摘要:
Embodiments of the disclosure provide systems and methods for clock duty cycle measurement. A clock signal and a complement of the clock signal are provided to a charge pump during first and second predetermined timing windows. A charge pump is operable to generate first and second output voltages in response to the clock signal and the complement of the clock signal during the first and second timing windows, respectively. In addition a predetermined positive voltage and a ground voltage are applied to the charge pump during predetermined third and fourth timing windows, respectively. The charge pump is operable to generate third and fourth output voltage signals corresponding to the predetermined positive and ground voltages during the third and fourth timing windows, respectively. The first, second, third and fourth voltages are then used to calculate the duty cycle of the clock.
摘要:
A design structure for a programmable interpolative voltage controlled oscillator (VCO) with adjustable frequency range output is provided. Programmable delay cells whose size is modifiable based on control inputs to the programmable delay cells are utilized. A different set of control inputs may be provided to programmable delay cells of an inner sub-ring from the set of control inputs provided to programmable delay cells of a main ring of the VCO. The minimum frequency output of the VCO is governed by the main ring programmable delay cell strength with the maximum frequency output of the VCO being governed by a ratio of strengths of the main ring programmable delay cells to the inner sub-ring programmable delay cell. By modifying the control inputs to the inner sub-ring and main ring programmable delay cells, the minimum and maximum frequency outputs, and thus the range between these two frequency outputs, are made programmable.
摘要:
A design structure for a circuit for measuring the absolute duty cycle of a signal anywhere on an integrated circuit device is provided. The circuit has a plurality of substantially identical pulse shaper elements, each of which expand the pulse of an input signal whose duty cycle is to be measured by a same amount. The outputs of the pulse shaper elements may be coupled to substantially identical divider circuits whose outputs are coupled to a multiplexer that selects two inputs for output to a set of master/slave configured flip-flops, one input serving as a clock and the other as data to the flip-flops. The flip-flops sample the divider outputs selected by the multiplexer to detect if the dividers have failed or not. The outputs of the flip-flops are provided to an XOR gate which outputs a duty cycle signal indicative of the duty cycle of the input signal.
摘要:
A mechanism is provided for measuring the absolute duty cycle of a signal anywhere on an integrated circuit device. The mechanism employs a circuit having a plurality of substantially identical pulse shaper elements, each of which expand the pulse of an input signal whose duty cycle is to be measured by a same amount. The outputs of the pulse shaper elements may be coupled to substantially identical divider circuits whose outputs are coupled to a multiplexer that selects two inputs for output to a set of master/slave configured flip-flops, one input serving as a clock and the other as data to the flip-flops. The flip-flops sample the divider outputs selected by the multiplexer to detect if the dividers have failed or not. The outputs of the flip-flops are provided to an XOR gate which outputs a duty cycle signal indicative of the duty cycle of the input signal.
摘要:
An apparatus is provided to reduce transient current swings during mode transitions. Traditionally, transient supply voltage fluctuations on a chip account for a large portion of the power supply. The number of series inductances and resistances are typically minimized, while adding large decoupling capacitances between the supply voltage and ground. However, situations may arise where reduction of series inductances and resistances cannot be accomplished. Therefore, to assist in controlling the transient current swings, reduction of clocking frequencies are performed in a controlled manner.
摘要:
A design structure for an on-chip duty cycle measurement system may be embodied in a machine readable medium for designing, manufacturing or testing an integrated circuit. The design structure may embody an apparatus that measures the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. The design structure may specify that the DCM circuit includes a capacitor driven by a charge pump and that a reference clock signal drives the charge pump. The design structure may specify that the clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The design structure may specify that the DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit may apply a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. The design structure may specify that control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
摘要:
Embodiments of the disclosure provide systems and methods for using a PLL and a high frequency generator outside the loop to obtain the fmax of the divider. The divider in the PLL loop is fed by a VCO and its operation range is characterized by measuring the PLL lock range. An identical copy of the same divider is used outside the PLL loop and it is fed by a higher frequency clock. The high frequency clock is generated by the multiple phase of the VCO. By characterizing the outputs from both dividers, the fmax of the divider is obtained.
摘要:
A frequency synthesizer lock detection system is disclosed that distributes a frequency synthesizer output signal across a distribution network to one or more receptor circuits. The distribution network may exhibit delay and other distortion that may cause the downstream signal arriving at the receptor circuit to lose frequency lock with both the frequency synthesizer output signal and a reference clock signal that controls the frequency of the synthesizer output signal. The lock detection system tests the downstream signal to determine if the downstream signal exhibits a lock with respect to the reference clock that determines the operating frequency of the frequency synthesizer. In this manner, lock of the downstream signal to the reference clock signal may be accurately assessed in one embodiment.
摘要:
A design structure for a programmable interpolative voltage controlled oscillator (VCO) with adjustable frequency range output is provided. Programmable delay cells whose size is modifiable based on control inputs to the programmable delay cells are utilized. A different set of control inputs may be provided to programmable delay cells of an inner sub-ring from the set of control inputs provided to programmable delay cells of a main ring of the VCO. The minimum frequency output of the VCO is governed by the main ring programmable delay cell strength with the maximum frequency output of the VCO being governed by a ratio of strengths of the main ring programmable delay cells to the inner sub-ring programmable delay cell. By modifying the control inputs to the inner sub-ring and main ring programmable delay cells, the minimum and maximum frequency outputs, and thus the range between these two frequency outputs, are made programmable.
摘要:
A method and apparatus for measuring the absolute duty cycle of a signal are provided. A non-inverted path from a signal source is selected and various DCC circuit setting indices are cycled through until a divider, coupled to the output of the DCC circuit, fails. A first minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of the failure. An inverted path from the signal source is selected and the various DCC circuit setting indices are cycled through again until the divider fails. A second minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of this second failure. The duty cycle is then calculated based on a difference of the first and second minimum pulse width values.