reach a photoelectric conversion element. The deflection direction of the luminous flux is different from the division direction of the first and second areas.