Bottled beverage
    51.
    发明申请
    Bottled beverage 审中-公开
    瓶装饮料

    公开(公告)号:US20070092624A1

    公开(公告)日:2007-04-26

    申请号:US10582873

    申请日:2004-09-10

    IPC分类号: A23F3/00

    摘要: A packaged beverage of pH 2 to 6 with a green tea extract mixed therein, comprising the following ingredients (A) to (E) (A) from 0.01 to 1.0 wt % of non-polymer catechins, (B) quinic acid or a salt thereof, (C) from 0.0001 to 15 wt % of a sweetener, (D) from 0.001 to 0.5 wt % of sodium ions, and (E) from 0.001 to 0.2 wt % of potassium ions, wherein a content weight ratio [(B)/(A)] of said quinic acid or salt thereof (B) to said non-polymer catechins (A) is from 0.0001 to 0.5. The packaged beverage contains catechins at high concentration, is reduced in bitterness and astringency and is suited for long-term drinking, is excellent in the stability of bitterness and astringency and also in the feeling when it is swallowed, and further, remains stable in color tone even when filled in a clear container and stored at high temperatures.

    摘要翻译: 将混合有绿茶提取物的pH为2〜6的包装饮料,含有0.01〜1.0重量%的非聚合型儿茶素的以下成分(A)〜(E)(A),(B)奎宁酸或其盐 ,(C)0.0001〜15重量%的甜味剂,(D)0.001〜0.5重量%的钠离子,(E)0.001〜0.2重量%的钾离子,其中含量重量比[(B 所述奎宁酸或其盐(B))与所述非聚合型儿茶素类(A)的比例为0.0001〜0.5。 包装饮料含有高浓度的儿茶素类,减少苦味和涩味,适合长期饮用,苦味和涩味的稳定性以及吞咽感觉优异,而且颜色保持稳定 即使填充在清澈的容器中并在高温下储存也可以使用。

    Method and apparatus for analyzing composition of defects
    52.
    发明授权
    Method and apparatus for analyzing composition of defects 有权
    分析缺陷组成的方法和装置

    公开(公告)号:US06870169B2

    公开(公告)日:2005-03-22

    申请号:US10735575

    申请日:2003-12-11

    CPC分类号: G06T7/0004 G06T2207/30148

    摘要: In order to be able to detect an irradiation position of an electron beam matching a defect position and conduct composition analysis of a defect with high precision and high efficiency, in the present invention, when a composition analysis target defect is selected and irradiation conditions of the electron beam are set for EDX analysis, a low-resolution reference image of low resolution is acquired using the electron beam at a defect corresponding position corresponding to the position of this defect on a chip in the vicinity of a target chip including defects, and a low-resolution defect image of the same low resolution is next acquired at the defect position of the target chip. Then, by comparing these low-resolution images, the defect position is acquired, the electron beam is slanted and irradiated on this defect position to acquire a composition spectrum of the defect.

    摘要翻译: 为了能够检测匹配缺陷位置的电子束的照射位置并且以高精度和高效率进行缺陷的组成分析,在本发明中,当选择组成分析目标缺陷并且 电子束被设置用于EDX分析,使用电子束在与包括缺陷的目标芯片附近的芯片上的该缺陷的位置相对应的缺陷对应位置处采集低分辨率的低分辨率参考图像,并且 接下来在目标芯片的缺陷位置获取相同低分辨率的低分辨率缺陷图像。 然后,通过比较这些低分辨率图像,获取缺陷位置,电子束被倾斜并照射在该缺陷位置以获得缺陷的组成谱。