摘要:
In a semiconductor memory device 100, a non-volatile element section 4 stores information necessary for rescuing a main memory cell, as storage information, in a non-volatile element. When rescue information S3 is newly outputted by a redundancy rescue section, a rescue determination section 5 determines whether or not a main memory cell is to be rescued, based on storage information S4 stored in the non-volatile element section 4, and the rescue information S3 which is newly outputted. The non-volatile element section 4 renews the storage information based on a determination result from the rescue determination section 5. Thus, on the assumption that power is turned off each time a voltage condition is changed, the semiconductor memory device 100 is capable of determining whether or not the rescue is to be performed, based on results of testings performed under a plurality of voltage conditions.
摘要:
The present invention provides a semiconductor integrated circuit having area efficiency and repair efficiency improved by sharing a redundant memory macro among a plurality of SRAM macros. Each of the plurality of memory macros 1A1 and 1A2 includes a memory cell array 1A-3 connected to word lines WL1 to WL32 and bit lines and a redundant circuit that replaces a defective bit line of the memory cell array to a normal bit line and a redundant bit line BLA65 and outputs defect information to a redundant signal line RA. The redundant memory macro 2A includes a redundant memory cell array connected to redundant word lines and the redundant bit line, and a first word line connection circuit that connects a word line corresponding to a memory macro to be repaired and disconnects a word line corresponding to a normal memory macro from the redundant word line.
摘要:
A semiconductor memory device capable of enhancing a production yield is provided. A dummy control circuit activates a first dummy column including a plurality of dummy cells placed at a position close to a row decoder in a row direction and a second dummy column including a plurality of dummy cells placed at a position farthest from the row decoder in a row direction with a plurality of memory cells interposed between the first dummy column and the second dummy column, through first and second dummy word lines. A dummy column selector selects either one of a signal on a first dummy bit line connected to the first dummy column and a signal on a second dummy bit line connected to the second dummy column, and outputs the selected signal to an amplifier control circuit. The amplifier control circuit generates an amplifier startup signal with respect to an amplifier circuit based on a signal from the dummy column selector.
摘要:
A network apparatus is provided, which allows another network apparatus to recognize the disconnection with reliability, if a power supply to the network apparatus is interrupted. A control unit operating with a first power supply outputs a first signal, which is level-converted and supplied as a second signal to an intermediate potential supply unit operating with a second power supply. In the intermediate potential supply unit, a switch receives a reset signal as a switch signal and outputs, when the power supply is interrupted, a ground potential to a driver instead of the second signal. As a result, an intermediate potential supplied to a cable is forcibly set to the ground potential.
摘要:
A semiconductor memory device capable of accurately simulating a read-out timing of a memory cell and enhancing a production yield is provided. A dummy column selector is placed so as to be connected to dummy bit lines, and a plurality of dummy cells driving the dummy bit lines are placed at positions farthest in a column direction on a memory array from the side where an amplifier circuit is placed. This configuration allows a timing for driving the bit lines by the memory cells that are placed similarly at positions farthest from the amplifier circuit to be simulated accurately, thus enabling the generation of an amplifier startup signal without delay. Furthermore, a plurality of dummy word lines respectively connected to the plurality of dummy columns allow for readily switching from a dummy cell with a defect to a normal dummy cell.
摘要:
A power-saving network unit, which is connected to a network made up of a plurality of power-saving network units, includes: network monitoring means; network information memory; power-saving mode setting means; peripheral I/O interface; and digital processor. The network monitoring means monitors a topology of the network, or the interconnection relationship among the power-saving network units. Every time the network has been modified, the network monitoring means stores the modified network topology on the network information memory. The power-saving mode setting means receives the network information stored on the network information memory. If the power-saving network unit is a master or relay node in the network, then the power-saving mode setting means locks the peripheral I/O interface and digital processor of the power-saving network unit to the normal operation mode and prohibits these sections from entering the power-saving mode.
摘要:
A semiconductor integrated circuit includes receiver, potential sensor and output fixing circuit. The receiver receives a differential signal that has been transmitted through a twisted pair of signal lines, and outputs a signal in accordance with the differential signal. The potential sensor senses a variation in in-phase potential of the differential signal transmitted through the twisted pair. And the output fixing circuit fixes an output of the receiver at a certain value if the variation sensed by the potential sensor is equal to or greater than a predetermined level. In this configuration, once the variation in the in-phase potential of the differential signal has reached the predetermined level, the output of the receiver is fixed at the certain value. Accordingly, even if the receiver operates erroneously due to the in-phase potential variation, the erroneous output of the receiver is not supplied to the next stage like a digital section.
摘要:
A current driver, a common mode voltage monitoring circuit and a current compensator are provided to drive a twisted pair cable, which is made up of two signal lines coupled to a terminal bias voltage through respective terminal resistors. The common mode voltage monitoring circuit monitors a difference between a common mode voltage of the twisted pair cable and a supply voltage level for the current driver. And the current compensator is coupled to the twisted pair cable to compensate for an output current of the current driver in accordance with a result of monitoring performed by the common mode voltage monitoring circuit. If the current driver has decreased its current drivability due to a drop of the supply voltage level of the current driver or a variation in the common mode voltage of the twisted pair cable, then the current compensator compensates for the decrease. Thus, the current driver can continuously operate in a broad voltage range to supply a constant current.
摘要:
The semiconductor device of this invention includes: an array section including a plurality of circuit blocks; a leakage current cutoff section for cutting off a leakage current occurring in at least one of the plurality of circuit blocks in the array section; and a control section for controlling the leakage current cutoff section in accordance with leakage current cutoff information.
摘要:
A test-target circuit is constructed of circuit blocks each comprising low-Vth MOS transistors including address buffers and a timing generator. A test enable signal for indication of a test, an operation selection signal for indication of an operation, and a block selection signal used to select a desired circuit block are provided. A high-Vth NMOS and a high-Vth PMOS transistor are provided in order to provide to a test circuit one of detected currents of the circuit blocks that was selected by placing a block selection signal and the test enable signal in the state of HIGH.