Roughness tester
    61.
    发明授权

    公开(公告)号:US11353312B2

    公开(公告)日:2022-06-07

    申请号:US17009304

    申请日:2020-09-01

    Inventor: Naoki Izumi

    Abstract: There is provided a roughness tester that improves measurement efficiency and roughness measurement accuracy.
    A roughness tester includes a stylus unit including a stylus that is provided in such a manner as to protrude from and retract into a through hole of a skid and performs scanning movement along a surface of a workpiece, and a stylus displacement detecting unit that detects displacement of the stylus, and a drive unit that moves the stylus unit forward and backward in a drive-axis direction. The roughness tester further includes a height detector that is provided in such a manner as to face a front end face of the main-body housing part, interposing the skid between the height detector and the front end face and that detects a height of an object in a direction parallel with a measurement axis. When the height detector detects the object at the same height of the height of the main-body support foot in the measurement axis direction, the drive unit automatically starts driving in order for the stylus unit to perform scanning measurement of the surface of the workpiece.

    PHOTOELECTRIC ROTARY ENCODER
    62.
    发明申请

    公开(公告)号:US20220170764A1

    公开(公告)日:2022-06-02

    申请号:US17529476

    申请日:2021-11-18

    Abstract: The photoelectric rotary encoder includes: a generally disk-shaped scale with a grating-like pattern formed with a predetermined period along a measurement direction, the measurement direction being a direction of rotation of a measurement target that rotates on a predetermined axis, the scale being plate-like and centered on an axis of rotation; and a head that detect, from the scale, the amount of displacement caused by the rotation of the measurement target. The head includes a light source, a diffraction unit with grating parts, and a light-receiving unit with light-receiving elements. The grating parts of the diffraction unit are formed as deformed grating parts that spread cut wide, from the center on the axis of rotation, along the grating-like pattern of the scale. The light-receiving elements are formed as linear grating parts.

    Calibration method of x-ray measuring device

    公开(公告)号:US11344276B2

    公开(公告)日:2022-05-31

    申请号:US17015618

    申请日:2020-09-09

    Abstract: A calibration method of an X-ray measuring device includes: mounting a calibration tool 102 on a rotating table 120; a moving position acquisition step of parallelly moving a position of an j-th sphere 106 with respect to a position of a first sphere 106, irradiating the calibration tool 102 with an X-ray 118, and acquiring, form an output of an X-ray image detector 124, a moving position Mj where the magnitude of a differential position Erjofa centroid position ImDisjh_Sphr_j of a projected image of the j(2£j£N)-th sphere 106 with respect to a centroid position ImDis1_Sphr_1 of a projected image of the first sphere 106 becomes equal to or less than a specified value Vx; a relative position calculation step of performing the moving position acquisition step on the remaining spheres; a feature position calculation step; a transformation matrix calculation step; a rotation detection step; a position calculation step; and a center position calculation step.

    Measurement X-ray CT apparatus
    64.
    发明授权

    公开(公告)号:US11333619B2

    公开(公告)日:2022-05-17

    申请号:US17011411

    申请日:2020-09-03

    Abstract: A measurement X-ray CT apparatus calibrates a geometrical positional relationship between a focus of an X-ray source, an X-ray detector, and a rotation center of a rotating table in advance. The measurement X-ray CT apparatus then obtains projection images by irradiating the object to be measured with X-rays to perform a CT scan, and generates a three-dimensional image of the object to be measured by CT reconstruction of the projection images. The measurement X-ray CT apparatus further includes a reference frame that is made of a material and has a structure less susceptible to environmental changes, and sensors that are located on the reference frame and intended to successively obtain calibration values of the geometrical positional relationship between the focus of the X-ray source and the X-ray detector during the CT scan. The calibration values are used as parameters of the CT reconstruction.

    FORM MEASURING INSTRUMENT AND METHOD OF DETECTING ABNORMALITY

    公开(公告)号:US20220146246A1

    公开(公告)日:2022-05-12

    申请号:US17508106

    申请日:2021-10-22

    Abstract: A form measuring instrument includes: a contact tip configured to contact with a workpiece; a movement mechanism configured to cause relative movement of the contact tip with respect to the workpiece; a movement controlling unit configured to control the movement mechanism; a contact sensor configured to detect a contact amount of the contact tip with the workpiece and output a detection signal corresponding to the contact amount; and an abnormality determining unit configured to determine an abnormality of sensitivity of the contact sensor based on a change in the detection signal outputted from the contact sensor during an operation of the movement mechanism in which the contact tip is pressed against the workpiece.

    Optical encoder and calculation method for calculating relative displacement between an encoder scale and an encoder head facing the scale

    公开(公告)号:US11320289B2

    公开(公告)日:2022-05-03

    申请号:US16823953

    申请日:2020-03-19

    Inventor: Yoshiaki Kato

    Abstract: An optical encoder includes a scale, a calculator, and a head having a light source, an image capturer, and a lens array having first and second lenses. The calculator includes a signal generator, an extractor, a signal combiner, and a displacement calculator. The signal generator generates a sine wave signal. The extractor extracts first and second regions. The signal combiner, based on an inter-regional distance, uses a sine wave signal of the second region to generate a sine wave signal that extends to a first end of the first region such that the generated sine wave signal overlaps with a sine wave signal of the first region. The signal combiner also combines the sine wave signal of the first region with the generated sine wave signal. The displacement calculator calculates an amount of relative displacement based on the sine wave signal that is combined by the signal combiner.

    Coordinate measuring machine and coordinate measuring program

    公开(公告)号:US11274945B2

    公开(公告)日:2022-03-15

    申请号:US16885922

    申请日:2020-05-28

    Abstract: A coordinate measuring machine including a surface plate; a probe moving body; an INC pattern and ABS pattern along a moving direction of the probe moving body; an INC detector that outputs a plurality of waveform signals in accordance with the moving amount based on the INC pattern; an ABS detector that outputs an absolute position signal of the probe moving body based on the ABS pattern in response to a request signal; and a control device that has a INC counting portion that counts the waveform signals outputted by the INC detector; a position information obtaining portion that reads a counted value at a timing when a work is detected by a probe; and a presetting portion that emits the request signal to the ABS detector to obtain the absolute position signal, and presets the counting portion to this absolute position signal.

    Gauge inspection jig and gauge inspector

    公开(公告)号:US11268797B2

    公开(公告)日:2022-03-08

    申请号:US16805474

    申请日:2020-02-28

    Abstract: A coupling portion has one end coupleable to a distal end of a measurement spindle. The measurement spindle is disposed on a gauge inspector and movable in a measurement axis direction. A cylindrical stem is insertable into a gauge holding member to hold the inserted stem. The stem slidably holds a spindle having a distal end on which a contact point of a gauge is disposed. A frame has a first end coupled to a second end of the coupling portion and has a second end to which the gauge holding member is mountable. The gauge holding member is held to the frame such that an axis of the stem runs along the measurement axis direction. As a result, inspection is performed easily and accurately in a reverse posture with a contact point facing upward when a gauge is inspected.

Patent Agency Ranking