Compact automated inspection for foreign materials during the manufacture of large composite

    公开(公告)号:US11080842B2

    公开(公告)日:2021-08-03

    申请号:US16837448

    申请日:2020-04-01

    Inventor: Morteza Safai

    Abstract: An example system includes a sensor housing defining a plurality of horizontal layers and a controller. The sensor housing includes a plurality of light-emitted diode (LED) light sources, a plurality of cameras, and a plurality of optical devices. Each camera of the plurality of cameras is positioned within a respective horizontal layer of the plurality of horizontal layers and configured to detect a respective range of wavelengths of light. The plurality of optical devices is configured to receive light reflected by the surface through a common input lens and direct the light to one of the cameras of the plurality of cameras depending on a wavelength of the light. The controller is configured to receive signals from the plurality of cameras indicative of the light reflected by the surface and determine whether there is any foreign object debris material on the surface using the signals from the plurality of cameras.

    Excitation Array Multiplexing for Active Non-Destructive Inspection Imaging Systems

    公开(公告)号:US20210158480A1

    公开(公告)日:2021-05-27

    申请号:US16698165

    申请日:2019-11-27

    Inventor: Morteza Safai

    Abstract: A method includes exciting, at a first time period, a first set of pixels in an excitation array, wherein the first set of pixels comprises more than one pixel, and no pixel in the first set of pixels is adjacent to another pixel in the first set of pixels. The method also includes exciting, at a second time period, a second set of pixels in the excitation array wherein the second set of pixels comprises more than one pixel, and no pixel in the second set of pixels is adjacent to another pixel in the second set of pixels. The method retrieves excitation data, wherein the excitation data is comprised of data from the first set of pixels and data from the second set of pixels, and the excitation data is capable of being combined to reconstruct an image of a target object for rendering on a display.

    Systems and methods of monitoring a thermal protection system

    公开(公告)号:US10768128B2

    公开(公告)日:2020-09-08

    申请号:US14337622

    申请日:2014-07-22

    Abstract: A method of monitoring a thermal protection system coupled to a structural component is provided. The thermal protection system includes a thermally insulative body and at least one layer of thermochromatic material applied thereon such that the at least one layer is positioned between the thermally insulative body and the structural component. The method includes determining a value of a thermochromatic property of the at least one layer of thermochromatic material, wherein the value of the thermochromatic property is responsive to an amount of heat applied to the at least one layer of thermochromatic material, comparing the value to a baseline value of the thermochromatic property, and determining degradation of the thermal protection system when the value of the thermochromatic property deviates from the baseline value.

    Apparatus and methods for shot peening evaluation

    公开(公告)号:US10755403B2

    公开(公告)日:2020-08-25

    申请号:US16104394

    申请日:2018-08-17

    Inventor: Morteza Safai

    Abstract: Apparatus and methods for shot peening evaluation are disclosed herein. An example apparatus for evaluating a surface that has undergone a shot peening process includes a camera to generate first image data of a first portion of the surface. The example apparatus includes a processor to determine an impact coverage value for the first portion based on the first image data and determine an effectiveness of the shot peening process for the surface based on the impact coverage value.

    Laser for laser bond inspection system and laser ultrasonic inspection system

    公开(公告)号:US10753909B2

    公开(公告)日:2020-08-25

    申请号:US16102575

    申请日:2018-08-13

    Inventor: Morteza Safai

    Abstract: An example laser system includes a laser, a plurality of pulse stretchers coupled together in series, a pulse amplifier, a feedback module, and a lens assembly. The plurality of pulse stretchers is configured to stretch pulse widths of the laser pulses and output stretched laser pulses. The pulse amplifier is positioned between a first pulse stretcher and a second pulse stretch of the plurality of pulse stretchers, and is configured to amplify the laser pulses. The feedback module includes a pulse delay comparator configured to compare a first laser pulse of the laser pulses to a corresponding first stretched laser pulse of the stretched laser pulses. The feedback module also includes a computing device configured to determine an adjustment to a pulse stretcher of the plurality of pulse stretchers, and apply the adjustment to the pulse stretcher so as to modify a shape of a second stretched laser pulse.

    Automated inspection of foreign materials, cracks and other surface anomalies

    公开(公告)号:US10746670B2

    公开(公告)日:2020-08-18

    申请号:US16667380

    申请日:2019-10-29

    Inventor: Morteza Safai

    Abstract: An inspection system for detecting defects in a workpiece can include an illumination source for illuminating a first section of the workpiece with a patterned light, wherein the illumination source does not illuminate a second section of the workpiece. The inspection system further includes a feedback camera for imaging the first section and producing a first output, and a background camera for imaging the second section and producing a second output. A processor compares the first output with the second output, and a controller alters the patterned light that is output by the illumination source based on the comparison. This feedback control continues until the background is suitably homogeneous or camouflaged compared to the defect, such that the visibility and/or detectability of the defect is increased.

    Multi-wavelength laser inspection
    58.
    发明授权

    公开(公告)号:US10705019B2

    公开(公告)日:2020-07-07

    申请号:US15991292

    申请日:2018-05-29

    Abstract: An example system for inspecting a surface includes a laser, an optical system, a gated camera, and a control system. The laser is configured to emit pulses of light, with respective wavelengths of the pulses of light varying over time. The optical system includes at least one optical element, and is configured to direct light emitted by the laser to points along a scan line one point at a time. The gated camera is configured to record a fluorescent response of the surface from light having each wavelength of a plurality of wavelengths at each point along the scan line. The control system is configured to control the gated camera such that an aperture of the gated camera is open during fluorescence of the surface but closed during exposure of the surface to light emitted by the laser.

    SOLAR RADIOGRAPHY FOR NON-DESTRUCTIVE INSPECTION

    公开(公告)号:US20200172270A1

    公开(公告)日:2020-06-04

    申请号:US16206647

    申请日:2018-11-30

    Inventor: Morteza Safai

    Abstract: The present disclosure provides for Non-Destructive Inspection of craft operating in high-atmosphere or outer space, by positioning a scintillating detector array leeward to a structural element of the craft relative to the Sun; collecting, by the detector array while the craft is in flight, solar radiation passing through the structural element; and outputting a radiographic image based on the solar radiation collected to an image analyzer. The image analyzer may composite several images taken over a period of time or decomposite images of intervening structural elements from the radiographic images. Automated alerts for non-conformances between the radiographic images and earlier-taken or architectural images are provided to users.

    X-ray inspection system and method for pipes

    公开(公告)号:US10648931B2

    公开(公告)日:2020-05-12

    申请号:US15940558

    申请日:2018-03-29

    Abstract: A method, a system, and an apparatus for scanning an elongate structure. A scanner in a scanning system is moved on a helical path around the elongate structure. The scanner is moved on the helical path around the elongate structure using a helical track system attached to the elongate structure using a translating structure. An x-ray beam is emitted from the scanner while the scanner moves on the helical path. Backscatter is detected from the x-ray beam encountering the elongate structure.

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